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Patents Grants
last 30 patents
Information
Patent Grant
Method and apparatus for data processing
Patent number
11,681,546
Issue date
Jun 20, 2023
Dongfang Jingyuan Electron Limited
Zhaoli Zhang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and apparatus for data processing
Patent number
11,023,276
Issue date
Jun 1, 2021
Dongfang Jingyuan Electron Limited
Zhaoli Zhang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Dynamic updates for the inspection of integrated circuits
Patent number
10,565,702
Issue date
Feb 18, 2020
Dongfang Jingyuan Electron Limited
Zhaoli Zhang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Care area generation for inspecting integrated circuits
Patent number
10,515,444
Issue date
Dec 24, 2019
Dongfang Jingyuan Electron Limited
Jie Lin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Patterned substrate imaging using multiple electron beams
Patent number
10,347,460
Issue date
Jul 9, 2019
Dongfang Jingyuan Electron Limited
Yan Zhao
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Learning based defect classification
Patent number
10,223,615
Issue date
Mar 5, 2019
Dongfang Jingyuan Electron Limited
Weimin Ma
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and system for defect prediction of integrated circuits
Patent number
10,140,400
Issue date
Nov 27, 2018
Dongfang Jingyuan Electron Limited
Zongchang Yu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Guided defect detection of integrated circuits
Patent number
10,133,838
Issue date
Nov 20, 2018
Dongfang Jingyuan Electron Limited
Hua-Yu Liu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Multi-stage/multi-chamber electron-beam inspection system
Patent number
10,134,560
Issue date
Nov 20, 2018
Dongfang Jingyuan Electron Limited
Weimin Ma
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Reference image contour generation
Patent number
10,134,124
Issue date
Nov 20, 2018
Dongfang Jingyuan Electron Limited
Weimin Ma
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Augmented automatic defect classification
Patent number
9,928,446
Issue date
Mar 27, 2018
Dongfang Jingyuan Electron Limited
Weimin Ma
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Drive mechanism for OPTO-mechanical inspection system
Patent number
9,746,057
Issue date
Aug 29, 2017
Dongfang Jingyuan Electron Limited
Yuhai Mu
G02 - OPTICS
Patents Applications
last 30 patents
Information
Patent Application
Method for Optimizing Negative Tone Development Photoresist Model
Publication number
20240369942
Publication date
Nov 7, 2024
Dongfang Jingyuan Electron CO., LTD.
Shijia GAO
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD FOR SIMULATION OF NEGATIVE TONE DEVELOPMENT PHOTOLITHOGRAPHY...
Publication number
20230288814
Publication date
Sep 14, 2023
DONGFANG JINGYUAN ELECTRON LIMITED
Li XIE
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and Apparatus for Data Processing
Publication number
20210248005
Publication date
Aug 12, 2021
DONGFANG JINGYUAN ELECTRON LIMITED
Zhaoli Zhang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and Apparatus for Data Processing
Publication number
20190163525
Publication date
May 30, 2019
DONGFANG JINGYUAN ELECTRON LIMITED
Zhaoli Zhang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Electron-Beam Inspection Systems with optimized throughput
Publication number
20190088442
Publication date
Mar 21, 2019
DONGFANG JINGYUAN ELECTRON LIMITED
Weimin Ma
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Patterned Substrate Imaging Using Multiple Electron Beams
Publication number
20180254167
Publication date
Sep 6, 2018
DONGFANG JINGYUAN ELECTRON LIMITED
Yan Zhao
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Optimization of Integrated Circuit Mask Design
Publication number
20180225817
Publication date
Aug 9, 2018
Shenzhen Jingyuan Information Technology Limited
Zongchang Yu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and System for Defect Prediction of Integrated Circuits
Publication number
20180218096
Publication date
Aug 2, 2018
DONGFANG JINGYUAN ELECTRON LIMITED
Zongchang Yu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Guided Defect Detection of Integrated Circuits
Publication number
20180218090
Publication date
Aug 2, 2018
DONGFANG JINGYUAN ELECTRON LIMITED
Hua-Yu Liu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method And System For Identifying Defects Of Integrated Circuits
Publication number
20180218492
Publication date
Aug 2, 2018
DONGFANG JINGYUAN ELECTRON LIMITED
Zhaoli Zhang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Care Area Generation For Inspecting Integrated Circuits
Publication number
20180218490
Publication date
Aug 2, 2018
DONGFANG JINGYUAN ELECTRON LIMITED
Jie Lin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Dynamic Updates for the Inspection of Integrated Circuits
Publication number
20180218493
Publication date
Aug 2, 2018
DONGFANG JINGYUAN ELECTRON LIMITED
Zhaoli Zhang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Learning Based Defect Classification
Publication number
20180060702
Publication date
Mar 1, 2018
DONGFANG JINGYUAN ELECTRON LIMITED
Weimin Ma
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Reference Image Contour Generation
Publication number
20180053291
Publication date
Feb 22, 2018
DONGFANG JINGYUAN ELECTRON LIMITED
Weimin Ma
G01 - MEASURING TESTING
Information
Patent Application
AUGMENTED AUTOMATIC DEFECT CLASSIFICATION
Publication number
20180018542
Publication date
Jan 18, 2018
DONGFANG JINGYUAN ELECTRON LIMITED
Weimin Ma
G01 - MEASURING TESTING
Information
Patent Application
Multi-Stage/Multi-Chamber Electron-Beam Inspection System
Publication number
20170301508
Publication date
Oct 19, 2017
DONGFANG JINGYUAN ELECTRON LIMITED
Weimin Ma
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Multi-Stage/Multi-Chamber Electron-Beam Inspection System
Publication number
20170301509
Publication date
Oct 19, 2017
DONGFANG JINGYUAN ELECTRON LIMITED
Weimin Ma
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Cable drive robot mechanism for exchanging samples
Publication number
20160358796
Publication date
Dec 8, 2016
DONGFANG JINGYUAN ELECTRON LIMITED
Yuhai Mu
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Application
Drive Mechanism for OPTO-Mechanical Inspection System
Publication number
20160327138
Publication date
Nov 10, 2016
DONGFANG JINGYUAN ELECTRON LIMITED
Yuhai Mu
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
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