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Patents Grants
last 30 patents
Information
Patent Grant
Method for measuring thickness by pulsed infrared thermal wave tech...
Patent number
9,464,891
Issue date
Oct 11, 2016
Capital Normal University
Zhi Zeng
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
METHOD, SYSTEM, AND STORAGE MEDIUM FOR INTELLIGENT ANALYSIS OF STUD...
Publication number
20230101354
Publication date
Mar 30, 2023
CHONGQING NORMAL UNIVERSITY
Xiaohong LAN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD FOR MEASURING THICKNESS BY PULSED INFRARED THERMAL WAVE TECH...
Publication number
20140153608
Publication date
Jun 5, 2014
CAPITAL NORMAL UNIVERSITY
Zhi Zeng
G01 - MEASURING TESTING
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