Cameca Instruments, Inc.

Follow

Organization

Madison, WI, US

Organizations

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Energy beam input to atom probe specimens from multiple angles
- Patent number 11,340,256
- Issue date May 24, 2022
- Cameca Instruments, Inc.
- Joseph Hale Bunton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wide field-of-view atom probe
- Patent number 10,615,001
- Issue date Apr 7, 2020
- Cameca Instruments, Inc.
- Joseph Hale Bunton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Atom probe with vacuum differential
- Patent number 10,614,995
- Issue date Apr 7, 2020
- Cameca Instruments, Inc.
- Thomas F. Kelly
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3D atomic scale imaging methods
- Patent number 8,670,608
- Issue date Mar 11, 2014
- Cameca Instruments, Inc.
- Thomas F. Kelly
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Methods and devices for improving atom probe detector performance
- Patent number 8,575,544
- Issue date Nov 5, 2013
- Cameca Instruments, Inc.
- Thomas F. Kelly
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and devices for atom probe mass resolution enhancement
- Patent number 7,772,552
- Issue date Aug 10, 2010
- Cameca Instruments, Inc.
- Tye Gribb
- H01 - BASIC ELECTRIC ELEMENTS

Please log in for detailed analytics

Patents Applicationslast 30 patents

Information Patent Application
WIDE FIELD-OF-VIEW ATOM PROBE
- Publication number 20180130636
- Publication date May 10, 2018
- Cameca Instruments, Inc.
- Joseph Hale BUNTON
- H01 - BASIC ELECTRIC ELEMENTS