Dawatek, LLC

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Oak Park, IL, US

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Patents Grantslast 30 patents

Information Patent Grant
Offset Raman imaging system and methods of use
- Patent number 11,977,029
- Issue date May 7, 2024
- Dawatek, LLC
- Isaac W. Chadri
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
RAMAN TESTING SYSTEM AND METHODS OF DETECTING PATHOGENS
- Publication number 20230236208
- Publication date Jul 27, 2023
- Dawatek, Inc.
- Isaac Wadria Chadri
- G01 - MEASURING TESTING
Information Patent Application
OFFSET RAMAN IMAGING SYSTEM AND METHODS OF USE
- Publication number 20220003680
- Publication date Jan 6, 2022
- Dawatek, LLC
- Isaac W. Chadri
- G01 - MEASURING TESTING

Trademarklast 30 trademarks