Bundesanstalt fuer Materialforschung und-pruefung (BAM)

Follow

Organization

Berlin, DE

Organizations

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Device and method for the detection of composite defects
- Patent number 8,490,493
- Issue date Jul 23, 2013
- Bundesanstalt fuer Materialforschung und-pruefung (BAM)
- Boris Milmann
- G01 - MEASURING TESTING
Information Patent Grant
System and method for the non-destructive testing of elongate bodie...
- Patent number 8,274,276
- Issue date Sep 25, 2012
- European Advanced Superconductor GmbH & Co. KG
- Marc Kreutzbruck
- G01 - MEASURING TESTING