Cho; Sung Wook

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Incheon, KR

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Patents Grantslast 30 patents

Information Patent Grant
Non contact measuring method for three dimensional micro pattern in...
- Patent number 6,005,669
- Issue date Dec 21, 1999
- Pahk; Heui Jae
- Heui Jae Pahk
- G01 - MEASURING TESTING