TREA

CAMECA INSTRUMENTS, INC

Follow

Organization

  • MAHWAH, NJ, US
Organizations

Patents Grantslast 30 patents

  • Information Patent Grant

    Atom probe
    • Patent number 8,513,597
    • Issue date Aug 20, 2013
    • Cameca Instruments, Inc.
    • Peter Panayi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Laser atom probe methods
    • Patent number 8,153,968
    • Issue date Apr 10, 2012
    • Cameca Instruments, Inc.
    • Joseph Hale Bunton
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Reflectron
    • Patent number 8,134,119
    • Issue date Mar 13, 2012
    • Cameca Instruments, Inc.
    • Peter Panayi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Atom probes, atom probe specimens, and associated methods
    • Patent number 7,884,323
    • Issue date Feb 8, 2011
    • Cameca Instruments, Inc.
    • Thomas F. Kelly
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Trademarklast 30 trademarks