Bal-Tec A.G.

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Balzers, LI

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Patents Grantslast 30 patents

Information Patent Grant
Sample preparation for transmission electron microscopy
- Patent number 7,002,152
- Issue date Feb 21, 2006
- Bal-Tec AG
- Wolfgang Grunewald
- G01 - MEASURING TESTING
Information Patent Grant
Samples for transmission electron microscopy
- Patent number 6,784,427
- Issue date Aug 31, 2004
- Bal-Tec AG
- Wolfgang Grunewald
- G01 - MEASURING TESTING
Information Patent Grant
Ion beam preparation device for electron microscopy
- Patent number 5,986,264
- Issue date Nov 16, 1999
- Bal-Tec A.G.
- Wolfgang Grunewald
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Trademarklast 30 trademarks