Celadon Systems, Inc.

Organization

Apple Valley, MN, US

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Portable probe card assembly
- Patent number 11,933,816
- Issue date Mar 19, 2024
- Celadon Systems, Inc.
- William A. Funk
- G01 - MEASURING TESTING
Information Patent Grant
Modular rail systems, rail systems, mechanisms, and equipment for d...
- Patent number 11,313,902
- Issue date Apr 26, 2022
- Celadon Systems, Inc.
- John L. Dunklee
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
High voltage probe card system
- Patent number 11,275,106
- Issue date Mar 15, 2022
- Celadon Systems, Inc.
- Adam J. Schultz
- G01 - MEASURING TESTING
Information Patent Grant
Magnet extension
- Patent number 10,976,347
- Issue date Apr 13, 2021
- Celadon Systems, Inc.
- William A. Funk
- G01 - MEASURING TESTING
Information Patent Grant
Modular rail systems, rail systems, mechanisms, and equipment for d...
- Patent number 10,620,262
- Issue date Apr 14, 2020
- Celadon Systems, Inc.
- John L. Dunklee
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Probe card with stress relieving feature
- Patent number 10,295,565
- Issue date May 21, 2019
- Celadon Systems, Inc.
- John L. Dunklee
- G01 - MEASURING TESTING
Information Patent Grant
Modular rail systems, rail systems, mechanisms, and equipment for d...
- Patent number 10,261,124
- Issue date Apr 16, 2019
- Celadon Systems, Inc.
- John L. Dunklee
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus having a probe core with a latch mechanism
- Patent number 10,254,309
- Issue date Apr 9, 2019
- Celadon Systems, Inc.
- John L. Dunklee
- G01 - MEASURING TESTING
Information Patent Grant
Probe card with stress relieving feature
- Patent number 10,254,311
- Issue date Apr 9, 2019
- Celadon Systems, Inc.
- John L. Dunklee
- G01 - MEASURING TESTING
Information Patent Grant
Test systems with a probe apparatus and index mechanism
- Patent number 10,145,863
- Issue date Dec 4, 2018
- Celadon Systems, Inc.
- William A. Funk
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for terminating probe apparatus of semiconduct...
- Patent number 9,910,067
- Issue date Mar 6, 2018
- Celadon Systems, Inc.
- Bryan J. Root
- G01 - MEASURING TESTING
Information Patent Grant
Test systems with a probe apparatus and index mechanism
- Patent number 9,726,694
- Issue date Aug 8, 2017
- Celadon Systems, Inc.
- William A. Funk
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus having a probe core with a twist lock mechanism
- Patent number 9,678,149
- Issue date Jun 13, 2017
- Celadon Systems, Inc.
- Bryan J. Root
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for terminating probe apparatus of semiconduct...
- Patent number 9,279,829
- Issue date Mar 8, 2016
- Celadon Systems, Inc.
- Bryan J. Root
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus having a probe card and connector mechanism
- Patent number 9,024,651
- Issue date May 5, 2015
- Celadon Systems, Inc.
- Bryan J. Root
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus having a probe card and connector mechanism
- Patent number 9,018,966
- Issue date Apr 28, 2015
- Celadon Systems, Inc.
- Bryan J. Root
- G01 - MEASURING TESTING
Information Patent Grant
Test systems with a probe apparatus and index mechanism
- Patent number 8,994,390
- Issue date Mar 31, 2015
- Celadon Systems, Inc.
- Bryan J. Root
- G01 - MEASURING TESTING
Information Patent Grant
Top contact layout board in an electrical system
- Patent number D722031
- Issue date Feb 3, 2015
- Celadon Systems, Inc.
- John L. Dunklee
- D13 - Equipment for production, distribution, or transformation of energy
Information Patent Grant
Apparatus and method for terminating probe apparatus of semiconduct...
- Patent number 8,860,450
- Issue date Oct 14, 2014
- Celadon Systems, Inc.
- Bryan J. Root
- G01 - MEASURING TESTING
Information Patent Grant
Support for a probe test core
- Patent number D713363
- Issue date Sep 16, 2014
- Celadon Systems, Inc.
- William A. Funk
- D13 - Equipment for production, distribution, or transformation of energy
Information Patent Grant
Probe test equipment for testing a semiconductor device
- Patent number 8,698,515
- Issue date Apr 15, 2014
- Celadon Systems, Inc.
- Bryan J. Root
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus having a probe core with a twist lock mechanism
- Patent number 8,674,715
- Issue date Mar 18, 2014
- Celadon Systems, Inc.
- Bryan J. Root
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Replaceable probe apparatus for probing semiconductor wafer
- Patent number 8,354,856
- Issue date Jan 15, 2013
- Celadon Systems, Inc.
- Bryan J. Root
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for terminating probe apparatus of semiconduct...
- Patent number 8,149,009
- Issue date Apr 3, 2012
- Celadon Systems, Inc.
- Bryan J. Root
- G01 - MEASURING TESTING
Information Patent Grant
Grooved wire support for a probe test core
- Patent number D654033
- Issue date Feb 14, 2012
- Celadon Systems, Inc.
- Bryan J. Root
- D13 - Equipment for production, distribution, or transformation of energy
Information Patent Grant
Replaceable probe apparatus for probing semiconductor wafer
- Patent number 7,999,564
- Issue date Aug 16, 2011
- Celadon Systems, Inc.
- Bryan J. Root
- G01 - MEASURING TESTING
Information Patent Grant
Top contact layout board in an electrical system
- Patent number D639757
- Issue date Jun 14, 2011
- Celadon Systems, Inc.
- Bryan J. Root
- D13 - Equipment for production, distribution, or transformation of energy
Information Patent Grant
Top contact layout board in an electrical system
- Patent number D639755
- Issue date Jun 14, 2011
- Celadon Systems, Inc.
- Bryan J. Root
- D13 - Equipment for production, distribution, or transformation of energy
Information Patent Grant
Probe tile for probing semiconductor wafer
- Patent number 7,956,629
- Issue date Jun 7, 2011
- Celadon Systems, Inc.
- Bryan J. Root
- G01 - MEASURING TESTING
Information Patent Grant
Probe tile for probing semiconductor wafer
- Patent number 7,786,743
- Issue date Aug 31, 2010
- Celadon Systems, Inc.
- Bryan J. Root
- G01 - MEASURING TESTING

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Patents Applicationslast 30 patents

Information Patent Application
PORTABLE PROBE CARD ASSEMBLY
- Publication number 20240219423
- Publication date Jul 4, 2024
- Celadon Systems, Inc.
- William A. FUNK
- G01 - MEASURING TESTING
Information Patent Application
PORTABLE PROBE CARD ASSEMBLY
- Publication number 20220163562
- Publication date May 26, 2022
- Celadon Systems, Inc.
- William A. FUNK
- G01 - MEASURING TESTING
Information Patent Application
MODULAR RAIL SYSTEMS, RAIL SYSTEMS, MECHANISMS, AND EQUIPMENT FOR D...
- Publication number 20200341055
- Publication date Oct 29, 2020
- Celadon Systems, Inc.
- John L. DUNKLEE
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
HIGH VOLTAGE PROBE CARD SYSTEM
- Publication number 20200110126
- Publication date Apr 9, 2020
- Celadon Systems, Inc.
- Adam J. SCHULTZ
- G01 - MEASURING TESTING
Information Patent Application
MODULAR RAIL SYSTEMS, RAIL SYSTEMS, MECHANISMS, AND EQUIPMENT FOR D...
- Publication number 20190235018
- Publication date Aug 1, 2019
- Celadon Systems, Inc.
- John L. DUNKLEE
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
MAGNET EXTENSION
- Publication number 20190033344
- Publication date Jan 31, 2019
- Celadon Systems, Inc.
- William A. Funk
- G01 - MEASURING TESTING
Information Patent Application
MODULAR RAIL SYSTEMS, RAIL SYSTEMS, MECHANISMS, AND EQUIPMENT FOR D...
- Publication number 20190011498
- Publication date Jan 10, 2019
- Celadon Systems, Inc.
- John L. Dunklee
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEMS WITH A PROBE APPARATUS AND INDEX MECHANISM
- Publication number 20180024165
- Publication date Jan 25, 2018
- Celadon Systems, Inc.
- William A. FUNK
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD WITH STRESS RELIEVING FEATURE
- Publication number 20170285069
- Publication date Oct 5, 2017
- CELADON SYSTEMS, INC.
- John L. DUNKLEE
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS HAVING A PROBE CORE WITH A LATCH MECHANISM
- Publication number 20160320428
- Publication date Nov 3, 2016
- Celadon Systems, Inc.
- John L. Dunklee
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR TERMINATING PROBE APPARATUS OF SEMICONDUCT...
- Publication number 20160187379
- Publication date Jun 30, 2016
- Celadon Systems, Inc.
- Bryan J. Root
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEMS WITH A PROBE APPARATUS AND INDEX MECHANISM
- Publication number 20150204911
- Publication date Jul 23, 2015
- Celadon Systems, Inc.
- William A. FUNK
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR TERMINATING PROBE APPARATUS OF SEMICONDUCT...
- Publication number 20150084662
- Publication date Mar 26, 2015
- Celadon Systems, Inc.
- Bryan J. Root
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS HAVING A PROBE CARD AND CONNECTOR MECHANISM
- Publication number 20140239996
- Publication date Aug 28, 2014
- Intel Corporation
- Bryan J. Root
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEMS WITH A PROBE APPARATUS AND INDEX MECHANISM
- Publication number 20140225636
- Publication date Aug 14, 2014
- Celadon Systems, Inc.
- Bryan J. Root
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS HAVING A PROBE CARD AND CONNECTOR MECHANISM
- Publication number 20140210501
- Publication date Jul 31, 2014
- Celadon Systems, Inc.
- Bryan J. Root
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS HAVING A PROBE CORE WITH A TWIST LOCK MECHANISM
- Publication number 20140139248
- Publication date May 22, 2014
- Celadon Systems, Inc.
- Bryan J. Root
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR TERMINATING PROBE APPARATUS OF SEMICONDUCT...
- Publication number 20120161804
- Publication date Jun 28, 2012
- Celadon Systems, Inc.
- Bryan J. Root
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL TESTING APPARATUS
- Publication number 20120038380
- Publication date Feb 16, 2012
- Celadon Systems, Inc.
- Bryan J. Root
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS HAVING A PROBE CORE WITH A TWIST LOCK MECHANISM
- Publication number 20110204912
- Publication date Aug 25, 2011
- Celadon Systems, Inc.
- Bryan J. Root
- G01 - MEASURING TESTING
Information Patent Application
PROBE TILE FOR PROBING SEMICONDUCTOR WAFER
- Publication number 20100283494
- Publication date Nov 11, 2010
- Celadon Systems, Inc.
- Bryan J. Root
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR TERMINATING PROBE APPARATUS OF SEMICONDUCT...
- Publication number 20100259288
- Publication date Oct 14, 2010
- Celadon Systems, Inc.
- Bryan J. Root
- G01 - MEASURING TESTING
Information Patent Application
REPLACEABLE PROBE APPARATUS FOR PROBING SEMICONDUCTOR WAFER
- Publication number 20100203758
- Publication date Aug 12, 2010
- Celadon Systems, Inc.
- Bryan J. Root
- G01 - MEASURING TESTING
Information Patent Application
REPLACEABLE PROBE APPARATUS FOR PROBING SEMICONDUCTOR WAFER
- Publication number 20090295416
- Publication date Dec 3, 2009
- Celadon Systems, Inc.
- Bryan J. Root
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Method for Terminating Probe Apparatus of Semiconduct...
- Publication number 20070279075
- Publication date Dec 6, 2007
- Celadon Systems, Inc.
- Bryan J. Root
- G01 - MEASURING TESTING
Information Patent Application
Shielded Probe Apparatus for Probing Semiconductor Wafer
- Publication number 20070252606
- Publication date Nov 1, 2007
- Celadon Systems, Inc.
- Bryan J. Root
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Method for Terminating Probe Apparatus of Semiconduct...
- Publication number 20070087597
- Publication date Apr 19, 2007
- Celadon Systems, Inc.
- Bryan J. Root
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for terminating probe apparatus of semiconduct...
- Publication number 20060186903
- Publication date Aug 24, 2006
- Celadon Systems, Inc.
- Bryan J. Root
- G01 - MEASURING TESTING
Information Patent Application
Shielded probe apparatus for probing semiconductor wafer
- Publication number 20060114009
- Publication date Jun 1, 2006
- Celadon Systems, Inc.
- Bryan J. Root
- G01 - MEASURING TESTING
Information Patent Application
Replaceable probe apparatus for probing semiconductor wafer
- Publication number 20060049841
- Publication date Mar 9, 2006
- Celadon Systems, Inc.
- Bryan J. Root
- G01 - MEASURING TESTING

Celadon Systems, Inc.

Organization

Patents Grantslast 30 patents

Portable probe card assembly

Modular rail systems, rail systems, mechanisms, and equipment for d...

High voltage probe card system

Magnet extension

Modular rail systems, rail systems, mechanisms, and equipment for d...

Probe card with stress relieving feature

Modular rail systems, rail systems, mechanisms, and equipment for d...

Test apparatus having a probe core with a latch mechanism

Probe card with stress relieving feature

Test systems with a probe apparatus and index mechanism

Apparatus and method for terminating probe apparatus of semiconduct...

Test systems with a probe apparatus and index mechanism

Test apparatus having a probe core with a twist lock mechanism

Apparatus and method for terminating probe apparatus of semiconduct...

Test apparatus having a probe card and connector mechanism

Test apparatus having a probe card and connector mechanism

Test systems with a probe apparatus and index mechanism

Top contact layout board in an electrical system

Apparatus and method for terminating probe apparatus of semiconduct...

Support for a probe test core

Probe test equipment for testing a semiconductor device

Test apparatus having a probe core with a twist lock mechanism

Replaceable probe apparatus for probing semiconductor wafer

Apparatus and method for terminating probe apparatus of semiconduct...

Grooved wire support for a probe test core

Replaceable probe apparatus for probing semiconductor wafer

Top contact layout board in an electrical system

Top contact layout board in an electrical system

Probe tile for probing semiconductor wafer

Probe tile for probing semiconductor wafer

Patents Applicationslast 30 patents

PORTABLE PROBE CARD ASSEMBLY

PORTABLE PROBE CARD ASSEMBLY

MODULAR RAIL SYSTEMS, RAIL SYSTEMS, MECHANISMS, AND EQUIPMENT FOR D...

HIGH VOLTAGE PROBE CARD SYSTEM

MODULAR RAIL SYSTEMS, RAIL SYSTEMS, MECHANISMS, AND EQUIPMENT FOR D...

MAGNET EXTENSION

MODULAR RAIL SYSTEMS, RAIL SYSTEMS, MECHANISMS, AND EQUIPMENT FOR D...

TEST SYSTEMS WITH A PROBE APPARATUS AND INDEX MECHANISM

PROBE CARD WITH STRESS RELIEVING FEATURE

TEST APPARATUS HAVING A PROBE CORE WITH A LATCH MECHANISM

APPARATUS AND METHOD FOR TERMINATING PROBE APPARATUS OF SEMICONDUCT...

TEST SYSTEMS WITH A PROBE APPARATUS AND INDEX MECHANISM

APPARATUS AND METHOD FOR TERMINATING PROBE APPARATUS OF SEMICONDUCT...

TEST APPARATUS HAVING A PROBE CARD AND CONNECTOR MECHANISM

TEST SYSTEMS WITH A PROBE APPARATUS AND INDEX MECHANISM

TEST APPARATUS HAVING A PROBE CARD AND CONNECTOR MECHANISM

TEST APPARATUS HAVING A PROBE CORE WITH A TWIST LOCK MECHANISM

APPARATUS AND METHOD FOR TERMINATING PROBE APPARATUS OF SEMICONDUCT...

ELECTRICAL TESTING APPARATUS

TEST APPARATUS HAVING A PROBE CORE WITH A TWIST LOCK MECHANISM

PROBE TILE FOR PROBING SEMICONDUCTOR WAFER

APPARATUS AND METHOD FOR TERMINATING PROBE APPARATUS OF SEMICONDUCT...

REPLACEABLE PROBE APPARATUS FOR PROBING SEMICONDUCTOR WAFER

REPLACEABLE PROBE APPARATUS FOR PROBING SEMICONDUCTOR WAFER

Apparatus and Method for Terminating Probe Apparatus of Semiconduct...

Shielded Probe Apparatus for Probing Semiconductor Wafer

Apparatus and Method for Terminating Probe Apparatus of Semiconduct...

Apparatus and method for terminating probe apparatus of semiconduct...

Shielded probe apparatus for probing semiconductor wafer

Replaceable probe apparatus for probing semiconductor wafer