CamTek Inc.

Organization

Plano, TX, US

Ticker Symbols

NASDAQ:CAMT

OPTICAL INSTRUMENTS & LENSES
Business Address
INDUSTRIAL ZONE PO BOX 631 MIGDAL HAEMEK 011-972-6-644-0521 ISRAEL 10556 L3 00000
Mailing Address
INDUSTRIAL ZONE MIGDAL HAEMEK ISREAL
State Location
L3
State of Incorporation

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for classifying defects in wafer using wafer-defe...
- Patent number 12,020,417
- Issue date Jun 25, 2024
- Camtek Ltd.
- Isaac Daniel Buzaglo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor edge and bevel inspection tool system
- Patent number 11,927,545
- Issue date Mar 12, 2024
- Camtek Ltd.
- Carmel Yehuda Drillman
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor inspection tool system and method for wafer edge insp...
- Patent number 11,828,713
- Issue date Nov 28, 2023
- Camtek Ltd.
- Carmel Yehuda Drillman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measuring buried layers
- Patent number 11,682,584
- Issue date Jun 20, 2023
- Camtek Ltd.
- Zehava Ben Ezer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automatic defect classification
- Patent number 11,300,521
- Issue date Apr 12, 2022
- Camtek Ltd.
- Menachem Regensburger
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical contrast enhancement for defect inspection
- Patent number 11,055,836
- Issue date Jul 6, 2021
- Camtek Ltd.
- Zehava Ben Ezer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect detection
- Patent number 11,047,807
- Issue date Jun 29, 2021
- Camtek Ltd.
- Daniel Buzaglo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detection of pits using an automatic optical inspection system
- Patent number 10,989,670
- Issue date Apr 27, 2021
- Camtek Ltd.
- Aki Shoukrun
- G01 - MEASURING TESTING
Information Patent Grant
Inspecting an object that includes a photo-sensitive polyimide layer
- Patent number 10,823,669
- Issue date Nov 3, 2020
- Camtek Ltd.
- Zehava Ben-Ezer
- G01 - MEASURING TESTING
Information Patent Grant
Height measurements of conductive structural elements that are surr...
- Patent number 10,734,340
- Issue date Aug 4, 2020
- CAMTEK LTD.
- Eyal Segev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Objective lens
- Patent number 10,598,607
- Issue date Mar 24, 2020
- Camtek Ltd.
- Zehava Ben Ezer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Continuous light inspection
- Patent number 10,497,092
- Issue date Dec 3, 2019
- Camtek Ltd.
- Shimon Koren
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Aperture stop
- Patent number 10,222,517
- Issue date Mar 5, 2019
- CAMTEK LTD.
- Tomer Gilad
- G02 - OPTICS
Information Patent Grant
System for inspecting a backside of a wafer
- Patent number 10,215,707
- Issue date Feb 26, 2019
- CAMTEK LTD.
- Zehava Ben Ezer
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system and a method for inspecting a diced wafer
- Patent number 10,203,289
- Issue date Feb 12, 2019
- Camtek Ltd.
- Yuri Postolov
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for low cost inspection
- Patent number 10,197,505
- Issue date Feb 5, 2019
- CAMTEK LTD.
- Ophir Peleg
- G01 - MEASURING TESTING
Information Patent Grant
Inspecting a wafer using image and design information
- Patent number 10,042,974
- Issue date Aug 7, 2018
- Camtek Ltd.
- Yuri Postolov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection system having an expanded angular coverage
- Patent number 9,989,480
- Issue date Jun 5, 2018
- Camtek Ltd.
- Noam Gordon
- G02 - OPTICS
Information Patent Grant
Optical inspection system using multi-facet imaging
- Patent number 9,857,312
- Issue date Jan 2, 2018
- Camtek Ltd.
- Michael Lev
- G01 - MEASURING TESTING
Information Patent Grant
Selective vacuum printing machine
- Patent number 9,808,915
- Issue date Nov 7, 2017
- Camtek Ltd.
- Yehuda Ben-Abu
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
High throughput triangulation system
- Patent number 9,759,555
- Issue date Sep 12, 2017
- Camtek Ltd.
- Shimon Koren
- G01 - MEASURING TESTING
Information Patent Grant
High throughput and low cost height triangulation system and method
- Patent number 9,756,313
- Issue date Sep 5, 2017
- Camtek Ltd.
- Shimon Koren
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Adaptable end effector
- Patent number 9,754,812
- Issue date Sep 5, 2017
- Camtek Ltd.
- Arnon Ben-Natan
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Selective solder mask printing on a printed circuit board (PCB)
- Patent number 9,723,722
- Issue date Aug 1, 2017
- Camtek Ltd.
- Yehuda Ben-Abu
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
System and a method for solder mask inspection
- Patent number 9,661,755
- Issue date May 23, 2017
- Camtek Ltd.
- Yosi Cherbis
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Multiple mode inspection system and method for evaluating a substra...
- Patent number 9,638,644
- Issue date May 2, 2017
- Camtek Ltd.
- Moshe Cohen-Erner
- G01 - MEASURING TESTING
Information Patent Grant
Method for improving coating
- Patent number 9,603,261
- Issue date Mar 21, 2017
- Camtek Ltd.
- Muhammad Iraqi
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
System and a method for automatic recipe validation and selection
- Patent number 9,418,413
- Issue date Aug 16, 2016
- Camtek Ltd.
- Shimon Koren
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for measuring bumps based on phase and amplitude...
- Patent number 9,147,102
- Issue date Sep 29, 2015
- Camtek Ltd.
- Shimon Koren
- G01 - MEASURING TESTING
Information Patent Grant
Advanced inspection method utilizing short pulses LED illumination
- Patent number 9,097,685
- Issue date Aug 4, 2015
- Camtek Ltd.
- Amnon Menachem
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION SYSTEM FOR EDGE AND BEVEL INSPECTION OF SEMICONDUCTOR ST...
- Publication number 20240355083
- Publication date Oct 24, 2024
- CAMTEK LTD
- Carmel Yehuda DRILLMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR CLASSIFYING DEFECTS IN WAFER USING WAFER-DEFE...
- Publication number 20240289945
- Publication date Aug 29, 2024
- CAMTEK LTD
- Isaac Daniel Buzaglo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR INSPECTION TOOL SYSTEM AND METHOD FOR WAFER EDGE INSP...
- Publication number 20240003826
- Publication date Jan 4, 2024
- CAMTEK LTD
- Carmel Yehuda DRILLMAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTINUOUS BUMP MEASUREMENT HEIGHT METROLOGY
- Publication number 20230280282
- Publication date Sep 7, 2023
- Camtek LTD.
- Eyal Segev
- G01 - MEASURING TESTING
Information Patent Application
DARK FIELD ILLUMINATION BASED ON LASER ILLUMINATED PHOSPHOR
- Publication number 20230251198
- Publication date Aug 10, 2023
- Camtek LTD.
- Amnon Menachem
- G01 - MEASURING TESTING
Information Patent Application
BUMP MEASUREMENT HEIGHT METROLOGY
- Publication number 20230228559
- Publication date Jul 20, 2023
- Camtek LTD.
- Eyal Segev
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC DEFECT CLASSIFICATION
- Publication number 20220214287
- Publication date Jul 7, 2022
- Camtek LTD.
- Menachem Regensburger
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR CLASSIFYING DEFECTS IN WAFER USING WAFER-DEFE...
- Publication number 20210334946
- Publication date Oct 28, 2021
- CAMTEK LTD
- Isaac Daniel Buzaglo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT DETECTION
- Publication number 20200309718
- Publication date Oct 1, 2020
- Camtek LTD.
- Daniel Buzaglo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASURING BURIED LAYERS
- Publication number 20200279775
- Publication date Sep 3, 2020
- Camtek LTD.
- Zehava Ben Ezer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HEIGHT MEASUREMENTS OF CONDUCTIVE STRUCTURAL ELEMENTS THAT ARE SURR...
- Publication number 20190355688
- Publication date Nov 21, 2019
- CAMTEK LTD.
- EYAL SEGEV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTING AN OBJECT THAT INCLUDES A PHOTO-SENSITIVE POLYIMIDE LAYER
- Publication number 20190242812
- Publication date Aug 8, 2019
- Camtek LTD.
- Zehava Ben-Ezer
- G01 - MEASURING TESTING
Information Patent Application
HIERARCHICAL WAFER INSPECTION
- Publication number 20190128822
- Publication date May 2, 2019
- CAMTEK LTD
- Menachem Regensburger
- G01 - MEASURING TESTING
Information Patent Application
OBJECTIVE LENS
- Publication number 20190033234
- Publication date Jan 31, 2019
- CAMTEK LTD
- Zehava Ben Ezer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONTINUOUS LIGHT INSPECTION
- Publication number 20170150104
- Publication date May 25, 2017
- CAMTEK LTD
- SHIMON KOREN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WARPED WAFERS VACUUM CHUCK
- Publication number 20170053822
- Publication date Feb 23, 2017
- Camtek LTD.
- Arnon Ben Natan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM FOR INSPECTING A BACKSIDE OF A WAFER
- Publication number 20170010220
- Publication date Jan 12, 2017
- Camtek LTD.
- Zehava Ben Ezer
- G01 - MEASURING TESTING
Information Patent Application
High throughput triangulation system
- Publication number 20170010093
- Publication date Jan 12, 2017
- Camtek LTD.
- Shimon Koren
- G01 - MEASURING TESTING
Information Patent Application
MULTI-RESOLUTION PRINTER
- Publication number 20160374207
- Publication date Dec 22, 2016
- CAMTEK LTD
- Yehuda Ben-Abu
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Application
APERTURE STOP
- Publication number 20160366315
- Publication date Dec 15, 2016
- Camtek LTD.
- Tomer Gilad
- G02 - OPTICS
Information Patent Application
SYSTEM AND A METHOD FOR AUTOMATIC RECIPE VALIDATION AND SELECTION
- Publication number 20160321792
- Publication date Nov 3, 2016
- Camtek LTD.
- Shimon Koren
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION SYSTEM HAVING AN EXPANDED ANGULAR COVERAGE
- Publication number 20160313258
- Publication date Oct 27, 2016
- CAMTEK LTD
- Noam Gordon
- G02 - OPTICS
Information Patent Application
SELECTIVE SOLDER MASK PRINTING ON A PRINTED CIRCUIT BOARD (PCB)
- Publication number 20160286659
- Publication date Sep 29, 2016
- CAMTEK LTD
- Yehuda Ben-Abu
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Application
CURABLE INK AND A METHOD FOR PRINTING AND CURING THE CURABLE INK
- Publication number 20160278216
- Publication date Sep 22, 2016
- CAMTEK LTD
- Muhammad Iraqi
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Application
ADAPTABLE END EFFECTOR
- Publication number 20160247706
- Publication date Aug 25, 2016
- Camtek LTD.
- Arnon Ben-Natan
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
ADAPTABLE CASETTE HOLDER
- Publication number 20160204013
- Publication date Jul 14, 2016
- Camtek LTD.
- Arnon Ben-Natan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELECTIVE VACUUM PRINTING MACHINE
- Publication number 20160143151
- Publication date May 19, 2016
- CAMTEK LTD
- Yehuda Ben-Abu
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
SURFACE PRETREATMENT AND DROP SPREADING CONTROL ON MULTI COMPONENT...
- Publication number 20150359094
- Publication date Dec 10, 2015
- Camtek LTD.
- Boaz NITZAN
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Application
MULTICOLOR PRINTING
- Publication number 20150296627
- Publication date Oct 15, 2015
- CAMTEK LTD
- Yehuda Ben-Abu
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
MULTIPLE MODE SYSTEM AND METHOD FOR EVALUATING A SUBSTRATE
- Publication number 20150042983
- Publication date Feb 12, 2015
- CAMTEK LTD
- Moshe Cohen-Erner
- G01 - MEASURING TESTING

Trademarklast 30 trademarks

Information Trademark
79352926
- Serial number 79352926
- Registration number 7459006
- Filing date Jun 13, 2022
- CAMTEK LTD
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79352927 - CAMTEK
- Serial number 79352927
- Registration number 7459007
- Filing date Jun 13, 2022
- CAMTEK LTD
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
85099273 - IPPIX
- Serial number 85099273
- Filing date Aug 3, 2010
- CamTek Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
85099284 - ENVIROPIX
- Serial number 85099284
- Filing date Aug 3, 2010
- CamTek Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
85099299 - PHANTOMPIX
- Serial number 85099299
- Filing date Aug 3, 2010
- Camtek, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
85071104 - IDRECON
- Serial number 85071104
- Filing date Jun 24, 2010
- CamTek Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
85071189 - CCTVPIX
- Serial number 85071189
- Filing date Jun 24, 2010
- CamTek Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
85071180 - EXITPIX
- Serial number 85071180
- Filing date Jun 24, 2010
- CamTek Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
85071174 - IWITNESSPIX
- Serial number 85071174
- Filing date Jun 24, 2010
- CamTek Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77172225 - CTI
- Serial number 77172225
- Registration number 3541014
- Filing date May 3, 2007
- CamTek, Inc.
- 6 - Common metals and their alloys

CamTek Inc.

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Business Address

Mailing Address

State Location

State of Incorporation

Patents Grantslast 30 patents

Method and system for classifying defects in wafer using wafer-defe...

Semiconductor edge and bevel inspection tool system

Semiconductor inspection tool system and method for wafer edge insp...

Measuring buried layers

Automatic defect classification

Optical contrast enhancement for defect inspection

Defect detection

Detection of pits using an automatic optical inspection system

Inspecting an object that includes a photo-sensitive polyimide layer

Height measurements of conductive structural elements that are surr...

Objective lens

Continuous light inspection

Aperture stop

System for inspecting a backside of a wafer

Inspection system and a method for inspecting a diced wafer

Method and system for low cost inspection

Inspecting a wafer using image and design information

Inspection system having an expanded angular coverage

Optical inspection system using multi-facet imaging

Selective vacuum printing machine

High throughput triangulation system

High throughput and low cost height triangulation system and method

Adaptable end effector

Selective solder mask printing on a printed circuit board (PCB)

System and a method for solder mask inspection

Multiple mode inspection system and method for evaluating a substra...

Method for improving coating

System and a method for automatic recipe validation and selection

Method and system for measuring bumps based on phase and amplitude...

Advanced inspection method utilizing short pulses LED illumination

Patents Applicationslast 30 patents

INSPECTION SYSTEM FOR EDGE AND BEVEL INSPECTION OF SEMICONDUCTOR ST...

METHOD AND SYSTEM FOR CLASSIFYING DEFECTS IN WAFER USING WAFER-DEFE...

SEMICONDUCTOR INSPECTION TOOL SYSTEM AND METHOD FOR WAFER EDGE INSP...

CONTINUOUS BUMP MEASUREMENT HEIGHT METROLOGY

DARK FIELD ILLUMINATION BASED ON LASER ILLUMINATED PHOSPHOR

BUMP MEASUREMENT HEIGHT METROLOGY

AUTOMATIC DEFECT CLASSIFICATION

METHOD AND SYSTEM FOR CLASSIFYING DEFECTS IN WAFER USING WAFER-DEFE...

DEFECT DETECTION

MEASURING BURIED LAYERS

HEIGHT MEASUREMENTS OF CONDUCTIVE STRUCTURAL ELEMENTS THAT ARE SURR...

INSPECTING AN OBJECT THAT INCLUDES A PHOTO-SENSITIVE POLYIMIDE LAYER

HIERARCHICAL WAFER INSPECTION

OBJECTIVE LENS

CONTINUOUS LIGHT INSPECTION

WARPED WAFERS VACUUM CHUCK

SYSTEM FOR INSPECTING A BACKSIDE OF A WAFER

High throughput triangulation system

MULTI-RESOLUTION PRINTER

APERTURE STOP

SYSTEM AND A METHOD FOR AUTOMATIC RECIPE VALIDATION AND SELECTION

INSPECTION SYSTEM HAVING AN EXPANDED ANGULAR COVERAGE

SELECTIVE SOLDER MASK PRINTING ON A PRINTED CIRCUIT BOARD (PCB)

CURABLE INK AND A METHOD FOR PRINTING AND CURING THE CURABLE INK

ADAPTABLE END EFFECTOR

ADAPTABLE CASETTE HOLDER

SELECTIVE VACUUM PRINTING MACHINE

SURFACE PRETREATMENT AND DROP SPREADING CONTROL ON MULTI COMPONENT...

MULTICOLOR PRINTING

MULTIPLE MODE SYSTEM AND METHOD FOR EVALUATING A SUBSTRATE

Trademarklast 30 trademarks

79352926

79352927 - CAMTEK

85099273 - IPPIX

85099284 - ENVIROPIX

85099299 - PHANTOMPIX

85071104 - IDRECON

85071189 - CCTVPIX

85071180 - EXITPIX

85071174 - IWITNESSPIX

77172225 - CTI