TREA

Carl Zeiss SMT Inc.

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Organization

  • Peabody, MA, US
Organizations

Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    REDUCING PARTICLE IMPLANTATION
    • Publication number 20110049364
    • Publication date Mar 3, 2011
    • Carl Zeiss SMT Inc.
    • Rainer Knippelmeyer
    • G01 - MEASURING TESTING
  • Information Patent Application

    GAS FIELD ION SOURCE WITH COATED TIP
    • Publication number 20110001058
    • Publication date Jan 6, 2011
    • Carl Zeiss SMT Inc.
    • John A. Notte, IV
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    ICE LAYERS IN CHARGED PARTICLE SYSTEMS AND METHODS
    • Publication number 20100136255
    • Publication date Jun 3, 2010
    • Carl Zeiss SMT Inc.
    • John A. Notte, IV
    • C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
  • Information Patent Application

    ION BEAM STABILIZATION
    • Publication number 20100051805
    • Publication date Mar 4, 2010
    • Carl Zeiss SMT Inc.
    • FHM-Faridur Rahman
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    REPAIRING DEFECTS
    • Publication number 20100052697
    • Publication date Mar 4, 2010
    • Carl Zeiss SMT Inc.
    • Rainer Knippelmeyer
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
  • Information Patent Application

    MULTIPLE CURRENT CHARGED PARTICLE METHODS
    • Publication number 20100012837
    • Publication date Jan 21, 2010
    • Carl Zeiss SMT Inc.
    • John A. Notte, IV
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    INCREASING CURRENT IN CHARGED PARTICLE SOURCES AND SYSTEMS
    • Publication number 20100012839
    • Publication date Jan 21, 2010
    • Carl Zeiss SMT Inc.
    • John A. Notte, IV
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SAMPLE DECONTAMINATION
    • Publication number 20090314939
    • Publication date Dec 24, 2009
    • Carl Zeiss SMT Inc.
    • Lewis A. Stern
    • G01 - MEASURING TESTING

Trademarklast 30 trademarks