AVANTEST CORPORATION

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TOKYO 179-0071, JP

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Patents Grantslast 30 patents

Information Patent Grant
Switch control apparatus, semiconductor device test apparatus and s...
- Patent number 7,395,477
- Issue date Jul 1, 2008
- Avantest Corporation
- Hiroyuki Kawashima
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor test system
- Patent number 7,135,853
- Issue date Nov 14, 2006
- Avantest Corporation
- Yoshimasa Ito
- G01 - MEASURING TESTING