BRION TECHNOLOGIES, INC.

Organization

Santa Clara, CA, US

Business Address
575 MADISON WAY PALO ALTO CA 94303 650-940-1980
State Location
CA
State of Incorporation

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Multivariable solver for optical proximity correction
- Patent number 7,707,538
- Issue date Apr 27, 2010
- Brion Technologies, Inc.
- William S. Wong
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Three-dimensional mask model for photolithography simulation
- Patent number 7,703,069
- Issue date Apr 20, 2010
- Brion Technologies, Inc.
- Peng Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for identifying and using process window signature patterns...
- Patent number 7,695,876
- Issue date Apr 13, 2010
- Brion Technologies, Inc.
- Jun Ye
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for process window optimized optical proximity correction
- Patent number 7,694,267
- Issue date Apr 6, 2010
- Brion Technologies, Inc.
- Jun Ye
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for selecting and optimizing exposure tool using an individu...
- Patent number 7,617,477
- Issue date Nov 10, 2009
- Brion Technologies, Inc.
- Jun Ye
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for mask verification using an individual mask er...
- Patent number 7,587,704
- Issue date Sep 8, 2009
- Brion Technologies, Inc.
- Jun Ye
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for characterizing aerial image quality in a lith...
- Patent number 7,564,017
- Issue date Jul 21, 2009
- Brion Technologies, Inc.
- Stefan Hunsche
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
System and method for detecting integrated circuit pattern defects
- Patent number 7,558,419
- Issue date Jul 7, 2009
- Brion Technologies, Inc.
- Jun Ye
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for lithography model calibration
- Patent number 7,488,933
- Issue date Feb 10, 2009
- Brion Technologies, Inc.
- Jun Ye
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for monitoring integrated circuit fabrication
- Patent number 7,233,874
- Issue date Jun 19, 2007
- Brion Technologies, Inc.
- Jun Ye
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for synchronizing data acquisition of a monito...
- Patent number 7,171,334
- Issue date Jan 30, 2007
- Brion Technologies, Inc.
- Michael J. Gassner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for lithography simulation
- Patent number 7,120,895
- Issue date Oct 10, 2006
- Brion Technologies, Inc.
- Jun Ye
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for lithography simulation
- Patent number 7,117,478
- Issue date Oct 3, 2006
- Brion Technologies, Inc.
- Jun Ye
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for lithography simulation
- Patent number 7,114,145
- Issue date Sep 26, 2006
- Brion Technologies, Inc.
- Jun Ye
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for lithography simulation
- Patent number 7,111,277
- Issue date Sep 19, 2006
- Brion Technologies, Inc.
- Jun Ye
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for lithography process monitoring and control
- Patent number 7,053,355
- Issue date May 30, 2006
- Brion Technologies, Inc.
- Jun Ye
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for lithography simulation
- Patent number 7,003,758
- Issue date Feb 21, 2006
- Brion Technologies, Inc.
- Jun Ye
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for lithography process monitoring and control
- Patent number 6,969,864
- Issue date Nov 29, 2005
- Brion Technologies, Inc.
- Jun Ye
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
System and method for lithography process monitoring and control
- Patent number 6,969,837
- Issue date Nov 29, 2005
- Brion Technologies, Inc.
- Jun Ye
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for monitoring integrated circuit fabrication
- Patent number 6,959,255
- Issue date Oct 25, 2005
- Brion Technologies, Inc.
- Jun Ye
- G01 - MEASURING TESTING
Information Patent Grant
System and method for aerial image sensing
- Patent number 6,906,305
- Issue date Jun 14, 2005
- Brion Technologies, Inc.
- R. Fabian W. Pease
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for monitoring integrated circuit fabrication
- Patent number 6,892,156
- Issue date May 10, 2005
- Brion Technologies, Inc.
- Jun Ye
- G01 - MEASURING TESTING
Information Patent Grant
System and method for lithography process monitoring and control
- Patent number 6,884,984
- Issue date Apr 26, 2005
- Brion Technologies, Inc.
- Jun Ye
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for monitoring integrated circuit fabrication
- Patent number 6,879,924
- Issue date Apr 12, 2005
- Brion Technologies, Inc.
- Jun Ye
- G01 - MEASURING TESTING
Information Patent Grant
System and method for lithography process monitoring and control
- Patent number 6,828,542
- Issue date Dec 7, 2004
- Brion Technologies, Inc.
- Jun Ye
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for monitoring integrated circuit fabrication
- Patent number 6,820,028
- Issue date Nov 16, 2004
- Brion Technologies, Inc.
- Jun Ye
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for monitoring integrated circuit fabrication
- Patent number 6,807,503
- Issue date Oct 19, 2004
- Brion Technologies, Inc.
- Jun Ye
- G01 - MEASURING TESTING
Information Patent Grant
System and method for lithography process monitoring and control
- Patent number 6,806,456
- Issue date Oct 19, 2004
- Brion Technologies, Inc.
- Jun Ye
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
System and method for lithography process monitoring and control
- Patent number 6,803,554
- Issue date Oct 12, 2004
- Brion Technologies, Inc.
- Jun Ye
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

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Patents Applicationslast 30 patents

Information Patent Application
Illumination Optimization
- Publication number 20110116067
- Publication date May 19, 2011
- BRION TECHNOLOGIES, INC.
- Jun Ye
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR PROCESS WINDOW OPTIMIZED OPTICAL PROXIMITY CORRECTION
- Publication number 20100180251
- Publication date Jul 15, 2010
- Brion Technology, Inc.
- Jun Ye
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LITHOGRAPHIC PROCESSING METHOD, AND DEVICE MANUFACTURED THEREBY
- Publication number 20100167184
- Publication date Jul 1, 2010
- BRION TECHNOLOGIES INC.
- William S. Wong
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MULTIVARIABLE SOLVER FOR OPTICAL PROXIMITY CORRECTION
- Publication number 20100161093
- Publication date Jun 24, 2010
- Brion Technology, Inc.
- William S. Wong
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
THREE-DIMENSIONAL MASK MODEL FOR PHOTOLITHOGRAPHY SIMULATION
- Publication number 20100162199
- Publication date Jun 24, 2010
- Brion Technology, Inc.
- Peng Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR LITHOGRAPHY PROCESS-WINDOW-MAXIMIXING OPTICAL...
- Publication number 20100162197
- Publication date Jun 24, 2010
- BRION TECHNOLOGIES INC.
- Jun YE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for identifying and using process window signature patterns...
- Publication number 20100151364
- Publication date Jun 17, 2010
- Brion Technology, Inc.
- Jun Ye
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
HARMONIC RESIST MODEL FOR USE IN A LITHOGRAPHIC APPARATUS AND A DEV...
- Publication number 20100128969
- Publication date May 27, 2010
- BRION TECHNOLOGIES INC.
- Yu CAO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LITHOGRAPHIC PROCESSING METHOD, AND DEVICE MANUFACTURED THEREBY
- Publication number 20100086863
- Publication date Apr 8, 2010
- BRION TECHNOLOGIES INC.
- DUAN-FU STEPHEN HSU
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MULTIVARIABLE SOLVER FOR OPTICAL PROXIMITY CORRECTION
- Publication number 20080309897
- Publication date Dec 18, 2008
- BRION TECHNOLOGIES, INC.
- William S. WONG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SYSTEM AND METHOD FOR MODEL-BASED SUB-RESOLUTION ASSIST FEATURE GEN...
- Publication number 20080301620
- Publication date Dec 4, 2008
- BRION TECHNOLOGIES, INC.
- Jun Ye
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR SELECTING AND OPTIMIZING EXPOSURE TOOL USING AN INDIVIDU...
- Publication number 20070061773
- Publication date Mar 15, 2007
- BRION TECHNOLOGIES, INC.
- Jun Ye
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR MASK VERIFICATION USING AN INDIVIDUAL MASK ER...
- Publication number 20070061772
- Publication date Mar 15, 2007
- BRION TECHNOLOGIES, INC.
- Jun Ye
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR IDENTIFYING AND USING PROCESS WINDOW SIGNATURE PATTERNS...
- Publication number 20070050749
- Publication date Mar 1, 2007
- BRION TECHNOLOGIES, INC.
- Jun Ye
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SYSTEM AND METHOD FOR MEASURING AND ANALYZING LITHOGRAPHIC PARAMETE...
- Publication number 20070035712
- Publication date Feb 15, 2007
- BRION TECHNOLOGIES, INC.
- Michael J. Gassner
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR LITHOGRAPHY MODEL CALIBRATION
- Publication number 20070032896
- Publication date Feb 8, 2007
- BRION TECHNOLOGIES, INC.
- Jun Ye
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SYSTEM AND METHOD FOR CREATING A FOCUS-EXPOSURE MODEL OF A LITHOGRA...
- Publication number 20070031745
- Publication date Feb 8, 2007
- BRION TECHNOLOGIES, INC.
- Jun Ye
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method for detecting, sampling, analyzing, and correcting marginal...
- Publication number 20060273266
- Publication date Dec 7, 2006
- BRION TECHNOLOGIES, INC.
- Moshe E. Preil
- G01 - MEASURING TESTING
Information Patent Application
System and method for characterizing aerial image quality in a lith...
- Publication number 20060273242
- Publication date Dec 7, 2006
- BRION TECHNOLOGIES, INC.
- Stefan Hunsche
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

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Trademarklast 30 trademarks

Information Trademark
78308282 - PERCEPTRON
- Serial number 78308282
- Filing date Oct 1, 2003
- Brion Technologies, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78304448 - TACHYON
- Serial number 78304448
- Filing date Sep 23, 2003
- Brion Technologies, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78175954 - EIW
- Serial number 78175954
- Filing date Oct 18, 2002
- Brion Technologies, Inc.
- 7 - Machines and machine tools
Information Trademark
78175958 - EQUIPMENT-IN-WAFER
- Serial number 78175958
- Filing date Oct 18, 2002
- Brion Technologies, Inc.
- 7 - Machines and machine tools
Information Trademark
78153811 - BRION TECHNOLOGIES
- Serial number 78153811
- Registration number 2826491
- Filing date Aug 13, 2002
- Brion Technologies, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

BRION TECHNOLOGIES, INC.

Organization

Business Address

State Location

State of Incorporation

Patents Grantslast 30 patents

Multivariable solver for optical proximity correction

Three-dimensional mask model for photolithography simulation

Method for identifying and using process window signature patterns...

Method for process window optimized optical proximity correction

Method for selecting and optimizing exposure tool using an individu...

System and method for mask verification using an individual mask er...

System and method for characterizing aerial image quality in a lith...

System and method for detecting integrated circuit pattern defects

Method for lithography model calibration

Method and apparatus for monitoring integrated circuit fabrication

Method and apparatus for synchronizing data acquisition of a monito...

System and method for lithography simulation

System and method for lithography simulation

System and method for lithography simulation

System and method for lithography simulation

System and method for lithography process monitoring and control

System and method for lithography simulation

System and method for lithography process monitoring and control

System and method for lithography process monitoring and control

Method and apparatus for monitoring integrated circuit fabrication

System and method for aerial image sensing

Method and apparatus for monitoring integrated circuit fabrication

System and method for lithography process monitoring and control

Method and apparatus for monitoring integrated circuit fabrication

System and method for lithography process monitoring and control

Method and apparatus for monitoring integrated circuit fabrication

Method and apparatus for monitoring integrated circuit fabrication

System and method for lithography process monitoring and control

System and method for lithography process monitoring and control

Patents Applicationslast 30 patents

Illumination Optimization

METHOD FOR PROCESS WINDOW OPTIMIZED OPTICAL PROXIMITY CORRECTION

LITHOGRAPHIC PROCESSING METHOD, AND DEVICE MANUFACTURED THEREBY

MULTIVARIABLE SOLVER FOR OPTICAL PROXIMITY CORRECTION

THREE-DIMENSIONAL MASK MODEL FOR PHOTOLITHOGRAPHY SIMULATION

METHOD AND SYSTEM FOR LITHOGRAPHY PROCESS-WINDOW-MAXIMIXING OPTICAL...

Method for identifying and using process window signature patterns...

HARMONIC RESIST MODEL FOR USE IN A LITHOGRAPHIC APPARATUS AND A DEV...

LITHOGRAPHIC PROCESSING METHOD, AND DEVICE MANUFACTURED THEREBY

MULTIVARIABLE SOLVER FOR OPTICAL PROXIMITY CORRECTION

SYSTEM AND METHOD FOR MODEL-BASED SUB-RESOLUTION ASSIST FEATURE GEN...

METHOD FOR SELECTING AND OPTIMIZING EXPOSURE TOOL USING AN INDIVIDU...

SYSTEM AND METHOD FOR MASK VERIFICATION USING AN INDIVIDUAL MASK ER...

METHOD FOR IDENTIFYING AND USING PROCESS WINDOW SIGNATURE PATTERNS...

SYSTEM AND METHOD FOR MEASURING AND ANALYZING LITHOGRAPHIC PARAMETE...

METHOD FOR LITHOGRAPHY MODEL CALIBRATION

SYSTEM AND METHOD FOR CREATING A FOCUS-EXPOSURE MODEL OF A LITHOGRA...

Method for detecting, sampling, analyzing, and correcting marginal...

System and method for characterizing aerial image quality in a lith...

Trademarklast 30 trademarks

78308282 - PERCEPTRON

78304448 - TACHYON

78175954 - EIW

78175958 - EQUIPMENT-IN-WAFER

78153811 - BRION TECHNOLOGIES