BRUKER JV ISRAEL LTD.

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Migdal HaEmek, IL

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Patents Grantslast 30 patents

Information Patent Grant
Closed-loop control of X-ray knife edge
- Patent number 10,386,313
- Issue date Aug 20, 2019
- BRUKER JV ISRAEL LTD.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Grant
X-ray tube
- Patent number 9,852,875
- Issue date Dec 26, 2017
- BRUKER JV ISRAEL LTD.
- John Leonard Wall
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement of small features using XRF
- Patent number 9,829,448
- Issue date Nov 28, 2017
- BRUKER JV ISRAEL LTD.
- Matthew Wormington
- G01 - MEASURING TESTING
Information Patent Grant
X-ray tube anode
- Patent number 9,748,070
- Issue date Aug 29, 2017
- BRUKER JV ISRAEL LTD.
- John Leonard Wall
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Using multiple sources/detectors for high-throughput X-ray topograp...
- Patent number 9,726,624
- Issue date Aug 8, 2017
- BRUKER JV ISRAEL LTD.
- Paul Anthony Ryan
- G01 - MEASURING TESTING
Information Patent Grant
X-ray source assembly
- Patent number 9,666,322
- Issue date May 30, 2017
- BRUKER JV ISRAEL LTD.
- Isaac Mazor
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method for accurately determining the thickness and/or elemental co...
- Patent number 9,632,043
- Issue date Apr 25, 2017
- BRUKER JV ISRAEL LTD.
- Isaac Mazor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray scatterometry apparatus
- Patent number 9,606,073
- Issue date Mar 28, 2017
- BRUKER JV ISRAEL LTD.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Grant
Angle calibration for grazing-incidence X-ray fluorescence (GIXRF)
- Patent number 9,551,677
- Issue date Jan 24, 2017
- BRUKER JV ISRAEL LTD.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspection of bumps on a semiconductor substrate
- Patent number 9,390,984
- Issue date Jul 12, 2016
- BRUKER JV ISRAEL LTD.
- Isaac Mazor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Estimation of XRF intensity from an array of micro-bumps
- Patent number 9,389,192
- Issue date Jul 12, 2016
- BRUKER JV ISRAEL LTD.
- Alex Tokar
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR X-RAY SCATTEROMETRY
- Publication number 20190339215
- Publication date Nov 7, 2019
- BRUKER JV ISRAEL LTD.
- Alex Krokhmal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-ray source optics for small-angle X-ray scatterometry
- Publication number 20190323975
- Publication date Oct 24, 2019
- BRUKER JV ISRAEL LTD.
- Matthew Wormington
- G01 - MEASURING TESTING
Information Patent Application
X-ray detection optics for small-angle X-ray scatterometry
- Publication number 20190323974
- Publication date Oct 24, 2019
- BRUKER JV ISRAEL LTD.
- Matthew Wormington
- G01 - MEASURING TESTING
Information Patent Application
Wafer alignment for small-angle X-ray scatterometry
- Publication number 20190323976
- Publication date Oct 24, 2019
- BRUKER JV ISRAEL LTD.
- Yuri Vinshtein
- G01 - MEASURING TESTING
Information Patent Application
Image contrast in X-Ray topography imaging for defect inspection
- Publication number 20190317028
- Publication date Oct 17, 2019
- BRUKER JV ISRAEL LTD.
- Kevin Monroe Matney
- G01 - MEASURING TESTING
Information Patent Application
X-Ray Fluorescence Apparatus for Contamination Monitoring
- Publication number 20180348151
- Publication date Dec 6, 2018
- BRUKER JV ISRAEL LTD.
- Nikolai Kasper
- G01 - MEASURING TESTING
Information Patent Application
Closed-loop control of X-ray knife edge
- Publication number 20180088062
- Publication date Mar 29, 2018
- BRUKER JV ISRAEL LTD.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Application
X-ray tube
- Publication number 20170323759
- Publication date Nov 9, 2017
- BRUKER JV ISRAEL LTD.
- John Leonard Wall
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR X-RAY SCATTEROMETRY
- Publication number 20170199136
- Publication date Jul 13, 2017
- BRUKER JV ISRAEL LTD.
- Alex Krokhmal
- G01 - MEASURING TESTING

Trademarklast 30 trademarks

Information Trademark
79262820 - SEIRIOS
- Serial number 79262820
- Registration number 5974599
- Filing date Apr 17, 2019
- Bruker Technologies Ltd.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
88149056 - PROXCD
- Serial number 88149056
- Registration number 5956895
- Filing date Oct 10, 2018
- BRUKER TECHNOLOGIES LTD.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
88074993 - FASTXCD
- Serial number 88074993
- Registration number 5956705
- Filing date Aug 12, 2018
- BRUKER TECHNOLOGIES LTD.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
87604405 - SIRIUS-XG
- Serial number 87604405
- Registration number 5662487
- Filing date Sep 12, 2017
- BRUKER JV ISRAEL LTD.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
87604398 - SIRIUS
- Serial number 87604398
- Registration number 5662486
- Filing date Sep 12, 2017
- BRUKER JV ISRAEL LTD.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79117503 - JORDAN VALLEY
- Serial number 79117503
- Registration number 4348580
- Filing date May 22, 2012
- JORDAN VALLEY SEMICONDUCTORS LTD.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

BRUKER JV ISRAEL LTD.

Organization

Patents Grantslast 30 patents

Closed-loop control of X-ray knife edge

X-ray tube

Measurement of small features using XRF

X-ray tube anode

Using multiple sources/detectors for high-throughput X-ray topograp...

X-ray source assembly

Method for accurately determining the thickness and/or elemental co...

X-ray scatterometry apparatus

Angle calibration for grazing-incidence X-ray fluorescence (GIXRF)

X-ray inspection of bumps on a semiconductor substrate

Estimation of XRF intensity from an array of micro-bumps

Patents Applicationslast 30 patents

METHOD AND APPARATUS FOR X-RAY SCATTEROMETRY

X-ray source optics for small-angle X-ray scatterometry

X-ray detection optics for small-angle X-ray scatterometry

Wafer alignment for small-angle X-ray scatterometry

Image contrast in X-Ray topography imaging for defect inspection

X-Ray Fluorescence Apparatus for Contamination Monitoring

Closed-loop control of X-ray knife edge

X-ray tube

METHOD AND APPARATUS FOR X-RAY SCATTEROMETRY

Trademarklast 30 trademarks

79262820 - SEIRIOS

88149056 - PROXCD

88074993 - FASTXCD

87604405 - SIRIUS-XG

87604398 - SIRIUS

79117503 - JORDAN VALLEY