CARL ZEISS SMT LIMITED

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Cambridge, GB

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Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam device
- Patent number 7,925,284
- Issue date Apr 12, 2011
- Carl Zeiss SMT Limited
- Tim Robert Stubbs
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam instrument and method of detecting charged pa...
- Patent number 7,777,195
- Issue date Aug 17, 2010
- Carl Zeiss SMT Limited
- Armin Heinz Hayn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning particle beam instrument
- Patent number 7,348,557
- Issue date Mar 25, 2008
- Carl Zeiss SMT Limited
- Andrew Philip Armit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transresistance amplifier for a charged particle detector
- Patent number 7,317,350
- Issue date Jan 8, 2008
- Carl Zeiss SMT Limited
- Andrew Philip Armit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 7,186,976
- Issue date Mar 6, 2007
- Carl Zeiss SMT Limited
- Michael Frank Dean
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle detectors
- Patent number 6,943,352
- Issue date Sep 13, 2005
- Carl Zeiss SMT Limited
- Armin Heinz Hayn
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Charged Particle Beam Instrument and Method of Detecting Charged Pa...
- Publication number 20080078934
- Publication date Apr 3, 2008
- CARL ZEISS SMT LIMITED
- Armin Heinz Hayn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device
- Publication number 20070191036
- Publication date Aug 16, 2007
- CARL ZEISS SMT LIMITED
- Tim Robert Stubbs
- H01 - BASIC ELECTRIC ELEMENTS

Trademarklast 30 trademarks