CAMECA

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Courbevoie, FR

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Patents Grantslast 30 patents

Information Patent Grant
Mass analysis device with wide angular acceptance including a refle...
- Patent number 8,502,139
- Issue date Aug 6, 2013
- Cameca
- Mikhail Yavor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetic achromatic mass spectrometer with double focusing
- Patent number 8,373,121
- Issue date Feb 12, 2013
- Cameca
- Emmanuel De Chambost
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tomographic atom probe comprising an electro-optical generator of h...
- Patent number 8,276,210
- Issue date Sep 25, 2012
- Cameca
- François Vurpillot
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Device for generating wide spectral band laser pulses, particularly...
- Patent number 8,247,766
- Issue date Aug 21, 2012
- Cameca
- Bernard Deconihout
- G02 - OPTICS
Information Patent Grant
High resolution wide angle tomographic probe
- Patent number 8,074,292
- Issue date Dec 6, 2011
- Cameca
- Alain Bostel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device for measuring the emission of X-rays produced by an object e...
- Patent number 7,049,588
- Issue date May 23, 2006
- CAMECA
- Emmanuel De Chambost
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for measuring the depths of bottoms of craters in...
- Patent number 6,259,530
- Issue date Jul 10, 2001
- CAMECA
- Pierre Monsallut
- G01 - MEASURING TESTING
Information Patent Grant
High transmission mass spectrometer with improved optical coupling
- Patent number 5,189,304
- Issue date Feb 23, 1993
- CAMECA
- Emmanuel De Chambost
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Composite electromagnetic lens with variable focal distance
- Patent number 5,038,045
- Issue date Aug 6, 1991
- CAMECA
- Jean-Michel Rouberol
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight analysis method with continuous scanning and analyze...
- Patent number 4,983,831
- Issue date Jan 8, 1991
- CAMECA
- Henri-Noel Migeon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for sample analysis by sputtering with a particle beam, and...
- Patent number 4,912,325
- Issue date Mar 27, 1990
- CAMECA
- Wielfried Vandervorst
- G01 - MEASURING TESTING
Information Patent Grant
Electron beam integrated circuit tester
- Patent number 4,779,046
- Issue date Oct 18, 1988
- CAMECA
- Jean-Michel Rouberoi
- G01 - MEASURING TESTING
Information Patent Grant
Method and device to discharge samples of insulating material durin...
- Patent number 4,748,325
- Issue date May 31, 1988
- CAMECA
- Georges Slodzian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process and device for the ionic analysis of an insulating sample
- Patent number 4,564,758
- Issue date Jan 14, 1986
- CAMECA
- Georges Slodzian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic optical apparatus comprising pyrolytic graphite elements
- Patent number 4,508,967
- Issue date Apr 2, 1985
- CAMECA
- Pierre Boissel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer for ultra-rapid scanning
- Patent number 4,171,482
- Issue date Oct 16, 1979
- CAMECA
- Jean Vastel
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MAGNETIC ACHROMATIC MASS SPECTROMETER WITH DOUBLE FOCUSING
- Publication number 20120032075
- Publication date Feb 9, 2012
- CAMECA
- Emmanuel De Chambost
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS ANALYSIS DEVICE WITH WIDE ANGULAR ACCEPTANCE INCLUDING A REFLE...
- Publication number 20110303841
- Publication date Dec 15, 2011
- CAMECA
- Mikhail Yavor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Tomographic Atom Probe Comprising an Electro-Optical Generator of H...
- Publication number 20110260046
- Publication date Oct 27, 2011
- CNRS
- François Vurpillot
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Device for Generating Wide Spectral Band Laser Pulses, Particularly...
- Publication number 20110210245
- Publication date Sep 1, 2011
- CAMECA
- Bernard Deconihout
- G02 - OPTICS
Information Patent Application
High Resolution Wide Angle Tomographic Probe
- Publication number 20100223698
- Publication date Sep 2, 2010
- CAMECA
- Alain Bostel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Device for measuring the emission of x rays produced by an object e...
- Publication number 20050211898
- Publication date Sep 29, 2005
- CAMECA
- Emmanuel De Chambost
- H01 - BASIC ELECTRIC ELEMENTS

Trademarklast 30 trademarks

Information Trademark
77221676 - CAMECA
- Serial number 77221676
- Registration number 3681899
- Filing date Jul 3, 2007
- Cameca
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

Organization

Patents Grantslast 30 patents

Mass analysis device with wide angular acceptance including a refle...

Magnetic achromatic mass spectrometer with double focusing

Tomographic atom probe comprising an electro-optical generator of h...

Device for generating wide spectral band laser pulses, particularly...

High resolution wide angle tomographic probe

Device for measuring the emission of X-rays produced by an object e...

Method and device for measuring the depths of bottoms of craters in...

High transmission mass spectrometer with improved optical coupling

Composite electromagnetic lens with variable focal distance

Time-of-flight analysis method with continuous scanning and analyze...

Method for sample analysis by sputtering with a particle beam, and...

Electron beam integrated circuit tester

Method and device to discharge samples of insulating material durin...

Process and device for the ionic analysis of an insulating sample

Electronic optical apparatus comprising pyrolytic graphite elements

Mass spectrometer for ultra-rapid scanning

Patents Applicationslast 30 patents

MAGNETIC ACHROMATIC MASS SPECTROMETER WITH DOUBLE FOCUSING

MASS ANALYSIS DEVICE WITH WIDE ANGULAR ACCEPTANCE INCLUDING A REFLE...

Tomographic Atom Probe Comprising an Electro-Optical Generator of H...

Device for Generating Wide Spectral Band Laser Pulses, Particularly...

High Resolution Wide Angle Tomographic Probe

Device for measuring the emission of x rays produced by an object e...

Trademarklast 30 trademarks

77221676 - CAMECA