Danmarks Tekniske Universitet of Anker Engelundsvej

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Lyngby, DK

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Patents Grantslast 30 patents

Information Patent Grant
X-ray diffraction method of mapping grain structures in a crystalli...
- Patent number 9,222,900
- Issue date Dec 29, 2015
- Danmarks Tekniske Universitet of Anker Engelundsvej
- Erik Mejdal Lauridsen
- G01 - MEASURING TESTING
Information Patent Grant
X-ray diffraction method of mapping grain structures in a crystalli...
- Patent number 9,222,901
- Issue date Dec 29, 2015
- Danmarks Tekniske Universitet Anker Engelundsvej
- Erik Mejdal Lauridsen
- G01 - MEASURING TESTING

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