Broker AXS, Inc

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Madison, WI, US

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Patents Grantslast 30 patents

Information Patent Grant
X-ray diffractometer having co-exiting stages optimized for single...
- Patent number 7,848,489
- Issue date Dec 7, 2010
- Broker AXS, Inc
- Bob B. He
- G01 - MEASURING TESTING
Information Patent Grant
Analytical instrument with variable apertures for radiation beam
- Patent number 7,386,097
- Issue date Jun 10, 2008
- Broker AXS, Inc
- Gijsbertus J. Kerpershoek
- G01 - MEASURING TESTING
Information Patent Grant
Multiple wavelength X-ray source
- Patent number 7,317,784
- Issue date Jan 8, 2008
- Broker AXS, Inc
- Roger D. Durst
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Scanning line detector for two-dimensional x-ray diffractometer
- Patent number 7,190,762
- Issue date Mar 13, 2007
- Broker AXS, Inc
- Bob Baoping He
- G01 - MEASURING TESTING

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