Carl Zeiss Semiconductor Manufacturing Technologuies AG

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Oberkochen, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method and a device for determining the radiation-damage resistance...
- Patent number 6,734,970
- Issue date May 11, 2004
- Carl Zeiss Semiconductor Manufacturing Technologuies AG
- Hexin Wang
- G01 - MEASURING TESTING