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Patents Grantslast 30 patents

Information Patent Grant
Method and system for detecting micro-cracks in wafers
- Patent number 9,651,502
- Issue date May 16, 2017
- Bluplanet Pte Ltd
- Sok Leng Chan
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Apparatus for detecting micro-cracks in wafers and method therefor
- Patent number 8,428,337
- Issue date Apr 23, 2013
- Bluplanet Pte Ltd
- Sok Leng Chan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Apparatus For Detecting Micro-Cracks In Wafers And Method Therefor
- Publication number 20110268344
- Publication date Nov 3, 2011
- BLUPLANET PTE LTD
- Sok Leng Chan
- G01 - MEASURING TESTING
Information Patent Application
Method And System For Detecting Micro-Cracks In Wafers
- Publication number 20100220186
- Publication date Sep 2, 2010
- BLUPLANET PTE LTD
- Sok Leng Chan
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...

Trademarklast 30 trademarks