BT Imaging Pty Ltd.

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Sydney New South, AU

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Patents Grantslast 30 patents

Information Patent Grant
Methods for inspecting semiconductor wafers
- Patent number 10,502,687
- Issue date Dec 10, 2019
- BT IMAGING PTY LTD.
- Thorsten Trupke
- G01 - MEASURING TESTING
Information Patent Grant
Methods for inspecting semiconductor wafers
- Patent number 10,241,051
- Issue date Mar 26, 2019
- BT IMAGING PTY LTD.
- Thorsten Trupke
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for testing indirect bandgap semiconductor device...
- Patent number 9,912,291
- Issue date Mar 6, 2018
- BT IMAGING PTY LTD
- Thorsten Trupke
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Methods for inspecting semiconductor wafers
- Patent number 9,885,662
- Issue date Feb 6, 2018
- BT IMAGING PTY LTD.
- Thorsten Trupke
- G01 - MEASURING TESTING
Information Patent Grant
Wafer imaging and processing method and apparatus
- Patent number 9,546,955
- Issue date Jan 17, 2017
- BT IMAGING PTY LTD.
- Thorsten Trupke
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Method and system for testing indirect bandgap semiconductor device...
- Patent number 9,482,625
- Issue date Nov 1, 2016
- BT Imaging Pty Ltd
- Thorsten Trupke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Separation of doping density and minority carrier lifetime in photo...
- Patent number 9,157,863
- Issue date Oct 13, 2015
- BT IMAGING PTY LTD.
- Thorsten Trupke
- G01 - MEASURING TESTING
Information Patent Grant
Wafer imaging and processing method and apparatus
- Patent number 9,103,792
- Issue date Aug 11, 2015
- BT IMAGING PTY LTD.
- Thorsten Trupke
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
In-line photoluminescence imaging of semiconductor devices
- Patent number 9,035,267
- Issue date May 19, 2015
- BT Imaging Pty Ltd
- Ian A. Maxwell
- G01 - MEASURING TESTING
Information Patent Grant
Persistent feature detection
- Patent number 8,934,705
- Issue date Jan 13, 2015
- BT Imaging Pty Ltd
- Ian Andrew Maxwell
- G01 - MEASURING TESTING
Information Patent Grant
Separation of doping density and minority carrier lifetime in photo...
- Patent number 8,742,372
- Issue date Jun 3, 2014
- BT Imaging Pty Ltd
- Thorsten Trupke
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for testing indirect bandgap semiconductor device...
- Patent number 8,710,860
- Issue date Apr 29, 2014
- BT Imaging Pty Ltd
- Thorsten Trupke
- G01 - MEASURING TESTING
Information Patent Grant
Photovoltaic cell manufacturing
- Patent number 8,483,476
- Issue date Jul 9, 2013
- BT Imaging Pty Ltd
- Robert Andrew Bardos
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for inspecting indirect bandgap semiconductor str...
- Patent number 8,064,054
- Issue date Nov 22, 2011
- BT Imaging Pty Ltd
- Thorsten Trupke
- F21 - LIGHTING
Information Patent Grant
Determining diffusion length of minority carriers using luminescence
- Patent number 7,919,762
- Issue date Apr 5, 2011
- BT Imaging Pty Ltd
- Thorsten Trupke
- G01 - MEASURING TESTING

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Patents Applicationslast 30 patents

Information Patent Application
METHODS FOR INSPECTING SEMICONDUCTOR WAFERS
- Publication number 20190178800
- Publication date Jun 13, 2019
- BT IMAGING PTY LTD.
- Thorsten Trupke
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING THE CONDITION OF PHOTOVOLTAIC MODULES
- Publication number 20180159468
- Publication date Jun 7, 2018
- BT Imaging Pty Ltd
- Thorsten TRUPKE
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
DETERMINING THE CONDITION OF PHOTOVOLTAIC MODULES
- Publication number 20180159469
- Publication date Jun 7, 2018
- BT Imaging Pty Ltd
- Thorsten TRUPKE
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
METHODS FOR INSPECTING SEMICONDUCTOR WAFERS
- Publication number 20180136130
- Publication date May 17, 2018
- BT Imaging Pty Ltd
- Thorsten Trupke
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR TESTING INDIRECT BANDGAP SEMICONDUCTOR DEVICE...
- Publication number 20170033736
- Publication date Feb 2, 2017
- BT Imaging Pty Ltd
- Thorsten TRUPKE
- G01 - MEASURING TESTING
Information Patent Application
SEPARATION OF DOPING DENSITY AND MINORITY CARRIER LIFETIME IN PHOTO...
- Publication number 20160084764
- Publication date Mar 24, 2016
- BT Imaging Pty Ltd
- Thorsten TRUPKE
- G01 - MEASURING TESTING
Information Patent Application
WAFER IMAGING AND PROCESSING METHOD AND APPARATUS
- Publication number 20150323457
- Publication date Nov 12, 2015
- BT IMAGING PTY LTD.
- Thorsten TRUPKE
- G01 - MEASURING TESTING
Information Patent Application
IN-LINE PHOTOLUMINESCENCE IMAGING OF SEMICONDUCTOR DEVICES
- Publication number 20150219560
- Publication date Aug 6, 2015
- BT Imaging Pty Ltd
- Ian Andrew Maxwell
- G01 - MEASURING TESTING
Information Patent Application
METHODS FOR INSPECTING SEMICONDUCTOR WAFERS
- Publication number 20150168303
- Publication date Jun 18, 2015
- BT IMAGING PTY LTD.
- Thorsten Trupke
- G01 - MEASURING TESTING
Information Patent Application
PERSISTENT FEATURE DETECTION
- Publication number 20150086105
- Publication date Mar 26, 2015
- BT IMAGING PTY LTD.
- Ian Andrew MAXWELL
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEPARATION OF DOPING DENSITY AND MINORITY CARRIER LIFETIME IN PHOTO...
- Publication number 20140224965
- Publication date Aug 14, 2014
- BT Imaging Pty Ltd
- Thorsten Trupke
- G01 - MEASURING TESTING
Information Patent Application
PHOTOLUMINESCENCE IMAGING OF DOPING VARIATIONS IN SEMICONDUCTOR WAFERS
- Publication number 20140212020
- Publication date Jul 31, 2014
- BT IMAGING PTY LTD.
- Juergen Weber
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR TESTING INDIRECT BANDGAP SEMICONDUCTOR DEVICE...
- Publication number 20140191776
- Publication date Jul 10, 2014
- BT Imaging Pty Ltd
- Thorsten TRUPKE
- G01 - MEASURING TESTING
Information Patent Application
QUANTITATIVE SERIES RESISTANCE IMAGING OF PHOTOVOLTAIC CELLS
- Publication number 20140039820
- Publication date Feb 6, 2014
- BT IMAGING PTY LTD.
- Thorsten Trupke
- G01 - MEASURING TESTING
Information Patent Application
PERSISTENT FEATURE DETECTION
- Publication number 20130129187
- Publication date May 23, 2013
- BT IMAGING PTY LTD
- Ian Andrew Maxwell
- G01 - MEASURING TESTING
Information Patent Application
Illumination Systems and Methods for Photoluminescence Imaging of P...
- Publication number 20130062536
- Publication date Mar 14, 2013
- BT IMAGING PTY LTD.
- Robert A. Bardos
- G01 - MEASURING TESTING
Information Patent Application
In-Line Photoluminescence Imaging of Semiconductor Devices
- Publication number 20130043405
- Publication date Feb 21, 2013
- BT Imaging Pty. Ltd.
- Ian Andrew Maxwell
- G01 - MEASURING TESTING
Information Patent Application
SEPARATION OF DOPING DENSITY AND MINORITY CARRIER LIFETIME IN PHOTO...
- Publication number 20120181452
- Publication date Jul 19, 2012
- BT IMAGING PTY LTD.
- Thorsten Trupke
- G01 - MEASURING TESTING
Information Patent Application
Photovoltaic Cell Manufacturing
- Publication number 20110188733
- Publication date Aug 4, 2011
- BT IMAGING PTY LTD.
- Robert Andrew Bardos
- G01 - MEASURING TESTING
Information Patent Application
THIN FILM IMAGING METHOD AND APPARATUS
- Publication number 20110117681
- Publication date May 19, 2011
- BT IMAGING PTY LTD
- Robert Andrew Bardos
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
WAFER IMAGING AND PROCESSING METHOD AND APPARATUS
- Publication number 20110025839
- Publication date Feb 3, 2011
- BT IMAGING PTY LTD.
- Thorsten Trupke
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETERMINING DIFFUSION LENGTH OF MINORITY CARRIERS USING LUMINESCENCE
- Publication number 20100025588
- Publication date Feb 4, 2010
- BT IMAGING PTY LTD
- Thorsten Trupke
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR TESTING INDIRECT BANDGAP SEMICONDUCTOR DEVICE...
- Publication number 20090206287
- Publication date Aug 20, 2009
- BT IMAGING PTY LTD
- Thorsten Trupke
- G01 - MEASURING TESTING
Information Patent Application
Method and System for Inspecting Indirect Bandgap Semiconductor Str...
- Publication number 20090051914
- Publication date Feb 26, 2009
- BT Imaging Pty Ltd.
- Thorsten Trupke
- F21 - LIGHTING

BT Imaging Pty Ltd.

Organization

Patents Grantslast 30 patents

Methods for inspecting semiconductor wafers

Methods for inspecting semiconductor wafers

Method and system for testing indirect bandgap semiconductor device...

Methods for inspecting semiconductor wafers

Wafer imaging and processing method and apparatus

Method and system for testing indirect bandgap semiconductor device...

Separation of doping density and minority carrier lifetime in photo...

Wafer imaging and processing method and apparatus

In-line photoluminescence imaging of semiconductor devices

Persistent feature detection

Separation of doping density and minority carrier lifetime in photo...

Method and system for testing indirect bandgap semiconductor device...

Photovoltaic cell manufacturing

Method and system for inspecting indirect bandgap semiconductor str...

Determining diffusion length of minority carriers using luminescence

Patents Applicationslast 30 patents

METHODS FOR INSPECTING SEMICONDUCTOR WAFERS

DETERMINING THE CONDITION OF PHOTOVOLTAIC MODULES

DETERMINING THE CONDITION OF PHOTOVOLTAIC MODULES

METHODS FOR INSPECTING SEMICONDUCTOR WAFERS

METHOD AND SYSTEM FOR TESTING INDIRECT BANDGAP SEMICONDUCTOR DEVICE...

SEPARATION OF DOPING DENSITY AND MINORITY CARRIER LIFETIME IN PHOTO...

WAFER IMAGING AND PROCESSING METHOD AND APPARATUS

IN-LINE PHOTOLUMINESCENCE IMAGING OF SEMICONDUCTOR DEVICES

METHODS FOR INSPECTING SEMICONDUCTOR WAFERS

PERSISTENT FEATURE DETECTION

SEPARATION OF DOPING DENSITY AND MINORITY CARRIER LIFETIME IN PHOTO...

PHOTOLUMINESCENCE IMAGING OF DOPING VARIATIONS IN SEMICONDUCTOR WAFERS

METHOD AND SYSTEM FOR TESTING INDIRECT BANDGAP SEMICONDUCTOR DEVICE...

QUANTITATIVE SERIES RESISTANCE IMAGING OF PHOTOVOLTAIC CELLS

PERSISTENT FEATURE DETECTION

Illumination Systems and Methods for Photoluminescence Imaging of P...

In-Line Photoluminescence Imaging of Semiconductor Devices

SEPARATION OF DOPING DENSITY AND MINORITY CARRIER LIFETIME IN PHOTO...

Photovoltaic Cell Manufacturing

THIN FILM IMAGING METHOD AND APPARATUS

WAFER IMAGING AND PROCESSING METHOD AND APPARATUS

DETERMINING DIFFUSION LENGTH OF MINORITY CARRIERS USING LUMINESCENCE

METHOD AND SYSTEM FOR TESTING INDIRECT BANDGAP SEMICONDUCTOR DEVICE...

Method and System for Inspecting Indirect Bandgap Semiconductor Str...