CHUO ELECTRONIC MEASUREMENT CO., LTD.

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Hiroshima-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Coating defect detecting and marking system
- Patent number 6,398,870
- Issue date Jun 4, 2002
- Chuo Electronic Measurement Co., Ltd.
- Toshiyuki Kaya
- G01 - MEASURING TESTING
Information Patent Grant
Illuminance measurement of vehicle lamp
- Patent number 5,426,500
- Issue date Jun 20, 1995
- Chuo Electronic Measurement Co., Ltd.
- Kanji Ohana
- G01 - MEASURING TESTING
Information Patent Grant
Method of, and apparatus for, detecting optical axis of headlamp
- Patent number 5,379,104
- Issue date Jan 3, 1995
- Chuo Electronic Measurement Co., Ltd.
- Osamu Takao
- G01 - MEASURING TESTING
Information Patent Grant
Wheel alignment measuring apparatus
- Patent number 5,268,731
- Issue date Dec 7, 1993
- Chuo Electronic Measurement Co., Ltd.
- Motoaki Fuchiwaki
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for measuring optical-axis deflection angle of headlight
- Patent number 5,210,589
- Issue date May 11, 1993
- Chuo Electronic Measurement Co., Ltd.
- Toshiyuki Kaya
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Illuminating method in paint defect detecting machine
- Publication number 20070229810
- Publication date Oct 4, 2007
- CHUO ELECTRONIC MEASUREMENT CO., LTD.
- Toshiyuki Kaya
- B62 - LAND VEHICLES FOR TRAVELLING OTHERWISE THAN ON RAILS

Trademarklast 30 trademarks