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C Technologies Inc.
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Bridgewater, NJ, US
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Patents Grants
last 30 patents
Information
Patent Grant
Slope spectroscopy standards
Patent number
11,789,031
Issue date
Oct 17, 2023
C Technologies Inc.
Mark Salerno
G01 - MEASURING TESTING
Information
Patent Grant
Monitoring of compounds
Patent number
11,519,851
Issue date
Dec 6, 2022
C Technologies Inc.
Craig Harrison
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Light source for variable path length systems
Patent number
11,300,447
Issue date
Apr 12, 2022
C Technologies Inc.
I-Tsung Shih
G01 - MEASURING TESTING
Information
Patent Grant
Interactive variable pathlength device
Patent number
9,939,373
Issue date
Apr 10, 2018
C Technologies Inc.
Mark Salemo
G01 - MEASURING TESTING
Information
Patent Grant
Method for quantitatively measuring the concentration of a compound...
Patent number
9,404,851
Issue date
Aug 2, 2016
C Technologies Inc.
I-Tsung Shih
G01 - MEASURING TESTING
Information
Patent Grant
Interactive variable pathlength device
Patent number
9,046,485
Issue date
Jun 2, 2015
C Technologies Inc.
Mark Salerno
G01 - MEASURING TESTING
Information
Patent Grant
Interactive variable pathlength device
Patent number
7,808,641
Issue date
Oct 5, 2010
C Technologies Inc.
Mark Salerno
G01 - MEASURING TESTING
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Patents Applications
last 30 patents
Information
Patent Application
Monitoring of Compounds
Publication number
20220291121
Publication date
Sep 15, 2022
C Technologies Inc.
Craig Harrison
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
LIGHT SOURCE FOR VARIABLE PATH LENGTH SYSTEMS
Publication number
20220187125
Publication date
Jun 16, 2022
C Technologies Inc.
I-Tsung Shih
G01 - MEASURING TESTING
Information
Patent Application
LIGHT SOURCE FOR VARIABLE PATH LENGTH SYSTEMS
Publication number
20220026272
Publication date
Jan 27, 2022
C Technologies Inc.
Eric Shih
G01 - MEASURING TESTING
Information
Patent Application
SLOPE SPECTROSCOPY STANDARDS
Publication number
20210405076
Publication date
Dec 30, 2021
C Technologies Inc.
Mark Salerno
G01 - MEASURING TESTING