Chung Instrument Electronics Industrial Co., Ltd.

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Taipei, TW

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Patents Grantslast 30 patents

Information Patent Grant
Retractable test probe
- Patent number 8,907,659
- Issue date Dec 9, 2014
- Chung Instrument Electronics Industrial Co., Ltd.
- Shaw-Lin Liu
- G01 - MEASURING TESTING
Information Patent Grant
Hook portion of clamp meter
- Patent number 8,882,095
- Issue date Nov 11, 2014
- Chung Instrument Electronics Industrial Co., Ltd.
- Shao-Lin Liu
- G01 - MEASURING TESTING
Information Patent Grant
Multimeter having clamping means for test probe
- Patent number 8,570,026
- Issue date Oct 29, 2013
- Chung Instrument Electronics Industrial Co., Ltd.
- Shao-Lin Liu
- G01 - MEASURING TESTING
Information Patent Grant
Clamp meter for measuring consumption of current and power of elect...
- Patent number 7,750,621
- Issue date Jul 6, 2010
- Chung Instrument Electronics Industrial Co., Ltd.
- Shaw-Lin Liu
- G01 - MEASURING TESTING
Information Patent Grant
Revolvable clamp meter
- Patent number 7,733,080
- Issue date Jun 8, 2010
- Chung Instrument Electronics Industrial Co., Ltd.
- Shaw-Lin Liu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ROTATING MOBILE PROBE AND PROBING ROD USING THE SAME
- Publication number 20130328549
- Publication date Dec 12, 2013
- CHUNG INSTRUMENT ELECTRONICS INDUSTRIAL CO., LTD.
- Shaw-Lin LIU
- G01 - MEASURING TESTING
Information Patent Application
RETRACTABLE TEST PROBE
- Publication number 20130307527
- Publication date Nov 21, 2013
- CHUNG INSTRUMENT ELECTRONICS INDUSTRIAL
- Shaw-Lin LIU
- G01 - MEASURING TESTING
Information Patent Application
MULTIMETER HAVING CLAMPING MEANS FOR TEST PROBE
- Publication number 20130033253
- Publication date Feb 7, 2013
- CHUNG INSTRUMENT ELECTRONICS INDUSTRIAL CO., LTD.
- Shao-Lin Liu
- G01 - MEASURING TESTING
Information Patent Application
HOOK PORTION OF CLAMP METER
- Publication number 20130032983
- Publication date Feb 7, 2013
- CHUNG INSTRUMENT ELECTRONICS INDUSTRIAL CO., LTD.
- Shao-Lin Liu
- G01 - MEASURING TESTING

Trademarklast 30 trademarks