Carl Zeiss Microscopy Ltd.

Organization

Cambridge, GB

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Method and data analysis system for semi-automated particle analysi...
- Patent number 10,955,368
- Issue date Mar 23, 2021
- Carl Zeiss Microscopy Ltd.
- Champ Gohil
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam system and method
- Patent number 10,854,421
- Issue date Dec 1, 2020
- Carl Zeiss Microscopy GmbH
- Daniela Donhauser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detecting charged particles
- Patent number 10,049,855
- Issue date Aug 14, 2018
- Carl Zeiss Microscopy Ltd.
- Diego Guerra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of operating a charged particle microscope and charged parti...
- Patent number 9,916,964
- Issue date Mar 13, 2018
- Carl Zeiss Microscopy GmbH
- Simon Diemer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for performing EDS analysis
- Patent number 9,726,625
- Issue date Aug 8, 2017
- Carl Zeiss Microscopy Ltd.
- Edward Hill
- G01 - MEASURING TESTING
Information Patent Grant
Method for analyzing an object and charged particle beam device for...
- Patent number 9,620,331
- Issue date Apr 11, 2017
- Carl Zeiss Microscopy Ltd.
- Sreenivas Bhattiprolu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of operating a charged particle microscope and charged parti...
- Patent number 9,437,394
- Issue date Sep 6, 2016
- Carl Zeiss Microscopy Ltd.
- Simon Diemer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of analyzing a sample and charged particle beam device for a...
- Patent number 9,159,532
- Issue date Oct 13, 2015
- Carl Zeiss Microscopy Ltd.
- Edward Hill
- G01 - MEASURING TESTING
Information Patent Grant
Particle beam system having a hollow light guide
- Patent number 8,648,301
- Issue date Feb 11, 2014
- Carl Zeiss Microscopy Ltd.
- Stewart Bean
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microscope system, method for operating a charged-particle microscope
- Patent number 8,426,812
- Issue date Apr 23, 2013
- Carl Zeiss Microscopy Ltd.
- Stewart Bean
- G02 - OPTICS

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Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE BEAM SYSTEM AND METHOD
- Publication number 20190304743
- Publication date Oct 3, 2019
- CARL ZEISS MICROSCOPY GMBH
- Daniela Donhauser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETECTING CHARGED PARTICLES
- Publication number 20170162364
- Publication date Jun 8, 2017
- Carl Zeiss Microscopy Ltd.
- Diego Guerra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR PERFORMING EDS ANALYSIS
- Publication number 20160061754
- Publication date Mar 3, 2016
- Carl Zeiss Microscopy Ltd.
- Edward Hill
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DATA ANALYSIS SYSTEM FOR SEMI-AUTOMATED PARTICLE ANALYSI...
- Publication number 20150046097
- Publication date Feb 12, 2015
- Carl Zeiss Microscopy Ltd.
- Champ Gohil
- G01 - MEASURING TESTING
Information Patent Application
PARTICLE BEAM SYSTEM HAVING A HOLLOW LIGHT GUIDE
- Publication number 20130075604
- Publication date Mar 28, 2013
- Carl Zeiss Microscopy Ltd.
- Stewart Bean
- H01 - BASIC ELECTRIC ELEMENTS

Carl Zeiss Microscopy Ltd.

Organization

Patents Grantslast 30 patents

Method and data analysis system for semi-automated particle analysi...

Charged particle beam system and method

Detecting charged particles

Method of operating a charged particle microscope and charged parti...

Method and system for performing EDS analysis

Method for analyzing an object and charged particle beam device for...

Method of operating a charged particle microscope and charged parti...

Method of analyzing a sample and charged particle beam device for a...

Particle beam system having a hollow light guide

Microscope system, method for operating a charged-particle microscope

Patents Applicationslast 30 patents

CHARGED PARTICLE BEAM SYSTEM AND METHOD

DETECTING CHARGED PARTICLES

METHOD AND SYSTEM FOR PERFORMING EDS ANALYSIS

METHOD AND DATA ANALYSIS SYSTEM FOR SEMI-AUTOMATED PARTICLE ANALYSI...

PARTICLE BEAM SYSTEM HAVING A HOLLOW LIGHT GUIDE