CHENG MEI INSTRUMENT TECHNOLOGY CO., LTD.

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HSINCHU COUNTY, TW

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Panel inspection apparatus and method
- Patent number 9,810,640
- Issue date Nov 7, 2017
- CHENG MEI INSTRUMENT TECHNOLOGY CO., LTD.
- Chao-Yi Yeh
- G01 - MEASURING TESTING
Information Patent Grant
Detection method and device for touch panel
- Patent number 9,785,285
- Issue date Oct 10, 2017
- CHENG MEI INSTRUMENT TECHNOLOGY CO., LTD.
- Chao-Yi Yeh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for separating defective dies from wafer
- Patent number 8,311,666
- Issue date Nov 13, 2012
- Cheng Mei Instrument Technology Co., Ltd.
- Te Chun Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for inspecting chips in a tray
- Patent number 8,275,188
- Issue date Sep 25, 2012
- Cheng Mei Instrument Technology Co., Ltd.
- Cheng Tao Tsai
- G01 - MEASURING TESTING
Information Patent Grant
System and method for inspecting chips in a tray and tray handling...
- Patent number 8,226,346
- Issue date Jul 24, 2012
- Cheng Mei Instrument Technology Co., Ltd.
- Cheng Tao Tsai
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
System and method for inspection of chips on tray
- Patent number 7,878,336
- Issue date Feb 1, 2011
- Cheng Mei Instrument Technology Co., Ltd.
- Cheng Tao Tsai
- G01 - MEASURING TESTING

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Patents Applicationslast 30 patents

Information Patent Application
WAFER IMAGE CAPTURING APPARATUS AND METHOD OF WAFER IMAGE CAPTURING
- Publication number 20210313207
- Publication date Oct 7, 2021
- CHENG MEI INSTRUMENT TECHNOLOGY CO., LTD.
- Cheng-Tao TSAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE CALIBRATION METHOD FOR IMAGING SYSTEM
- Publication number 20210287397
- Publication date Sep 16, 2021
- CHENG MEI INSTRUMENT TECHNOLOGY CO., LTD.
- Chin-Yu LIU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF SPECTRAL ANALYZING WITH A COLOR CAMERA
- Publication number 20200105020
- Publication date Apr 2, 2020
- CHENG MEI INSTRUMENT TECHNOLOGY CO., LTD.
- Chi-Yuan LIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETECTION METHOD AND DEVICE FOR TOUCH PANEL
- Publication number 20160225139
- Publication date Aug 4, 2016
- CHENG MEI INSTRUMENT TECHNOLOGY CO., LTD.
- Chao-Yi YEH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PANEL INSPECTION APPARATUS AND METHOD
- Publication number 20160216214
- Publication date Jul 28, 2016
- CHENG MEI INSTRUMENT TECHNOLOGY CO., LTD.
- Chao-Yi YEH
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASURING APPARATUS AND METHOD FOR MEASURING PATTERNED SAPP...
- Publication number 20160047755
- Publication date Feb 18, 2016
- CHENG MEI INSTRUMENT TECHNOLOGY CO., LTD.
- CHENG TAO TSAI
- G02 - OPTICS
Information Patent Application
LIGHT DEFLECTION DETECTION MODULE AND MEASUREMENT AND CALIBRATION M...
- Publication number 20160047754
- Publication date Feb 18, 2016
- CHENG MEI INSTRUMENT TECHNOLOGY CO., LTD.
- CHENG TAO TSAI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING PATTERNED SAPPHIRE SUBSTRATE
- Publication number 20160047756
- Publication date Feb 18, 2016
- CHENG MEI INSTRUMENT TECHNOLOGY CO., LTD.
- CHENG TAO TSAI
- G02 - OPTICS
Information Patent Application
SYSTEM AND METHOD FOR SEPARATING DEFECTIVE DIES FROM WAFER
- Publication number 20100166535
- Publication date Jul 1, 2010
- CHENG MEI INSTRUMENT TECHNOLOGY CO., LTD.
- TE CHUN CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR INSPECTION OF CHIPS ON TRAY
- Publication number 20100063619
- Publication date Mar 11, 2010
- CHENG MEI INSTRUMENT TECHNOLOGY CO., LTD.
- CHENG TAO TSAI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR INSPECTING CHIPS IN A TRAY AND TRAY HANDLING...
- Publication number 20090214326
- Publication date Aug 27, 2009
- CHENG MEI INSTRUMENT TECHNOLOGY CO., LTD.
- CHENG TAO TSAI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR INSPECTING CHIPS IN A TRAY
- Publication number 20090169094
- Publication date Jul 2, 2009
- CHENG MEI INSTRUMENT TECHNOLOGY CO., LTD.
- CHENG TAO TSAI
- G06 - COMPUTING CALCULATING COUNTING

CHENG MEI INSTRUMENT TECHNOLOGY CO., LTD.

Organization

Patents Grantslast 30 patents

Panel inspection apparatus and method

Detection method and device for touch panel

System and method for separating defective dies from wafer

System and method for inspecting chips in a tray

System and method for inspecting chips in a tray and tray handling...

System and method for inspection of chips on tray

Patents Applicationslast 30 patents

WAFER IMAGE CAPTURING APPARATUS AND METHOD OF WAFER IMAGE CAPTURING

IMAGE CALIBRATION METHOD FOR IMAGING SYSTEM

METHOD OF SPECTRAL ANALYZING WITH A COLOR CAMERA

DETECTION METHOD AND DEVICE FOR TOUCH PANEL

PANEL INSPECTION APPARATUS AND METHOD

OPTICAL MEASURING APPARATUS AND METHOD FOR MEASURING PATTERNED SAPP...

LIGHT DEFLECTION DETECTION MODULE AND MEASUREMENT AND CALIBRATION M...

METHOD FOR MEASURING PATTERNED SAPPHIRE SUBSTRATE

SYSTEM AND METHOD FOR SEPARATING DEFECTIVE DIES FROM WAFER

SYSTEM AND METHOD FOR INSPECTION OF CHIPS ON TRAY

SYSTEM AND METHOD FOR INSPECTING CHIPS IN A TRAY AND TRAY HANDLING...

SYSTEM AND METHOD FOR INSPECTING CHIPS IN A TRAY