DREXELBROOK CONTROLS, INC., A CORP OF PA

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HORSHAM, PA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for the sonic measurement of sludge and clarit...
- Patent number 6,062,070
- Issue date May 16, 2000
- Drexelbrook Controls, Inc.
- Frederick L. Maltby
- G01 - MEASURING TESTING
Information Patent Grant
Transducer shroud for improved transducer operation in the treatmen...
- Patent number 5,835,454
- Issue date Nov 10, 1998
- Drexelbrook Controls, Inc.
- Frederick L. Maltby
- C02 - TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
Information Patent Grant
High reliability instrument system
- Patent number 5,777,550
- Issue date Jul 7, 1998
- Drexelbrook Controls, Inc.
- Frederick L. Maltby
- G08 - SIGNALLING
Information Patent Grant
Coating responsive material condition monitoring system
- Patent number 5,539,670
- Issue date Jul 23, 1996
- Drexelbrook Controls, Inc.
- Frederick L. Maltby
- G01 - MEASURING TESTING
Information Patent Grant
Error compensating instrument system with digital communications
- Patent number 5,510,779
- Issue date Apr 23, 1996
- Drexelbrook Controls, Inc.
- Frederick L. Maltby
- G08 - SIGNALLING
Information Patent Grant
Continuous condition sensing system
- Patent number 5,278,513
- Issue date Jan 11, 1994
- Drexelbrook Controls, Inc.
- L. Jonathan Kramer
- G01 - MEASURING TESTING
Information Patent Grant
Continuous condition sensing system determining liquid level by adm...
- Patent number 5,045,797
- Issue date Sep 3, 1991
- Drexelbrook Controls, Inc.
- L. Jonathan Kramer
- G01 - MEASURING TESTING
Information Patent Grant
Continuous condition sensing system
- Patent number 4,950,998
- Issue date Aug 21, 1990
- Drexelbrook Controls, Inc.
- Jonathan L. Kramer
- G01 - MEASURING TESTING
Information Patent Grant
Remotely calibratable instrument system
- Patent number 4,849,754
- Issue date Jul 18, 1989
- Drexelbrook Controls
- Frederick L. Maltby
- G08 - SIGNALLING
Information Patent Grant
Multiple set point condition monitoring systems
- Patent number 4,799,174
- Issue date Jan 17, 1989
- Drexelbrook Controls, Inc.
- L. Jonathan Kramer
- G01 - MEASURING TESTING
Information Patent Grant
Continuous condition sensing system
- Patent number 4,788,488
- Issue date Nov 29, 1988
- Drexelbrook Controls, Inc.
- L. Jonathan Kramer
- G01 - MEASURING TESTING
Information Patent Grant
Probe system for measuring the condition of materials
- Patent number 4,757,252
- Issue date Jul 12, 1988
- Drexelbrook Controls, Inc.
- Frederick L. Maltby
- G01 - MEASURING TESTING
Information Patent Grant
Remotely calibratable instrument system
- Patent number 4,723,122
- Issue date Feb 2, 1988
- Drexelbrook Controls, Inc.
- Frederick Maltby
- G08 - SIGNALLING
Information Patent Grant
RF Admittance apparatus and method for monitoring the contents of a...
- Patent number 4,568,874
- Issue date Feb 4, 1986
- Drexelbrook Controls, Inc.
- L. Jonathan Kramer
- G01 - MEASURING TESTING
Information Patent Grant
Two layer probe
- Patent number 4,511,948
- Issue date Apr 16, 1985
- Drexelbrook Controls, Inc.
- Frederick L. Maltby
- G01 - MEASURING TESTING
Information Patent Grant
Two layer probe
- Patent number 4,428,026
- Issue date Jan 24, 1984
- Drexelbrook Controls, Inc.
- Frederick L. Maltby
- G01 - MEASURING TESTING
Information Patent Grant
Method of making an RF admittance measuring probe and product thereof
- Patent number 4,332,167
- Issue date Jun 1, 1982
- Drexelbrook Controls, Inc.
- Robert J. Sun
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Method of using capacitor probe with a semiconductive electrode
- Patent number 4,301,681
- Issue date Nov 24, 1981
- Drexelbrook Controls, Inc.
- Frederick L. Maltby
- G01 - MEASURING TESTING
Information Patent Grant
System and method for obtaining compensated level measurements
- Patent number 4,235,106
- Issue date Nov 25, 1980
- Drexelbrook Controls, Inc.
- Frederick L. Maltby
- G01 - MEASURING TESTING
Information Patent Grant
Level measuring system using admittance sensing
- Patent number 4,232,300
- Issue date Nov 4, 1980
- Drexelbrook Controls, Inc.
- William S. Wright
- G08 - SIGNALLING
Information Patent Grant
Admittance sensing probe having multiple sensing elements
- Patent number 4,208,909
- Issue date Jun 24, 1980
- Drexelbrook Controls, Inc.
- Frederick L. Maltby
- G01 - MEASURING TESTING
Information Patent Grant
RF Admittance measuring method and apparatus for determining the le...
- Patent number 4,166,388
- Issue date Sep 4, 1979
- Drexelbrook Controls, Inc.
- Robert J. Sun
- G01 - MEASURING TESTING
Information Patent Grant
Admittance measuring system for monitoring the condition of materials
- Patent number 4,146,834
- Issue date Mar 27, 1979
- Drexelbrook Controls, Inc.
- Frederick L. Maltby
- G01 - MEASURING TESTING
Information Patent Grant
RF admittance measuring method and apparatus for determining the le...
- Patent number 4,064,753
- Issue date Dec 27, 1977
- Drexelbrook Controls, Inc.
- Robert J. Sun
- G01 - MEASURING TESTING
Information Patent Grant
Admittance measuring system for monitoring the condition of materials
- Patent number 3,993,947
- Issue date Nov 23, 1976
- Drexelbrook Controls, Inc.
- Frederick L. Maltby
- G01 - MEASURING TESTING
Information Patent Grant
Method of and apparatus for measuring the amount of coating materia...
- Patent number 3,936,738
- Issue date Feb 3, 1976
- Drexelbrook Controls, Inc.
- Frederick L. Maltby
- G01 - MEASURING TESTING

DREXELBROOK CONTROLS, INC., A CORP OF PA

Organization

Patents Grantslast 30 patents

Method and apparatus for the sonic measurement of sludge and clarit...

Transducer shroud for improved transducer operation in the treatmen...

High reliability instrument system

Coating responsive material condition monitoring system

Error compensating instrument system with digital communications

Continuous condition sensing system

Continuous condition sensing system determining liquid level by adm...

Continuous condition sensing system

Remotely calibratable instrument system

Multiple set point condition monitoring systems

Continuous condition sensing system

Probe system for measuring the condition of materials

Remotely calibratable instrument system

RF Admittance apparatus and method for monitoring the contents of a...

Two layer probe

Two layer probe

Method of making an RF admittance measuring probe and product thereof

Method of using capacitor probe with a semiconductive electrode

System and method for obtaining compensated level measurements

Level measuring system using admittance sensing

Admittance sensing probe having multiple sensing elements

RF Admittance measuring method and apparatus for determining the le...

Admittance measuring system for monitoring the condition of materials

RF admittance measuring method and apparatus for determining the le...

Admittance measuring system for monitoring the condition of materials

Method of and apparatus for measuring the amount of coating materia...

Patents Applicationslast 30 patents

Trademarklast 30 trademarks