CAMBRIDGE INSTRUMENTS LIMITED

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CAMBRIDGE, GB

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Patents Grantslast 30 patents

Information Patent Grant
Automatic refractometer
- Patent number 4,640,616
- Issue date Feb 3, 1987
- The Cambridge Instrument Company plc
- John K. Michalik
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle deflection
- Patent number 4,614,872
- Issue date Sep 30, 1986
- Cambridge Instruments Limited
- Anthony W. Sloman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scannable-beam microscopes and image stores therefor
- Patent number 4,604,523
- Issue date Aug 5, 1986
- Cambridge Instruments Limited
- William R. Knowles
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Image inspection system for defect detection
- Patent number 4,587,617
- Issue date May 6, 1986
- Cambridge Instruments Limited
- John C. Barker
- G01 - MEASURING TESTING
Information Patent Grant
Image comparison systems
- Patent number 4,578,765
- Issue date Mar 25, 1986
- Cambridge Instruments Limited
- John C. Barker
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electron beam focussing
- Patent number 4,514,634
- Issue date Apr 30, 1985
- Cambridge Instruments Limited
- Peter J. Lawson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for vapor deposition of a film on a substrate
- Patent number 4,446,817
- Issue date May 8, 1984
- Cambridge Instruments Limited
- John A. Crawley
- C30 - CRYSTAL GROWTH