Chapman Instruments, Inc.

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Rochester, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for measuring wafer thickness
- Patent number 7,283,256
- Issue date Oct 16, 2007
- Chapman Instruments, Inc.
- Thomas C. Bristow
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring wafer thickness
- Patent number 7,280,232
- Issue date Oct 9, 2007
- Chapman Instruments, Inc.
- Thomas Bristow
- G01 - MEASURING TESTING
Information Patent Grant
System for locating and measuring an index mark on an edge of a wafer
- Patent number 6,342,705
- Issue date Jan 29, 2002
- Chapman Instruments
- Kenneth J. Li
- G01 - MEASURING TESTING
Information Patent Grant
Automated optical surface profile measurement system
- Patent number 6,157,450
- Issue date Dec 5, 2000
- Chapman Instruments
- Silvio P. Marchese-Ragona
- G01 - MEASURING TESTING
Information Patent Grant
Wafer holding and orienting fixture for optical profilometry
- Patent number 5,986,753
- Issue date Nov 16, 1999
- Chapman Instruments Inc.
- Matthew E. Seelig
- G01 - MEASURING TESTING
Information Patent Grant
Viewing system for surface profiler
- Patent number 5,017,012
- Issue date May 21, 1991
- Chapman Instruments, Inc.
- Edward J. Merritt
- G01 - MEASURING TESTING

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Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for measuring wafer thickness
- Publication number 20060181715
- Publication date Aug 17, 2006
- Chapman Instruments
- Thomas C. Bristow
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for measuring wafer thickness
- Publication number 20060061775
- Publication date Mar 23, 2006
- Chapman Instruments
- Thomas Bristow
- G01 - MEASURING TESTING

NSF Awardslast 12 months

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Count: 1

NSF Awards

Information NSF Award
Surface Defect Measurements of Computer Hard Disks
- Award Id 8944182
- Effective date Feb 15, 1990