Checkpoint Technologies LLC

Organization

San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Adjustable split-beam optical probing (ASOP)
- Patent number 9,417,281
- Issue date Aug 16, 2016
- CHECKPOINT TECHNOLOGIES LLC
- Horst E. Groneberg
- G01 - MEASURING TESTING
Information Patent Grant
Multi-magnification high sensitivity optical system for probing ele...
- Patent number 9,217,855
- Issue date Dec 22, 2015
- CheckPoint Technologies, LLC
- Thomas E Clawges
- G02 - OPTICS
Information Patent Grant
Optical probe system having accurate positional and orientational a...
- Patent number 9,182,580
- Issue date Nov 10, 2015
- CheckPoint Technologies, LLC
- Thomas E Clawges
- G02 - OPTICS
Information Patent Grant
Multi-resolution optical probing system having reliable temperature...
- Patent number 9,030,658
- Issue date May 12, 2015
- CheckPoint Technologies, LLC
- David J Morgan
- G01 - MEASURING TESTING
Information Patent Grant
Probing circuit features in sub-32 NM semiconductor integrated circuit
- Patent number 9,025,147
- Issue date May 5, 2015
- CheckPoint Technologies, LLC
- Yaoming Shen
- G01 - MEASURING TESTING
Information Patent Grant
Optical probing system having reliable temperature control
- Patent number 8,873,032
- Issue date Oct 28, 2014
- CheckPoint Technologies, LLC
- David J Morgan
- G01 - MEASURING TESTING
Information Patent Grant
Probing circuit features in sub-32 nm semiconductor integrated circuit
- Patent number 8,749,784
- Issue date Jun 10, 2014
- CheckPoint Technologies, LLC
- Yaoming Shen
- G01 - MEASURING TESTING
Information Patent Grant
System and method for optically determining the temperature of a te...
- Patent number 6,168,311
- Issue date Jan 2, 2001
- Checkpoint Technologies LLC
- Guoqing Xiao
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
REMOTELY ALIGNED WAFER PROBE STATION FOR SEMICONDUCTOR OPTICAL ANAL...
- Publication number 20150219709
- Publication date Aug 6, 2015
- Checkpoint Technologies LLC
- Joshua Munoz
- G01 - MEASURING TESTING
Information Patent Application
MICROSCOPE WITH DETECTOR STOP MATCHING
- Publication number 20150153232
- Publication date Jun 4, 2015
- Checkpoint Technologies LLC
- Guoqing Xiao
- G02 - OPTICS
Information Patent Application
AUTO-FLAT FIELD FOR IMAGE ACQUISITION
- Publication number 20150103181
- Publication date Apr 16, 2015
- Checkpoint Technologies LLC
- Jianxun Mou
- G06 - COMPUTING CALCULATING COUNTING

Checkpoint Technologies LLC

Organization

Patents Grantslast 30 patents

Adjustable split-beam optical probing (ASOP)

Multi-magnification high sensitivity optical system for probing ele...

Optical probe system having accurate positional and orientational a...

Multi-resolution optical probing system having reliable temperature...

Probing circuit features in sub-32 NM semiconductor integrated circuit

Optical probing system having reliable temperature control

Probing circuit features in sub-32 nm semiconductor integrated circuit

System and method for optically determining the temperature of a te...

Patents Applicationslast 30 patents

REMOTELY ALIGNED WAFER PROBE STATION FOR SEMICONDUCTOR OPTICAL ANAL...

MICROSCOPE WITH DETECTOR STOP MATCHING

AUTO-FLAT FIELD FOR IMAGE ACQUISITION

Trademarklast 30 trademarks