Boxer Cross Inc.

Organization

Santa Clara, CA, US

Business Address
978 HAMILTON COURT MENLO PARK CA 94025 6500330
State Location
CA
State of Incorporation

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Identifying defects in a conductive structure of a wafer, based on...
- Patent number 6,971,791
- Issue date Dec 6, 2005
- Boxer Cross, Inc.
- Peter G. Borden
- G01 - MEASURING TESTING
Information Patent Grant
Evaluating sidewall coverage in a semiconductor wafer
- Patent number 6,911,349
- Issue date Jun 28, 2005
- Boxer Cross Inc
- Jiping Li
- G01 - MEASURING TESTING
Information Patent Grant
Evaluating a multi-layered structure for voids
- Patent number 6,885,444
- Issue date Apr 26, 2005
- Boxer Cross Inc
- Peter G. Borden
- G01 - MEASURING TESTING
Information Patent Grant
Use of a coefficient of a power curve to evaluate a semiconductor w...
- Patent number 6,812,717
- Issue date Nov 2, 2004
- Boxer Cross, Inc.
- Peter G. Borden
- G01 - MEASURING TESTING
Information Patent Grant
Evaluating a geometric or material property of a multilayered struc...
- Patent number 6,812,047
- Issue date Nov 2, 2004
- Boxer Cross, Inc.
- Peter G. Borden
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for determining the active dopant profile in a...
- Patent number 6,483,594
- Issue date Nov 19, 2002
- Boxer Cross, Inc.
- Peter G. Borden
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for determining the active dopant profile in a...
- Patent number 6,426,644
- Issue date Jul 30, 2002
- Boxer Cross Inc.
- Peter G. Borden
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for determining the active dopant profile in a...
- Patent number 6,323,951
- Issue date Nov 27, 2001
- Boxer Cross Incorporated
- Peter G. Borden
- G01 - MEASURING TESTING
Information Patent Grant
System and method for measuring the microroughness of a surface of...
- Patent number 6,154,280
- Issue date Nov 28, 2000
- Boxer Cross, Inc.
- Peter G. Borden
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring a property of a layer in a multi...
- Patent number 6,054,868
- Issue date Apr 25, 2000
- Boxer Cross Incorporated
- Peter G. Borden
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for evaluating a wafer of semiconductor material
- Patent number 6,049,220
- Issue date Apr 11, 2000
- Boxer Cross Incorporated
- Peter G. Borden
- G01 - MEASURING TESTING
Information Patent Grant
System and method for measuring properties of a semiconductor subst...
- Patent number 5,966,019
- Issue date Oct 12, 1999
- Boxer Cross, Inc.
- Peter G. Borden
- G01 - MEASURING TESTING
Information Patent Grant
System and method for measuring the doping level and doping profile...
- Patent number 5,883,518
- Issue date Mar 16, 1999
- Boxer Cross, Inc.
- Peter G. Borden
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for measuring the microroughness of a surface of...
- Patent number 5,877,860
- Issue date Mar 2, 1999
- Boxer Cross, Inc.
- Peter G. Borden
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Measuring a property of a layer in multilayered structure
- Publication number 20040119978
- Publication date Jun 24, 2004
- Boxer Cross Inc.
- Peter G. Borden
- G01 - MEASURING TESTING

Boxer Cross Inc.

Organization

Business Address

State Location

State of Incorporation

Patents Grantslast 30 patents

Identifying defects in a conductive structure of a wafer, based on...

Evaluating sidewall coverage in a semiconductor wafer

Evaluating a multi-layered structure for voids

Use of a coefficient of a power curve to evaluate a semiconductor w...

Evaluating a geometric or material property of a multilayered struc...

Apparatus and method for determining the active dopant profile in a...

Apparatus and method for determining the active dopant profile in a...

Apparatus and method for determining the active dopant profile in a...

System and method for measuring the microroughness of a surface of...

Apparatus and method for measuring a property of a layer in a multi...

Apparatus and method for evaluating a wafer of semiconductor material

System and method for measuring properties of a semiconductor subst...

System and method for measuring the doping level and doping profile...

System and method for measuring the microroughness of a surface of...

Patents Applicationslast 30 patents

Measuring a property of a layer in multilayered structure

Trademarklast 30 trademarks