Membership
Tour
Register
Log in
CELERINT, LLC.
Follow
Organization
New York, NY, US
Organizations
Overview
Industries
People
People
Information
Transactions
Events
Impact
Please log in for detailed analytics
Patents Grants
last 30 patents
Information
Patent Grant
Method for in situ functionality testing of switches and contacts i...
Patent number
11,555,856
Issue date
Jan 17, 2023
Celerint, LLC
Howard H. Roberts
G01 - MEASURING TESTING
Information
Patent Grant
Method for continuous tester operation during long soak time testing
Patent number
11,448,688
Issue date
Sep 20, 2022
Celerint, LLC
Howard H. Roberts
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for utilizing stand-alone controller in multiplex...
Patent number
10,422,828
Issue date
Sep 24, 2019
Celerint, LLC
Howard H. Roberts
G01 - MEASURING TESTING
Information
Patent Grant
Method for continuous tester operation during multiple stage temper...
Patent number
10,386,405
Issue date
Aug 20, 2019
Celerint, LLC
Howard H. Roberts
G01 - MEASURING TESTING
Information
Patent Grant
Modular multiplexing interface assembly for reducing semiconductor...
Patent number
10,197,622
Issue date
Feb 5, 2019
Celerint, LLC
Howard H. Roberts
G01 - MEASURING TESTING
Information
Patent Grant
Method for testing semiconductor wafers using temporary sacrificial...
Patent number
10,043,722
Issue date
Aug 7, 2018
Celerint, LLC
Howard Roberts
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Parallel concurrent test system and method
Patent number
9,817,062
Issue date
Nov 14, 2017
Celerint, LLC
Howard H. Roberts
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device handler throughput optimization
Patent number
9,818,631
Issue date
Nov 14, 2017
Celerint, LLC
Howard Roberts
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Muxing interface platform for multiplexed handlers to reduce index...
Patent number
9,753,081
Issue date
Sep 5, 2017
Celerint, LLC
Howard Roberts
G01 - MEASURING TESTING
Information
Patent Grant
Universal multiplexing interface system and method
Patent number
9,733,301
Issue date
Aug 15, 2017
Celerint, LLC
Howard Roberts
G01 - MEASURING TESTING
Information
Patent Grant
Parallel concurrent test system and method
Patent number
9,551,740
Issue date
Jan 24, 2017
Celerint, LLC
Howard H. Roberts
G01 - MEASURING TESTING
Information
Patent Grant
Tandem handler system and method for reduced index time
Patent number
8,400,180
Issue date
Mar 19, 2013
Celerint, LLC
Howard Roberts
G01 - MEASURING TESTING
Please log in for detailed analytics
Patents Applications
last 30 patents
Information
Patent Application
DEVICE INTERFACE BOARD COMPLIANCE TESTING USING IMPEDANCE RESPONSE...
Publication number
20220236325
Publication date
Jul 28, 2022
CELERINT, LLC.
Howard H. ROBERTS
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
METHOD FOR IN SITU FUNCTIONALITY TESTING OF SWITCHES AND CONTACTS I...
Publication number
20210356524
Publication date
Nov 18, 2021
CELERINT, LLC.
Howard H. ROBERTS
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR CONTINUOUS TESTER OPERATION DURING LONG SOAK TIME TESTING
Publication number
20210341531
Publication date
Nov 4, 2021
CELERINT, LLC.
Howard H. Roberts
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR SEMICONDUCTOR DEVICE INTERFACE CIRCUITRY FUNCTIONALITY A...
Publication number
20210181252
Publication date
Jun 17, 2021
CELERINT, LLC.
Howard H. ROBERTS
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR CONTINUOUS TESTER OPERATION DURING MULTIPLE STAGE TEMPER...
Publication number
20180313888
Publication date
Nov 1, 2018
CELERINT, LLC.
Howard H. ROBERTS
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MODULAR MULTIPLEXING INTERFACE ASSEMBLY FOR REDUCING SEMICONDUCTOR...
Publication number
20170168111
Publication date
Jun 15, 2017
CELERINT, LLC.
Howard H. Roberts
G01 - MEASURING TESTING
Information
Patent Application
PARALLEL CONCURRENT TEST SYSTEM AND METHOD
Publication number
20170131346
Publication date
May 11, 2017
CELERINT, LLC.
Howard H. Roberts
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR TESTING SEMICONDUCTOR WAFERS USING TEMPORARY SACRIFICIAL...
Publication number
20160336243
Publication date
Nov 17, 2016
CELERINT, LLC.
Howard ROBERTS
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE HANDLER THROUGHPUT OPTIMIZATION
Publication number
20160293461
Publication date
Oct 6, 2016
CELERINT, LLC.
Howard ROBERTS
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
PARALLEL CONCURRENT TEST SYSTEM AND METHOD
Publication number
20140218063
Publication date
Aug 7, 2014
CELERINT, LLC.
Howard H. Roberts
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR UTILIZING STAND-ALONE CONTROLLER IN MULTIPLEX...
Publication number
20140046613
Publication date
Feb 13, 2014
CELERINT, LLC.
Howard H. Roberts
G01 - MEASURING TESTING