CARL ZEISS NTS GMBH

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OBERKOCHEN, DE

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Particle beam device having a sample holder
- Patent number 9,190,242
- Issue date Nov 17, 2015
- Carl Zeiss NTS GmbH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Aperture unit for a particle beam device
- Patent number 8,779,381
- Issue date Jul 15, 2014
- Carl Zeiss NTS GmbH
- Matthias Lang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam microscope and method for operating the particle beam...
- Patent number 8,487,252
- Issue date Jul 16, 2013
- Carl Zeiss NTS GmbH
- Simon Diemer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device for deflecting or guiding in a particle beam
- Patent number 8,421,028
- Issue date Apr 16, 2013
- Carl Zeiss NTS GmbH
- Dirk Preikszas
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Particle beam device with deflection system
- Patent number 8,405,045
- Issue date Mar 26, 2013
- Carl Zeiss NTS GmbH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method for generating a stable high voltage
- Patent number 8,390,152
- Issue date Mar 5, 2013
- Carl Zeiss NTS GmbH
- Jorg Fober
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Phase contrast electron microscope
- Patent number 8,330,105
- Issue date Dec 11, 2012
- Carl Zeiss NTS GmbH
- Gerd Benner
- G01 - MEASURING TESTING
Information Patent Grant
Specimen holder having alignment marks
- Patent number 8,304,745
- Issue date Nov 6, 2012
- Carl Zeiss MicroImaging GmbH
- Heino Heise
- G02 - OPTICS
Information Patent Grant
Scanning charged particle beams
- Patent number 8,304,750
- Issue date Nov 6, 2012
- Carl Zeiss NTS GmbH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam apparatus having an annularly-shaped illumination ape...
- Patent number 8,299,442
- Issue date Oct 30, 2012
- Carl Zeiss NTS GmbH
- Gerd Benner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Positioning device for a particle beam apparatus
- Patent number 8,283,641
- Issue date Oct 9, 2012
- Carl Zeiss NTS GmbH
- Dietmar Dönitz
- B08 - CLEANING
Information Patent Grant
Device and method for analyzing an organic sample
- Patent number 8,263,933
- Issue date Sep 11, 2012
- Carl Zeiss NTS GmbH
- Ulrike Zeile
- G01 - MEASURING TESTING
Information Patent Grant
Particle beam device and method for use in a particle beam device
- Patent number 8,247,785
- Issue date Aug 21, 2012
- Carl Zeiss NTS GmbH
- Ulrike Zeile
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of operating a scanning electron microscope
- Patent number 8,227,752
- Issue date Jul 24, 2012
- Carl Zeiss NTS GmbH
- Hubert Mantz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle optical arrangement
- Patent number 8,217,350
- Issue date Jul 10, 2012
- Carl Zeiss NTS GmbH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-density FIB-SEM tomography via real-time imaging
- Patent number 8,178,838
- Issue date May 15, 2012
- Carl Zeiss NTS GmbH
- Edward Principe
- G01 - MEASURING TESTING
Information Patent Grant
Phase-shifting element and particle beam device having a phase-shif...
- Patent number 8,173,963
- Issue date May 8, 2012
- Carl Zeizz NTS GmbH
- Rasmus Schröder
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam source and method of manufacturing the same
- Patent number 8,164,071
- Issue date Apr 24, 2012
- Carl Zeiss NTS GmbH
- Volker Drexel
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Method of generating particle beam images using a particle beam app...
- Patent number 8,153,967
- Issue date Apr 10, 2012
- Carl Zeiss NTS GmbH
- Christian Hendrich
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for processing a digital gray value image so that a reduced...
- Patent number 8,131,102
- Issue date Mar 6, 2012
- Carl Zeiss NTS GmbH
- Michael Albiez
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam column and method of operating same
- Patent number 8,129,693
- Issue date Mar 6, 2012
- Carl Zeiss NTS GmbH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Processing system
- Patent number 8,115,180
- Issue date Feb 14, 2012
- Carl Zeiss NTS GmbH
- Holger Doemer
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Device and method for analyzing a sample
- Patent number 8,093,556
- Issue date Jan 10, 2012
- Carl Zeiss NTS GmbH
- Ulrike Zeile
- G01 - MEASURING TESTING
Information Patent Grant
Particle optical device with magnet assembly
- Patent number 8,063,364
- Issue date Nov 22, 2011
- Carl Zeiss NTS GmbH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for binarizing a digital gray value image to generate a bina...
- Patent number 8,064,714
- Issue date Nov 22, 2011
- Carl Zeiss NTS GmbH
- Michael Albiez
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electron microscope for inspecting and processing of an object with...
- Patent number 8,058,614
- Issue date Nov 15, 2011
- Carl Zeiss NTS GmbH
- Johannes Bihr
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Phase contrast electron microscope
- Patent number 8,039,796
- Issue date Oct 18, 2011
- Carl Zeizz NTS GmbH
- Gerd Benner
- G01 - MEASURING TESTING
Information Patent Grant
System for processing an object
- Patent number 8,008,639
- Issue date Aug 30, 2011
- Carl Zeiss NTS GmbH
- Wolfram Buhler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for processing an object
- Patent number 7,923,702
- Issue date Apr 12, 2011
- Carl Zeiss NTS GmbH
- Wolfram Buhler
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Electron-beam device and detector system
- Patent number 7,910,887
- Issue date Mar 22, 2011
- Carl Zeiss NTS GmbH
- Michael D. G. Steigerwald
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Processing System
- Publication number 20130098292
- Publication date Apr 25, 2013
- CARL ZEISS NTS GMBH
- Emmerich Bertagnolli
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Transmission Electron Microscope and Method of Operating a Transmis...
- Publication number 20130092836
- Publication date Apr 18, 2013
- CARL ZEISS NTS GMBH
- Joerg Fober
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Particle Beam Microscope
- Publication number 20120326030
- Publication date Dec 27, 2012
- CARL ZEISS NTS GMBH
- Gerd Benner
- G01 - MEASURING TESTING
Information Patent Application
PROCESSING SYSTEM
- Publication number 20120267545
- Publication date Oct 25, 2012
- CARL ZEISS NTS GMBH
- Fabian Perez-Willard
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Beam System and Method of Operating Ion Beam System
- Publication number 20120256098
- Publication date Oct 11, 2012
- CARL ZEISS NTS GMBH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM SOURCE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20120248959
- Publication date Oct 4, 2012
- CARL ZEISS NTS GMBH
- Wolfram Buehler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OBJECTIVE LENS
- Publication number 20120205550
- Publication date Aug 16, 2012
- CARL ZEISS NTS GMBH
- Volker Drexel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Particle Beam System
- Publication number 20120199740
- Publication date Aug 9, 2012
- CARL ZEISS NTS GMBH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEM-Lamella, Process for its Manufacture, and Apparatus for Executi...
- Publication number 20120189813
- Publication date Jul 26, 2012
- CARL ZEISS NTS GMBH
- Lorenz Lechner
- G01 - MEASURING TESTING
Information Patent Application
Method of Depositing Protective Structures
- Publication number 20120187291
- Publication date Jul 26, 2012
- CARL ZEISS NTS GMBH
- Heinz Wanzenboeck
- G01 - MEASURING TESTING
Information Patent Application
Method of Processing of an Object
- Publication number 20120145895
- Publication date Jun 14, 2012
- CARL ZEISS NTS GMBH
- Josef BIBERGER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE BEAM DEVICE WITH DEFLECTION SYSTEM
- Publication number 20120138814
- Publication date Jun 7, 2012
- CARL ZEISS NTS LTD.
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM SOURCE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20120131785
- Publication date May 31, 2012
- NANOTOOLS GMBH
- Volker Drexel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROCESSING SYSTEM
- Publication number 20120091363
- Publication date Apr 19, 2012
- CARL ZEISS NTS GMBH
- Holger Doemer
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Particle Beam Microscope and Method for Operating the Particle Beam...
- Publication number 20120074317
- Publication date Mar 29, 2012
- CARL ZEISS NTS GMBH
- Simon Diemer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Particle Beam System
- Publication number 20120025078
- Publication date Feb 2, 2012
- CARL ZEISS NTS GMBH
- Hubert Mantz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Particle Beam System
- Publication number 20120025077
- Publication date Feb 2, 2012
- CARL ZEISS NTS GMBH
- Hubert Mantz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Particle Beam System
- Publication number 20120025093
- Publication date Feb 2, 2012
- CARL ZEISS NTS GMBH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM SYSTEM
- Publication number 20120025094
- Publication date Feb 2, 2012
- CARL ZEISS NTS GMBH
- Gerd Benner
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM COLUMN AND METHOD OF OPERATING SAME
- Publication number 20120025095
- Publication date Feb 2, 2012
- CARL ZEISS NTS GMBH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Inspection System
- Publication number 20110226949
- Publication date Sep 22, 2011
- Carl Zeiss NTSGmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Transmission Electron Microscope
- Publication number 20110210249
- Publication date Sep 1, 2011
- CARL ZEISS NTS GMBH
- Gerd Benner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LASER PROCESSING SYSTEM, OBJECT MOUNT AND LASER PROCESSING METHOD
- Publication number 20110198326
- Publication date Aug 18, 2011
- CARL ZEISS NTS GMBH
- Holger Doemer
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
ISOTOPE ION MICROSCOPE METHODS AND SYSTEMS
- Publication number 20110139979
- Publication date Jun 16, 2011
- CARL ZEISS NTS, LLC.
- John A. Notte, IV
- G01 - MEASURING TESTING
Information Patent Application
SACP Method and Particle Optical System for Performing the Method
- Publication number 20110108736
- Publication date May 12, 2011
- CARL ZEISS NTS GMBH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM COLUMN AND METHOD OF OPERATING SAME
- Publication number 20100327179
- Publication date Dec 30, 2010
- CARL ZEISS NTS GMBH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING CHARGED PARTICLE BEAMS
- Publication number 20100294930
- Publication date Nov 25, 2010
- CARL ZEISS NTS GMBH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of depositing protective structures
- Publication number 20100276607
- Publication date Nov 4, 2010
- Carl Zeiss NTS GmbH
- Heinz Wanzenboeck
- G01 - MEASURING TESTING
Information Patent Application
PARTICLE-BEAM MICROSCOPE
- Publication number 20100258719
- Publication date Oct 14, 2010
- CARL ZEISS NTS GMBH
- Gerd Benner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Phase contrast electron microscope
- Publication number 20100181481
- Publication date Jul 22, 2010
- Carl Zeiss NTS GmbH
- Gerd Benner
- G01 - MEASURING TESTING

Trademarklast 30 trademarks

Information Trademark
85358667 - INLENSDUO
- Serial number 85358667
- Registration number 4130971
- Filing date Jun 28, 2011
- Carl Zeiss NTS GmbH
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
85358633 - KRONOS
- Serial number 85358633
- Registration number 4248403
- Filing date Jun 28, 2011
- Carl Zeiss NTS GmbH
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
85271073 - EVO
- Serial number 85271073
- Registration number 4173838
- Filing date Mar 18, 2011
- Carl Zeiss NTS GmbH
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
85049541 - ATLAS
- Serial number 85049541
- Registration number 4086067
- Filing date May 27, 2010
- Carl Zeiss NTS GmbH
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76702276 - EIGMA
- Serial number 76702276
- Registration number 3881963
- Filing date Mar 29, 2010
- Carl Zeiss NTS GmbH
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77959320 - DUAL GUN
- Serial number 77959320
- Registration number 3930246
- Filing date Mar 15, 2010
- Carl Zeiss NTS GmbH
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77959306 - EASYVP
- Serial number 77959306
- Registration number 3882547
- Filing date Mar 15, 2010
- Carl Zeiss NTS GmbH
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77690656 - AURIGA
- Serial number 77690656
- Registration number 3751428
- Filing date Mar 13, 2009
- Carl Zeiss NTS GmbH
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77328285 - SMARTION
- Serial number 77328285
- Registration number 3552851
- Filing date Nov 13, 2007
- Carl Zeiss NTS GmbH
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77294342 - ALIS
- Serial number 77294342
- Registration number 3466315
- Filing date Oct 2, 2007
- Carl Zeiss NTS GmbH
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77175741 - CENTRA
- Serial number 77175741
- Registration number 3421694
- Filing date May 8, 2007
- Carl Zeiss NTS GmbH
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77128730 - IPSEM
- Serial number 77128730
- Registration number 3429580
- Filing date Mar 12, 2007
- Carl Zeiss NTS GmbH
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77093602 - ORION
- Serial number 77093602
- Registration number 3548748
- Filing date Jan 29, 2007
- Carl Zeiss NTS GmbH
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77026963 - SMARTPI
- Serial number 77026963
- Registration number 3287425
- Filing date Oct 23, 2006
- Carl Zeiss NTS GmbH
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77025946 - PHAME
- Serial number 77025946
- Registration number 3404145
- Filing date Oct 20, 2006
- Carl Zeiss NTS GmbH
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77012675 - ESB
- Serial number 77012675
- Registration number 3284368
- Filing date Oct 3, 2006
- Carl Zeiss NTS GmbH
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77012681 - ASB
- Serial number 77012681
- Registration number 3289502
- Filing date Oct 3, 2006
- Carl Zeiss NTS GmbH
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78889196 - NEON
- Serial number 78889196
- Registration number 3229531
- Filing date May 22, 2006
- Carl Zeiss NTS GmbH
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78734692 - BEAMSLEEVE
- Serial number 78734692
- Registration number 3157714
- Filing date Oct 17, 2005
- Carl Zeiss NTS GmbH
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78592448 - XIGMA
- Serial number 78592448
- Registration number 3153065
- Filing date Mar 22, 2005
- Carl Zeiss NTS GmbH
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76531872 - CONCISE
- Serial number 76531872
- Registration number 3189727
- Filing date Jul 24, 2003
- LEO Elektronenmikroskopie GmbH
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76512243 - EVOLUTION
- Serial number 76512243
- Filing date May 7, 2003
- LEO Elektronenmikroscopie GmbH
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

CARL ZEISS NTS GMBH

Organization

Patents Grantslast 30 patents

Particle beam device having a sample holder

Aperture unit for a particle beam device

Particle beam microscope and method for operating the particle beam...

Device for deflecting or guiding in a particle beam

Particle beam device with deflection system

Device and method for generating a stable high voltage

Phase contrast electron microscope

Specimen holder having alignment marks

Scanning charged particle beams

Particle beam apparatus having an annularly-shaped illumination ape...

Positioning device for a particle beam apparatus

Device and method for analyzing an organic sample

Particle beam device and method for use in a particle beam device

Method of operating a scanning electron microscope

Particle optical arrangement

High-density FIB-SEM tomography via real-time imaging

Phase-shifting element and particle beam device having a phase-shif...

Electron beam source and method of manufacturing the same

Method of generating particle beam images using a particle beam app...

Method for processing a digital gray value image so that a reduced...

Charged particle beam column and method of operating same

Processing system

Device and method for analyzing a sample

Particle optical device with magnet assembly

Method for binarizing a digital gray value image to generate a bina...

Electron microscope for inspecting and processing of an object with...

Phase contrast electron microscope

System for processing an object

System and method for processing an object

Electron-beam device and detector system

Patents Applicationslast 30 patents

Processing System

Transmission Electron Microscope and Method of Operating a Transmis...

Particle Beam Microscope

PROCESSING SYSTEM

Ion Beam System and Method of Operating Ion Beam System

ELECTRON BEAM SOURCE AND METHOD OF MANUFACTURING THE SAME

OBJECTIVE LENS

Particle Beam System

TEM-Lamella, Process for its Manufacture, and Apparatus for Executi...

Method of Depositing Protective Structures

Method of Processing of an Object

PARTICLE BEAM DEVICE WITH DEFLECTION SYSTEM

ELECTRON BEAM SOURCE AND METHOD OF MANUFACTURING THE SAME

PROCESSING SYSTEM

Particle Beam Microscope and Method for Operating the Particle Beam...

Particle Beam System

Particle Beam System

Particle Beam System

CHARGED PARTICLE BEAM SYSTEM

CHARGED PARTICLE BEAM COLUMN AND METHOD OF OPERATING SAME

Inspection System

Transmission Electron Microscope

LASER PROCESSING SYSTEM, OBJECT MOUNT AND LASER PROCESSING METHOD

ISOTOPE ION MICROSCOPE METHODS AND SYSTEMS

SACP Method and Particle Optical System for Performing the Method

CHARGED PARTICLE BEAM COLUMN AND METHOD OF OPERATING SAME

SCANNING CHARGED PARTICLE BEAMS

Method of depositing protective structures

PARTICLE-BEAM MICROSCOPE

Phase contrast electron microscope

Trademarklast 30 trademarks

85358667 - INLENSDUO

85358633 - KRONOS

85271073 - EVO

85049541 - ATLAS

76702276 - EIGMA

77959320 - DUAL GUN

77959306 - EASYVP

77690656 - AURIGA

77328285 - SMARTION

77294342 - ALIS

77175741 - CENTRA

77128730 - IPSEM

77093602 - ORION

77026963 - SMARTPI

77025946 - PHAME