Digital Instruments, Inc.

Organization

Santa Barbara, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Feedback control for scanning tunnel microscopes
- Patent number RE37203
- Issue date Jun 5, 2001
- Digital Instruments, Inc.
- Virgil B. Elings
- 250 - Radiant energy
Information Patent Grant
Method and apparatus for measuring energy dissipation by a probe du...
- Patent number 6,038,916
- Issue date Mar 21, 2000
- Digital Instruments
- Jason P. Cleveland
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning stylus atomic force microscope with cantilever tracking an...
- Patent number 6,032,518
- Issue date Mar 7, 2000
- Digital Instruments, Inc.
- Craig B. Prater
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for improving the operation of oscillating mode atomic force...
- Patent number 6,008,489
- Issue date Dec 28, 1999
- Digital Instruments
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for obtaining improved vertical metrology meas...
- Patent number 5,898,106
- Issue date Apr 27, 1999
- Digital Instruments, Inc.
- Kenneth L. Babcock
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for measuring mechanical properties on a small...
- Patent number 5,866,807
- Issue date Feb 2, 1999
- Digital Instruments
- Jeffrey R. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning stylus atomic force microscope with cantilever tracking an...
- Patent number 5,714,682
- Issue date Feb 3, 1998
- Digital Instruments, Inc.
- Craig B. Prater
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope having automatic probe exchange and align...
- Patent number 5,705,814
- Issue date Jan 6, 1998
- Digital Instruments, Inc.
- James M. Young
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning stylus atomic force microscope with cantilever tracking an...
- Patent number 5,560,244
- Issue date Oct 1, 1996
- Digital Instruments, Inc.
- Craig B. Prater
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scan control for scanning probe microscopes
- Patent number 5,557,156
- Issue date Sep 17, 1996
- Digital Instruments, Inc.
- Virgil Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Methods of operating atomic force microscopes to measure friction
- Patent number 5,553,487
- Issue date Sep 10, 1996
- Digital Instruments, Inc.
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Tapping atomic force microscope with phase or frequency detection
- Patent number 5,519,212
- Issue date May 21, 1996
- Digital Instruments, Incorporated
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning stylus atomic force microscope with cantilever tracking an...
- Patent number 5,463,897
- Issue date Nov 7, 1995
- Digital Instruments, Inc.
- Craig B. Prater
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope using stored data for vertical probe posi...
- Patent number 5,418,363
- Issue date May 23, 1995
- Digital Instruments, Inc.
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Jumping probe microscope
- Patent number 5,415,027
- Issue date May 16, 1995
- Digital Instruments, Inc.
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Tapping atomic force microscope
- Patent number 5,412,980
- Issue date May 9, 1995
- Digital Instruments, Inc.
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Methods of operating atomic force microscopes to measure friction
- Patent number 5,400,647
- Issue date Mar 28, 1995
- Digital Instruments, Inc.
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Atomic force microscope
- Patent number 5,329,808
- Issue date Jul 19, 1994
- Digital Instruments, Inc.
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Stiffness enhancer for movable stage assembly
- Patent number 5,314,254
- Issue date May 24, 1994
- Digital Instruments
- Frank D. Yashar
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Scanning probe microscope using stored data for vertical probe posi...
- Patent number 5,308,974
- Issue date May 3, 1994
- Digital Instruments, Inc.
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Positioning device for scanning probe microscopes
- Patent number 5,306,919
- Issue date Apr 26, 1994
- Digital Instruments, Inc.
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Jumping probe microscope
- Patent number 5,266,801
- Issue date Nov 30, 1993
- Digital Instruments, Inc.
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Atomic force microscope for small samples having dual-mode operatin...
- Patent number 5,253,516
- Issue date Oct 19, 1993
- Digital Instruments, Inc.
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Atomic force microscope
- Patent number 5,237,859
- Issue date Aug 24, 1993
- Digital Instruments, Inc.
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Feedback control for scanning tunnel microscopes
- Patent number RE34331
- Issue date Aug 3, 1993
- Digital Instruments, Inc.
- Virgil B. Elings
- 250 - Radiant energy
Information Patent Grant
Jumping probe microscope
- Patent number 5,229,606
- Issue date Jul 20, 1993
- Digital Instruments, Inc.
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Atomic force microscope
- Patent number 5,224,376
- Issue date Jul 6, 1993
- Digital Instruments, Inc.
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of adjusting the size of the area scanned by a scanning probe
- Patent number 5,204,531
- Issue date Apr 20, 1993
- Digital Instruments, Inc.
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning electrochemical microscopy
- Patent number 5,202,004
- Issue date Apr 13, 1993
- Digital Instruments, Inc.
- Juhyoun Kwak
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanner for scanning probe microscopes having reduced Z-axis non-li...
- Patent number 5,198,715
- Issue date Mar 30, 1993
- Digital Instruments, Inc.
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY

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Trademarklast 30 trademarks

Information Trademark
75378810 - TIPX
- Serial number 75378810
- Registration number 2393866
- Filing date Oct 24, 1997
- DIGITAL INSTRUMENTS, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75309371 - LIFTMODE
- Serial number 75309371
- Filing date Jun 16, 1997
- DIGITAL INSTRUMENTS, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75309372 - MULTIMODE
- Serial number 75309372
- Registration number 2235677
- Filing date Jun 16, 1997
- DIGITAL INSTRUMENTS, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75298038 - TAPPINGMODE
- Serial number 75298038
- Filing date May 27, 1997
- DIGITAL INSTRUMENTS, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75298037 - TAPPING
- Serial number 75298037
- Filing date May 27, 1997
- DIGITAL INSTRUMENTS, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
74055328 - NANO PROBES
- Serial number 74055328
- Registration number 1656065
- Filing date May 3, 1990
- DIGITAL INSTRUMENTS, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
73675621 - NANO SCOPE
- Serial number 73675621
- Registration number 1501997
- Filing date Jul 31, 1987
- DIGITAL INSTRUMENTS, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
73318661 - IDENTIFONE
- Serial number 73318661
- Registration number 1263433
- Filing date Jul 13, 1981
- Smith; Gailen B.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

Digital Instruments, Inc.

Organization

Patents Grantslast 30 patents

Feedback control for scanning tunnel microscopes

Method and apparatus for measuring energy dissipation by a probe du...

Scanning stylus atomic force microscope with cantilever tracking an...

Method for improving the operation of oscillating mode atomic force...

Method and apparatus for obtaining improved vertical metrology meas...

Method and apparatus for measuring mechanical properties on a small...

Scanning stylus atomic force microscope with cantilever tracking an...

Scanning probe microscope having automatic probe exchange and align...

Scanning stylus atomic force microscope with cantilever tracking an...

Scan control for scanning probe microscopes

Methods of operating atomic force microscopes to measure friction

Tapping atomic force microscope with phase or frequency detection

Scanning stylus atomic force microscope with cantilever tracking an...

Scanning probe microscope using stored data for vertical probe posi...

Jumping probe microscope

Tapping atomic force microscope

Methods of operating atomic force microscopes to measure friction

Atomic force microscope

Stiffness enhancer for movable stage assembly

Scanning probe microscope using stored data for vertical probe posi...

Positioning device for scanning probe microscopes

Jumping probe microscope

Atomic force microscope for small samples having dual-mode operatin...

Atomic force microscope

Feedback control for scanning tunnel microscopes

Jumping probe microscope

Atomic force microscope

Method of adjusting the size of the area scanned by a scanning probe

Scanning electrochemical microscopy

Scanner for scanning probe microscopes having reduced Z-axis non-li...

Trademarklast 30 trademarks

75378810 - TIPX

75309371 - LIFTMODE

75309372 - MULTIMODE

75298038 - TAPPINGMODE

75298037 - TAPPING

74055328 - NANO PROBES

73675621 - NANO SCOPE

73318661 - IDENTIFONE