Membership
Tour
Register
Log in
CYRA TECHNOLOGIES, INC
Follow
Organization
OAKLAND, CA, US
Organizations
Overview
Industries
People
People
Information
Transactions
Events
Impact
Please log in for detailed analytics
Patents Grants
last 30 patents
Information
Patent Grant
Integrated system for quickly and accurately imaging and modeling t...
Patent number
6,734,849
Issue date
May 11, 2004
Cyra Technologies, Inc.
Jerry Dimsdale
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for forming 2D views of a structure from 3D po...
Patent number
6,633,290
Issue date
Oct 14, 2003
Cyra Technologies, Inc.
Jonathan Apollo Kung
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Advanced applications for 3-D autoscanning LIDAR system
Patent number
6,619,406
Issue date
Sep 16, 2003
Cyra Technologies, Inc.
Ben K. Kacyra
G01 - MEASURING TESTING
Information
Patent Grant
System and method for concurrently modeling any element of a model
Patent number
6,604,068
Issue date
Aug 5, 2003
Cyra Technologies, Inc.
Richard William Bukowski
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Integrated system for quickly and accurately imaging and modeling t...
Patent number
6,512,518
Issue date
Jan 28, 2003
Cyra Technologies, Inc.
Jerry Dimsdale
G01 - MEASURING TESTING
Information
Patent Grant
Integrated system for quickly and accurately imaging and modeling t...
Patent number
6,512,993
Issue date
Jan 28, 2003
Cyra Technologies, Inc.
Ben K. Kacyra
G01 - MEASURING TESTING
Information
Patent Grant
Integrated system for quickly and accurately imaging and modeling t...
Patent number
6,473,079
Issue date
Oct 29, 2002
Cyra Technologies, Inc.
Ben K. Kacyra
G01 - MEASURING TESTING
Information
Patent Grant
Integrated system for quickly and accurately imaging and modeling t...
Patent number
6,420,698
Issue date
Jul 16, 2002
Cyra Technologies, Inc.
Jerry Dimsdale
G01 - MEASURING TESTING
Information
Patent Grant
Integrated system for quickly and accurately imaging and modeling t...
Patent number
6,330,523
Issue date
Dec 11, 2001
Cyra Technologies, Inc.
Ben K. Kacyra
G01 - MEASURING TESTING
Information
Patent Grant
Integrated system for quickly and accurately imaging and modeling t...
Patent number
5,988,862
Issue date
Nov 23, 1999
Cyra Technologies, Inc.
Ben Kacyra
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Trademark
last 30 trademarks
Information
Trademark
75774752 - CYWORKX
Serial number
75774752
Filing date
Aug 13, 1999
Cyra Technologies, Inc.
9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information
Trademark
75775703 - CYOP
Serial number
75775703
Filing date
Aug 13, 1999
Cyra Technologies, Inc.
9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information
Trademark
75229287 - CYRAX
Serial number
75229287
Registration number
2248539
Filing date
Jan 22, 1997
CYRA TECHNOLOGIES, INC.
9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments