Bruke Nano, Inc.

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Santa Barbara, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Fixture for flattening sample in optical metrology
- Patent number 9,303,631
- Issue date Apr 5, 2016
- BRUKE NANO INC.
- Bryan Guenther
- F04 - POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS FOR LIQUIDS OR ELASTIC...
Information Patent Grant
Closed loop controller and method for fast scanning probe microscopy
- Patent number 9,244,096
- Issue date Jan 26, 2016
- Bruke Nano, Inc.
- Jian Shi
- B82 - NANO-TECHNOLOGY

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Patents Applicationslast 30 patents

Information Patent Application
Torsion Wing Probe Assembly
- Publication number 20200348333
- Publication date Nov 5, 2020
- Bruke Nano, Inc.
- Shuiqing Hu
- G01 - MEASURING TESTING