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Beyond 3, Inc.
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Fremont, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method and system for performing swept-wavelength measurements with...
Patent number
6,879,421
Issue date
Apr 12, 2005
Beyond 3, Inc.
Bryan Clark
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for performing swept-wavelength measurements with...
Patent number
6,778,307
Issue date
Aug 17, 2004
Beyond 3, Inc.
Bryan Clark
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for controlling resonance within a resonator-enha...
Patent number
6,717,707
Issue date
Apr 6, 2004
Beyond 3, Inc.
Bryan Clark
G01 - MEASURING TESTING
Information
Patent Grant
Optical inspection method and apparatus having an enhanced height s...
Patent number
6,714,295
Issue date
Mar 30, 2004
Beyond 3, Inc.
Bryan Kevin Clark
G01 - MEASURING TESTING
Information
Patent Grant
Optical storage method and apparatus having enhanced resolution
Patent number
6,700,840
Issue date
Mar 2, 2004
Beyond 3, Inc.
Bryan Kevin Clark
G11 - INFORMATION STORAGE
Information
Patent Grant
Optical measurement and inspection method and apparatus having enha...
Patent number
6,653,649
Issue date
Nov 25, 2003
Beyond 3
Bryan Kevin Clark
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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last 30 trademarks