CHUNGHWA PRECISION TEST TECH. CO., LTD.

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TAOYUAN COUNTY, TW

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Modular vertical probe card
- Patent number 12,111,336
- Issue date Oct 8, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wei-Jhih Su
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever probe card device and elastic probe thereof
- Patent number 12,092,661
- Issue date Sep 17, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wei-Jhih Su
- G01 - MEASURING TESTING
Information Patent Grant
Vertical probe card and fence-like probe thereof
- Patent number 11,988,686
- Issue date May 21, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wei-Jhih Su
- G01 - MEASURING TESTING
Information Patent Grant
Probe card device and transmission structure
- Patent number 11,933,817
- Issue date Mar 19, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen-Tsung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever probe card device and focusing probe thereof
- Patent number 11,913,973
- Issue date Feb 27, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wei-Jhih Su
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever probe card and carrier thereof
- Patent number 11,879,912
- Issue date Jan 23, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wei-Jhih Su
- G01 - MEASURING TESTING
Information Patent Grant
Board-like connector, single-arm bridge of board-like connector, an...
- Patent number 11,747,395
- Issue date Sep 5, 2023
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Kai-Chieh Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Board-like connector, dual-arm bridge of board-like connector, and...
- Patent number 11,699,871
- Issue date Jul 11, 2023
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Kai-Chieh Hsieh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe card device and self-aligned probe
- Patent number 11,592,466
- Issue date Feb 28, 2023
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Kai-Chieh Hsieh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Board-like connector, dual-ring bridge of board-like connector, and...
- Patent number 11,561,244
- Issue date Jan 24, 2023
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Kai-Chieh Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Probe card device and dual-arm probe
- Patent number 11,536,744
- Issue date Dec 27, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Kai-Chieh Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Probe card device and disposable adjustment film thereof
- Patent number 11,506,685
- Issue date Nov 22, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Kai-Chieh Hsieh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe card device and spring-like probe
- Patent number 11,460,486
- Issue date Oct 4, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Kai-Chieh Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Split thin-film probe card
- Patent number 11,287,446
- Issue date Mar 29, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen-Tsung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Probe card device and fence-like probe thereof
- Patent number 11,226,354
- Issue date Jan 18, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen-Tsung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Probe card device and neck-like probe thereof
- Patent number 11,209,461
- Issue date Dec 28, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen-Tsung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Probe card device
- Patent number 11,204,371
- Issue date Dec 21, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen-Tsung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Staggered probe card
- Patent number 11,175,312
- Issue date Nov 16, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Kai-Chieh Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Thin-film probe card and test module thereof
- Patent number 11,175,313
- Issue date Nov 16, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen-Tsung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit with antenna in package testing apparatus
- Patent number 11,119,139
- Issue date Sep 14, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Shin-tsung Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe card device
- Patent number 11,073,537
- Issue date Jul 27, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen-Tsung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Probe card device and rectangular probe thereof
- Patent number 11,041,883
- Issue date Jun 22, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Chih-Peng Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
High speed probe card device and rectangular probe
- Patent number 11,009,524
- Issue date May 18, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen-Tsung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Probe card device and three-dimensional signal transfer structure t...
- Patent number 11,009,526
- Issue date May 18, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen-Tsung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Probe card device and probe head
- Patent number 10,901,001
- Issue date Jan 26, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Chih-Peng Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Probe card device and probe head thereof
- Patent number 10,845,388
- Issue date Nov 24, 2020
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen-Tsung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Probe card device and matching probe thereof
- Patent number 10,845,387
- Issue date Nov 24, 2020
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen-Tsung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Probe card device
- Patent number 10,845,385
- Issue date Nov 24, 2020
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen-Tsung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Probe card testing device and testing device
- Patent number 10,775,412
- Issue date Sep 15, 2020
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen-Tsung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Multilayer circuit board and manufacturing method thereof
- Patent number 10,779,407
- Issue date Sep 15, 2020
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Yi-Chun Chen
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

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Patents Applicationslast 30 patents

Information Patent Application
CANTILEVER PROBE CARD AND CARRIER THEREOF
- Publication number 20230349948
- Publication date Nov 2, 2023
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEI-JHIH SU
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE CARD DEVICE AND ELASTIC PROBE THEREOF
- Publication number 20230349952
- Publication date Nov 2, 2023
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEI-JHIH SU
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE CARD DEVICE AND FOCUSING PROBE THEREOF
- Publication number 20230349951
- Publication date Nov 2, 2023
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEI-JHIH SU
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE CARD AND PROBE MODULE THEREOF
- Publication number 20230349953
- Publication date Nov 2, 2023
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEI-JHIH SU
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL PROBE CARD DEVICE AND FENCE-LIKE PROBE THEREOF
- Publication number 20230314480
- Publication date Oct 5, 2023
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEI-JHIH SU
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL PROBE CARD HAVING DIFFERENT PROBES
- Publication number 20230314477
- Publication date Oct 5, 2023
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEI-JHIH SU
- G01 - MEASURING TESTING
Information Patent Application
MODULAR VERTICAL PROBE CARD
- Publication number 20230314481
- Publication date Oct 5, 2023
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEI-JHIH SU
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL PROBE CARD AND FENCE-LIKE PROBE THEREOF
- Publication number 20230314478
- Publication date Oct 5, 2023
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEI-JHIH SU
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE AND TRANSMISSION STRUCTURE
- Publication number 20230033013
- Publication date Feb 2, 2023
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEN-TSUNG LEE
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE AND DISPOSABLE ADJUSTMENT FILM THEREOF
- Publication number 20220365110
- Publication date Nov 17, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- KAI-CHIEH HSIEH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBE CARD DEVICE AND SPRING-LIKE PROBE
- Publication number 20220334145
- Publication date Oct 20, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- KAI-CHIEH HSIEH
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE AND DUAL-ARM PROBE
- Publication number 20220170960
- Publication date Jun 2, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- KAI-CHIEH HSIEH
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE AND SELF-ALIGNED PROBE
- Publication number 20220163565
- Publication date May 26, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- KAI-CHIEH HSIEH
- G01 - MEASURING TESTING
Information Patent Application
BOARD-LIKE CONNECTOR, SINGLE-ARM BRIDGE OF BOARD-LIKE CONNECTOR, AN...
- Publication number 20220137124
- Publication date May 5, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- KAI-CHIEH HSIEH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BOARD-LIKE CONNECTOR, DUAL-RING BRIDGE OF BOARD-LIKE CONNECTOR, AND...
- Publication number 20220137095
- Publication date May 5, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- KAI-CHIEH HSIEH
- G01 - MEASURING TESTING
Information Patent Application
BOARD-LIKE CONNECTOR, DUAL-ARM BRIDGE OF BOARD-LIKE CONNECTOR, AND...
- Publication number 20220140515
- Publication date May 5, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- KAI-CHIEH HSIEH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBE CARD DEVICE AND FENCE-LIKE PROBE THEREOF
- Publication number 20220018876
- Publication date Jan 20, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEN-TSUNG LEE
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE AND FAN-OUT PROBE THEREOF
- Publication number 20220011346
- Publication date Jan 13, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEN-TSUNG LEE
- G01 - MEASURING TESTING
Information Patent Application
THIN-FILM PROBE CARD AND TEST MODULE THEREOF
- Publication number 20210349129
- Publication date Nov 11, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEN-TSUNG LEE
- G01 - MEASURING TESTING
Information Patent Application
SPLIT THIN-FILM PROBE CARD AND ELASTIC MODULE THEREOF
- Publication number 20210325430
- Publication date Oct 21, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEN-TSUNG LEE
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE AND DIRECTIVITY PROBE THEREOF
- Publication number 20210223291
- Publication date Jul 22, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEN-TSUNG LEE
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE AND NECK-LIKE PROBE THEREOF
- Publication number 20210223289
- Publication date Jul 22, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEN-TSUNG LEE
- G01 - MEASURING TESTING
Information Patent Application
STAGGERED PROBE CARD AND CONDUCTIVE PROBE
- Publication number 20210109129
- Publication date Apr 15, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- KAI-CHIEH HSIEH
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT WITH ANTENNA IN PACKAGE TESTING APPARATUS
- Publication number 20210011069
- Publication date Jan 14, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Shin-tsung CHEN
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE AND CONDUCTIVE PROBE THEREOF
- Publication number 20200300893
- Publication date Sep 24, 2020
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEN-TSUNG LEE
- G01 - MEASURING TESTING
Information Patent Application
MULTILAYER CIRCUIT BOARD AND MANUFACTURING METHOD THEREOF
- Publication number 20200296831
- Publication date Sep 17, 2020
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Yi-Chun CHEN
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
HIGH SPEED PROBE CARD DEVICE AND RECTANGULAR PROBE
- Publication number 20200233014
- Publication date Jul 23, 2020
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen-Tsung LEE
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE AND PROBE HEAD THEREOF
- Publication number 20200166543
- Publication date May 28, 2020
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEN-TSUNG LEE
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE AND MATCHING PROBE THEREOF
- Publication number 20200158756
- Publication date May 21, 2020
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEN-TSUNG LEE
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD TESTING DEVICE AND TESTING DEVICE
- Publication number 20200088764
- Publication date Mar 19, 2020
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen-Tsung LEE
- G01 - MEASURING TESTING

CHUNGHWA PRECISION TEST TECH. CO., LTD.

Organization

Patents Grantslast 30 patents

Modular vertical probe card

Cantilever probe card device and elastic probe thereof

Vertical probe card and fence-like probe thereof

Probe card device and transmission structure

Cantilever probe card device and focusing probe thereof

Cantilever probe card and carrier thereof

Board-like connector, single-arm bridge of board-like connector, an...

Board-like connector, dual-arm bridge of board-like connector, and...

Probe card device and self-aligned probe

Board-like connector, dual-ring bridge of board-like connector, and...

Probe card device and dual-arm probe

Probe card device and disposable adjustment film thereof

Probe card device and spring-like probe

Split thin-film probe card

Probe card device and fence-like probe thereof

Probe card device and neck-like probe thereof

Probe card device

Staggered probe card

Thin-film probe card and test module thereof

Integrated circuit with antenna in package testing apparatus

Probe card device

Probe card device and rectangular probe thereof

High speed probe card device and rectangular probe

Probe card device and three-dimensional signal transfer structure t...

Probe card device and probe head

Probe card device and probe head thereof

Probe card device and matching probe thereof

Probe card device

Probe card testing device and testing device

Multilayer circuit board and manufacturing method thereof

Patents Applicationslast 30 patents

CANTILEVER PROBE CARD AND CARRIER THEREOF

CANTILEVER PROBE CARD DEVICE AND ELASTIC PROBE THEREOF

CANTILEVER PROBE CARD DEVICE AND FOCUSING PROBE THEREOF

CANTILEVER PROBE CARD AND PROBE MODULE THEREOF

VERTICAL PROBE CARD DEVICE AND FENCE-LIKE PROBE THEREOF

VERTICAL PROBE CARD HAVING DIFFERENT PROBES

MODULAR VERTICAL PROBE CARD

VERTICAL PROBE CARD AND FENCE-LIKE PROBE THEREOF

PROBE CARD DEVICE AND TRANSMISSION STRUCTURE

PROBE CARD DEVICE AND DISPOSABLE ADJUSTMENT FILM THEREOF

PROBE CARD DEVICE AND SPRING-LIKE PROBE

PROBE CARD DEVICE AND DUAL-ARM PROBE

PROBE CARD DEVICE AND SELF-ALIGNED PROBE

BOARD-LIKE CONNECTOR, SINGLE-ARM BRIDGE OF BOARD-LIKE CONNECTOR, AN...

BOARD-LIKE CONNECTOR, DUAL-RING BRIDGE OF BOARD-LIKE CONNECTOR, AND...

BOARD-LIKE CONNECTOR, DUAL-ARM BRIDGE OF BOARD-LIKE CONNECTOR, AND...

PROBE CARD DEVICE AND FENCE-LIKE PROBE THEREOF

PROBE CARD DEVICE AND FAN-OUT PROBE THEREOF

THIN-FILM PROBE CARD AND TEST MODULE THEREOF

SPLIT THIN-FILM PROBE CARD AND ELASTIC MODULE THEREOF

PROBE CARD DEVICE AND DIRECTIVITY PROBE THEREOF

PROBE CARD DEVICE AND NECK-LIKE PROBE THEREOF

STAGGERED PROBE CARD AND CONDUCTIVE PROBE

INTEGRATED CIRCUIT WITH ANTENNA IN PACKAGE TESTING APPARATUS

PROBE CARD DEVICE AND CONDUCTIVE PROBE THEREOF

MULTILAYER CIRCUIT BOARD AND MANUFACTURING METHOD THEREOF

HIGH SPEED PROBE CARD DEVICE AND RECTANGULAR PROBE

PROBE CARD DEVICE AND PROBE HEAD THEREOF

PROBE CARD DEVICE AND MATCHING PROBE THEREOF

PROBE CARD TESTING DEVICE AND TESTING DEVICE