DCG Systems GmbH

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Erlangen, DE

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Synchronized pulsed LADA for the simultaneous acquisition of timing...
- Patent number 11,047,906
- Issue date Jun 29, 2021
- DCG Systems, Inc.
- Kent Erington
- G01 - MEASURING TESTING
Information Patent Grant
Method for examination of a sample by means of the lock-in thermogr...
- Patent number 10,761,039
- Issue date Sep 1, 2020
- DCG Systems GmbH
- Hans Heissenstein
- G01 - MEASURING TESTING
Information Patent Grant
Synchronized pulsed LADA for the simultaneous acquisition of timing...
- Patent number 10,191,111
- Issue date Jan 29, 2019
- DCG Systems, Inc.
- Kent Erington
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for combined micro-scale and nano-scale C-V, Q...
- Patent number 9,551,743
- Issue date Jan 24, 2017
- DCG Systems, Inc.
- Andrew N. Erickson
- G01 - MEASURING TESTING
Information Patent Grant
System and method for non-contact microscopy for three-dimensional...
- Patent number 9,506,947
- Issue date Nov 29, 2016
- DCG Systems, Inc.
- Vladimir A. Ukraintsev
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for polarization diversity imaging and alignment
- Patent number 9,361,533
- Issue date Jun 7, 2016
- DCG Systems, Inc.
- Keith Serrels
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Three-dimensional hot spot localization
- Patent number 9,322,715
- Issue date Apr 26, 2016
- DCG Systems, Inc.
- Frank Altmann
- G01 - MEASURING TESTING
Information Patent Grant
Systems and method for laser voltage imaging state mapping
- Patent number 9,244,121
- Issue date Jan 26, 2016
- DCG Systems, Inc.
- Yin Shyang Ng
- G01 - MEASURING TESTING
Information Patent Grant
System and method for modulation mapping
- Patent number 9,239,357
- Issue date Jan 19, 2016
- DCG Systems, Inc.
- Steven Kasapi
- G01 - MEASURING TESTING
Information Patent Grant
Laser-assisted device alteration using synchronized laser pulses
- Patent number 9,201,096
- Issue date Dec 1, 2015
- DCG Systems, Inc.
- Praveen Vedagarbha
- G01 - MEASURING TESTING
Information Patent Grant
Lock in thermal laser stimulation through one side of the device wh...
- Patent number 9,098,892
- Issue date Aug 4, 2015
- DCG Systems, Inc.
- Herve Deslandes
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
P and N region differentiation for image-to-CAD alignment
- Patent number 9,064,083
- Issue date Jun 23, 2015
- DCG Systems, Inc.
- Jan Durec
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Probe-based data collection system with adaptive mode of probing
- Patent number 9,057,740
- Issue date Jun 16, 2015
- DCG Systems, Inc.
- Vladimir A. Ukraintsev
- G01 - MEASURING TESTING
Information Patent Grant
Lock in thermal laser stimulation through one side of the device wh...
- Patent number 9,025,020
- Issue date May 5, 2015
- DCG Systems, Inc.
- Herve Deslandes
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method for evaluating the centerline of an arbitrarily shaped object
- Patent number 8,983,232
- Issue date Mar 17, 2015
- DCG Systems, Inc.
- Roman Louban
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for non-contact microscopy for three-dimensional...
- Patent number 8,895,923
- Issue date Nov 25, 2014
- DCG Systems, Inc.
- Vladimir A. Ukraintsev
- G01 - MEASURING TESTING
Information Patent Grant
Laser assisted device alteration using two-photon absorption
- Patent number 8,860,447
- Issue date Oct 14, 2014
- DCG Systems, Inc.
- Praveen Vedagarbha
- G01 - MEASURING TESTING
Information Patent Grant
Spray cooling thermal management system and method for semiconducto...
- Patent number 8,810,266
- Issue date Aug 19, 2014
- DCG Systems, Inc.
- Tahir Cader
- G01 - MEASURING TESTING
Information Patent Grant
Systems and method for laser voltage imaging state mapping
- Patent number 8,754,633
- Issue date Jun 17, 2014
- DCG Systems, Inc.
- Yin Shyang Ng
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional hot spot localization
- Patent number 8,742,347
- Issue date Jun 3, 2014
- DCG Systems, Inc.
- Frank Altmann
- G01 - MEASURING TESTING
Information Patent Grant
System and method for modulation mapping
- Patent number 8,686,748
- Issue date Apr 1, 2014
- DCG Systems, Inc.
- Steven Kasapi
- G01 - MEASURING TESTING
Information Patent Grant
Method to transfer failure analysis-specific data between design ho...
- Patent number 8,645,896
- Issue date Feb 4, 2014
- DCG Systems Inc
- Hitesh Suri
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Variable magnification optics with spray cooling
- Patent number 8,553,322
- Issue date Oct 8, 2013
- DCG Systems, Inc.
- Israel Niv
- G01 - MEASURING TESTING
Information Patent Grant
Optical coupling apparatus for a dual column charged particle beam...
- Patent number 8,173,948
- Issue date May 8, 2012
- DCG Systems, Inc.
- Chun-Cheng Tsao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe tip to device pad alignment in obscured view probing applicat...
- Patent number 8,159,243
- Issue date Apr 17, 2012
- DCG Systems, Inc.
- Richard Alan Portune
- G01 - MEASURING TESTING
Information Patent Grant
Spray cooling thermal management system and method for semiconducto...
- Patent number 8,076,951
- Issue date Dec 13, 2011
- DCG Systems, Inc.
- Tahir Cader
- G01 - MEASURING TESTING
Information Patent Grant
System and method for photoemission-based defect detection
- Patent number 8,072,589
- Issue date Dec 6, 2011
- DCG Systems, Inc.
- Neeraj Khurana
- G01 - MEASURING TESTING
Information Patent Grant
System and method for modulation mapping
- Patent number 7,990,167
- Issue date Aug 2, 2011
- DCG Systems, Inc.
- Steven Kasapi
- G01 - MEASURING TESTING
Information Patent Grant
Undoped silicon heat spreader window
- Patent number 7,956,625
- Issue date Jun 7, 2011
- DCG Systems, Inc.
- Richard A. Portune
- G02 - OPTICS
Information Patent Grant
System and method for focused ion beam data analysis
- Patent number 7,897,918
- Issue date Mar 1, 2011
- DCG Systems
- Michael William Phaneuf
- G01 - MEASURING TESTING

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Patents Applicationslast 30 patents

Information Patent Application
SYNCHRONIZED PULSED LADA FOR THE SIMULTANEOUS ACQUISITION OF TIMING...
- Publication number 20190170818
- Publication date Jun 6, 2019
- DCG SYSTEMS, INC.
- Kent Erington
- G01 - MEASURING TESTING
Information Patent Application
SELF CORRECTING FLOATING SIL TIP
- Publication number 20190155013
- Publication date May 23, 2019
- DCG Systems, Inc.
- Jonathan Frank
- G02 - OPTICS
Information Patent Application
PROBE-BASED DATA COLLECTION SYSTEM WITH ADAPTIVE MODE OF PROBING CO...
- Publication number 20170082685
- Publication date Mar 23, 2017
- DCG SYSTEMS, INC.
- Vladimir A. Ukraintsev
- G01 - MEASURING TESTING
Information Patent Application
DIAMOND DELAYERING FOR ELECTRICAL PROBING
- Publication number 20170003336
- Publication date Jan 5, 2017
- DCG SYSTEMS, INC.
- Stephen Ippolito
- G01 - MEASURING TESTING
Information Patent Application
Particle Beam Heating to Identify Defects
- Publication number 20160370425
- Publication date Dec 22, 2016
- DCG SYSTEMS, INC.
- Richard Stallcup
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR RESOLVING HOT SPOTS IN LIT
- Publication number 20160245860
- Publication date Aug 25, 2016
- DCG SYSTEMS, INC.
- Christian Schmidt
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR IMAGING A FEATURE USING A SCANNING PROBE MICROSCOPE
- Publication number 20160231353
- Publication date Aug 11, 2016
- DCG SYSTEMS, INC.
- Andrew Norman Erickson
- G01 - MEASURING TESTING
Information Patent Application
LASER-ASSISTED DEVICE ALTERATION USING SYNCHRONIZED LASER PULSES
- Publication number 20160202313
- Publication date Jul 14, 2016
- DCG SYSTEMS, INC.
- Praveen Vedagarbha
- G01 - MEASURING TESTING
Information Patent Application
LOCK-IN THERMOGRAPHY METHOD AND SYSTEM FOR HOT SPOT LOCALIZATION
- Publication number 20160202126
- Publication date Jul 14, 2016
- DCG SYSTEMS, INC.
- Christian Schmidt
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHOD FOR LASER VOLTAGE IMAGING STATE MAPPING
- Publication number 20160139200
- Publication date May 19, 2016
- DCG SYSTEMS, INC.
- Yin Shyang Ng
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR MODULATION MAPPING
- Publication number 20160131703
- Publication date May 12, 2016
- DCG SYSTEMS, INC.
- Steven KASAPI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHOD FOR LASER VOLTAGE IMAGING
- Publication number 20160109513
- Publication date Apr 21, 2016
- DCG SYSTEMS, INC.
- James S. Vickers
- G01 - MEASURING TESTING
Information Patent Application
THROUGH PROCESS FLOW INTRA-CHIP AND INTER-CHIP ELECTRICAL ANALYSIS...
- Publication number 20150377921
- Publication date Dec 31, 2015
- DCG SYSTEMS, INC.
- Vladimir Ukraintsev
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR NANOPROBING OF ELECTRONIC DEVICES
- Publication number 20150377958
- Publication date Dec 31, 2015
- DCG SYSTEMS, INC.
- Vladimir Ukraintsev
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR EXAMINATION OF A SAMPLE BY MEANS OF THE LOCK-IN THERMOGR...
- Publication number 20150355118
- Publication date Dec 10, 2015
- DCG Systems GmbH
- Hans Heissenstein
- G01 - MEASURING TESTING
Information Patent Application
LOCK IN THERMAL LASER STIMULATION THROUGH ONE SIDE OF THE DEVICE WH...
- Publication number 20150338458
- Publication date Nov 26, 2015
- DCG SYSTEMS, INC.
- Herve Deslandes
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR NON-CONTACT MICROSCOPY FOR THREE-DIMENSIONAL...
- Publication number 20150301078
- Publication date Oct 22, 2015
- DCG SYSTEMS, INC.
- Vladimir A. Ukraintsev
- G01 - MEASURING TESTING
Information Patent Application
SPECTRAL MAPPING OF PHOTO EMISSION
- Publication number 20150293037
- Publication date Oct 15, 2015
- DCG SYSTEMS, INC.
- Herve Deslandes
- G01 - MEASURING TESTING
Information Patent Application
SELF CORRECTING FLOATING SIL TIP
- Publication number 20150260976
- Publication date Sep 17, 2015
- DCG SYSTEMS, INC.
- Jonathan Frank
- G02 - OPTICS
Information Patent Application
SYSTEM AND METHOD FOR FAULT ISOLATION BY EMISSION SPECTRA ANALYSIS
- Publication number 20150260789
- Publication date Sep 17, 2015
- DCG SYSTEMS, INC.
- Herve Deslandes
- G01 - MEASURING TESTING
Information Patent Application
PROBE-BASED DATA COLLECTION SYSTEM WITH ADAPTIVE MODE OF PROBING
- Publication number 20150168444
- Publication date Jun 18, 2015
- DCG SYSTEMS, INC.
- Vladimir A. Ukraintsev
- G01 - MEASURING TESTING
Information Patent Application
LED LIGHTING DEVICE
- Publication number 20150146424
- Publication date May 28, 2015
- DCG SYSTEMS, INC.
- Dieter Karg
- F21 - LIGHTING
Information Patent Application
OPTIMIZED WAVELENGTH PHOTON EMISSION MICROSCOPE FOR VLSI DEVICES
- Publication number 20150091602
- Publication date Apr 2, 2015
- DCG SYSTEMS, INC.
- Herve Deslandes
- G01 - MEASURING TESTING
Information Patent Application
Three-Dimensional Hot Spot Localization
- Publication number 20140346360
- Publication date Nov 27, 2014
- DCG SYSTEMS, INC.
- Frank Altmann
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR ANNULAR OPTICAL POWER MANAGEMENT
- Publication number 20140307311
- Publication date Oct 16, 2014
- DCG SYSTEMS, INC.
- Keith Serrels
- G02 - OPTICS
Information Patent Application
SYNCHRONIZED PULSED LADA FOR THE SIMULTANEOUS ACQUISITION OF TIMING...
- Publication number 20140285227
- Publication date Sep 25, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Keith Serrels
- G01 - MEASURING TESTING
Information Patent Application
LOCK IN THERMAL LASER STIMULATION THROUGH ONE SIDE OF THE DEVICE WH...
- Publication number 20140210994
- Publication date Jul 31, 2014
- DCG Systems, Inc.
- Herve Deslandes
- G01 - MEASURING TESTING
Information Patent Application
ACCUMULATING OPTICAL DETECTOR WITH SHUTTER EMULATION
- Publication number 20140191111
- Publication date Jul 10, 2014
- DCG SYSTEMS, INC.
- Herve Deslandes
- G01 - MEASURING TESTING
Information Patent Application
P AND N REGION DIFFERENTIATION FOR IMAGE-TO-CAD ALIGNMENT
- Publication number 20140047396
- Publication date Feb 13, 2014
- DCG SYSTEMS, INC.
- Jan Durec
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR POLARIZATION DIVERSITY IMAGING AND ALIGNMENT
- Publication number 20130121617
- Publication date May 16, 2013
- DCG SYSTEMS, INC.
- Keith Serrels
- G02 - OPTICS

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Trademarklast 30 trademarks

Information Trademark
86607586 - EBIRCH
- Serial number 86607586
- Filing date Apr 23, 2015
- DCG Systems, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
85319435 - DCG SYSTEMS
- Serial number 85319435
- Registration number 4076747
- Filing date May 12, 2011
- DCG Systems, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
85319434 - DCG SYSTEMS
- Serial number 85319434
- Registration number 4074109
- Filing date May 12, 2011
- DCG Systems, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
85319423 - DCG SYSTEMS
- Serial number 85319423
- Registration number 4095755
- Filing date May 12, 2011
- DCG Systems, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
85307328 - DCG SYSTEMS
- Serial number 85307328
- Registration number 4073662
- Filing date Apr 28, 2011
- DCG Systems, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
85307671 - DCG SYSTEMS
- Serial number 85307671
- Registration number 4073669
- Filing date Apr 28, 2011
- DCG Systems, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

DCG Systems GmbH

Organization

Patents Grantslast 30 patents

Synchronized pulsed LADA for the simultaneous acquisition of timing...

Method for examination of a sample by means of the lock-in thermogr...

Synchronized pulsed LADA for the simultaneous acquisition of timing...

Apparatus and method for combined micro-scale and nano-scale C-V, Q...

System and method for non-contact microscopy for three-dimensional...

Apparatus and method for polarization diversity imaging and alignment

Three-dimensional hot spot localization

Systems and method for laser voltage imaging state mapping

System and method for modulation mapping

Laser-assisted device alteration using synchronized laser pulses

Lock in thermal laser stimulation through one side of the device wh...

P and N region differentiation for image-to-CAD alignment

Probe-based data collection system with adaptive mode of probing

Lock in thermal laser stimulation through one side of the device wh...

Method for evaluating the centerline of an arbitrarily shaped object

System and method for non-contact microscopy for three-dimensional...

Laser assisted device alteration using two-photon absorption

Spray cooling thermal management system and method for semiconducto...

Systems and method for laser voltage imaging state mapping

Three-dimensional hot spot localization

System and method for modulation mapping

Method to transfer failure analysis-specific data between design ho...

Variable magnification optics with spray cooling

Optical coupling apparatus for a dual column charged particle beam...

Probe tip to device pad alignment in obscured view probing applicat...

Spray cooling thermal management system and method for semiconducto...

System and method for photoemission-based defect detection

System and method for modulation mapping

Undoped silicon heat spreader window

System and method for focused ion beam data analysis

Patents Applicationslast 30 patents

SYNCHRONIZED PULSED LADA FOR THE SIMULTANEOUS ACQUISITION OF TIMING...

SELF CORRECTING FLOATING SIL TIP

PROBE-BASED DATA COLLECTION SYSTEM WITH ADAPTIVE MODE OF PROBING CO...

DIAMOND DELAYERING FOR ELECTRICAL PROBING

Particle Beam Heating to Identify Defects

METHOD AND SYSTEM FOR RESOLVING HOT SPOTS IN LIT

METHOD FOR IMAGING A FEATURE USING A SCANNING PROBE MICROSCOPE

LASER-ASSISTED DEVICE ALTERATION USING SYNCHRONIZED LASER PULSES

LOCK-IN THERMOGRAPHY METHOD AND SYSTEM FOR HOT SPOT LOCALIZATION

SYSTEMS AND METHOD FOR LASER VOLTAGE IMAGING STATE MAPPING

SYSTEM AND METHOD FOR MODULATION MAPPING

SYSTEMS AND METHOD FOR LASER VOLTAGE IMAGING

THROUGH PROCESS FLOW INTRA-CHIP AND INTER-CHIP ELECTRICAL ANALYSIS...

APPARATUS AND METHOD FOR NANOPROBING OF ELECTRONIC DEVICES

METHOD FOR EXAMINATION OF A SAMPLE BY MEANS OF THE LOCK-IN THERMOGR...

LOCK IN THERMAL LASER STIMULATION THROUGH ONE SIDE OF THE DEVICE WH...

SYSTEM AND METHOD FOR NON-CONTACT MICROSCOPY FOR THREE-DIMENSIONAL...

SPECTRAL MAPPING OF PHOTO EMISSION

SELF CORRECTING FLOATING SIL TIP

SYSTEM AND METHOD FOR FAULT ISOLATION BY EMISSION SPECTRA ANALYSIS

PROBE-BASED DATA COLLECTION SYSTEM WITH ADAPTIVE MODE OF PROBING

LED LIGHTING DEVICE

OPTIMIZED WAVELENGTH PHOTON EMISSION MICROSCOPE FOR VLSI DEVICES

Three-Dimensional Hot Spot Localization

APPARATUS AND METHOD FOR ANNULAR OPTICAL POWER MANAGEMENT

SYNCHRONIZED PULSED LADA FOR THE SIMULTANEOUS ACQUISITION OF TIMING...

LOCK IN THERMAL LASER STIMULATION THROUGH ONE SIDE OF THE DEVICE WH...

ACCUMULATING OPTICAL DETECTOR WITH SHUTTER EMULATION

P AND N REGION DIFFERENTIATION FOR IMAGE-TO-CAD ALIGNMENT

APPARATUS AND METHOD FOR POLARIZATION DIVERSITY IMAGING AND ALIGNMENT

Trademarklast 30 trademarks

86607586 - EBIRCH

85319435 - DCG SYSTEMS

85319434 - DCG SYSTEMS

85319423 - DCG SYSTEMS

85307328 - DCG SYSTEMS

85307671 - DCG SYSTEMS