EDAX INC

Organization

MAHWAH, NJ, US

Organizations

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Devices and systems for improved collection efficiency and resoluti...
- Patent number 11,035,806
- Issue date Jun 15, 2021
- EDAX, Incorporated
- Patrick Paul Camus
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for in situ high temperature X-ray spectroscopy...
- Patent number 10,656,106
- Issue date May 19, 2020
- EDAX, Incorporated
- Patrick Paul Camus
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for high energy X-ray detection in electron mic...
- Patent number 10,614,997
- Issue date Apr 7, 2020
- EDAX, Incorporated
- Patrick Paul Camus
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Devices and systems for spatial aggregation of spectral analysis fr...
- Patent number 10,139,356
- Issue date Nov 27, 2018
- EDAX, Incorporated
- Divyesh I. Patel
- G01 - MEASURING TESTING
Information Patent Grant
Devices and systems for spatial averaging of electron backscatter d...
- Patent number 9,791,390
- Issue date Oct 17, 2017
- EDAX, Incorporated
- Stuart Ian Wright
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for investigating a characteristic of a materia...
- Patent number 8,835,842
- Issue date Sep 16, 2014
- EDAX
- Stuart I. Wright
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for electron pattern imaging
- Patent number 8,735,815
- Issue date May 27, 2014
- EDAX, Inc.
- Reinhard Buchhold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical positioner design in X-ray analyzer for coaxial micro-viewi...
- Patent number 7,972,062
- Issue date Jul 5, 2011
- EDAX, Inc.
- Joseph A. Nicolosi
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Scatter spectra method for x-ray fluorescent analysis with optical...
- Patent number 6,845,147
- Issue date Jan 18, 2005
- EDAX Inc.
- William T. Elam
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Chemical prefiltering for phase differentiation via simultaneous en...
- Patent number 6,835,931
- Issue date Dec 28, 2004
- EDAX Inc.
- Stuart Ian Wright
- G01 - MEASURING TESTING
Information Patent Grant
X-ray detector shape
- Patent number 6,437,337
- Issue date Aug 20, 2002
- EDAX, Inc.
- Lun-Shu Ray Yeh
- G01 - MEASURING TESTING
Information Patent Grant
Method and devices to reduce vibrations in a cryostat
- Patent number 6,176,088
- Issue date Jan 23, 2001
- EDAX, Inc.
- Branimir Vidinsky
- F17 - STORING OF DISTRIBUTING GASES OR LIQUIDS

Please log in for detailed analytics

Patents Applicationslast 30 patents

Information Patent Application
DEVICES AND SYSTEMS FOR IMPROVED COLLECTION EFFICIENCY AND RESOLUTI...
- Publication number 20200200691
- Publication date Jun 25, 2020
- EDAX, Incorporated
- Patrick Paul Camus
- G02 - OPTICS
Information Patent Application
SYSTEMS AND METHODS FOR IN SITU HIGH TEMPERATURE X-RAY SPECTROSCOPY...
- Publication number 20190242836
- Publication date Aug 8, 2019
- EDAX, Incorporated
- Patrick Paul Camus
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR HIGH ENERGY X-RAY DETECTION IN ELECTRON MIC...
- Publication number 20190043689
- Publication date Feb 7, 2019
- EDAX, Incorporated
- Patrick Paul Camus
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICES AND SYSTEMS FOR SPATIAL AGGREGATION OF SPECTRAL ANALYSIS FR...
- Publication number 20180003651
- Publication date Jan 4, 2018
- EDAX, Incorporated
- Divyesh I. Patel
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR ADAPTIVE SCANNING
- Publication number 20170345616
- Publication date Nov 30, 2017
- EDAX, Incorporated
- Julio C. Liriano
- G01 - MEASURING TESTING
Information Patent Application
DEVICES AND SYSTEMS FOR SPATIAL AVERAGING OF ELECTRON BACKSCATTER D...
- Publication number 20160216219
- Publication date Jul 28, 2016
- EDAX, Incorporated
- Stuart Ian Wright
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Investigating a Characteristic of a Materia...
- Publication number 20130193321
- Publication date Aug 1, 2013
- EDAX Inc.
- Stuart I. Wright
- G01 - MEASURING TESTING
Information Patent Application
Optical Positioner Design in X-Ray Analyzer for Coaxial Micro-Viewi...
- Publication number 20110013744
- Publication date Jan 20, 2011
- EDAX, INC.
- Joseph A. Nicolosi
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Please log in for detailed analytics

Trademarklast 30 trademarks

Information Trademark
87709078 - EDAX
- Serial number 87709078
- Registration number 5683302
- Filing date Dec 5, 2017
- EDAX, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76111709 - VEDAX
- Serial number 76111709
- Filing date Aug 17, 2000
- Edax, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76064695 - VEDAX
- Serial number 76064695
- Filing date Jun 7, 2000
- Edax, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

Organization

Patents Grantslast 30 patents

Devices and systems for improved collection efficiency and resoluti...

Systems and methods for in situ high temperature X-ray spectroscopy...

Systems and methods for high energy X-ray detection in electron mic...

Devices and systems for spatial aggregation of spectral analysis fr...

Devices and systems for spatial averaging of electron backscatter d...

Systems and methods for investigating a characteristic of a materia...

Method and apparatus for electron pattern imaging

Optical positioner design in X-ray analyzer for coaxial micro-viewi...

Scatter spectra method for x-ray fluorescent analysis with optical...

Chemical prefiltering for phase differentiation via simultaneous en...

X-ray detector shape

Method and devices to reduce vibrations in a cryostat

Patents Applicationslast 30 patents

DEVICES AND SYSTEMS FOR IMPROVED COLLECTION EFFICIENCY AND RESOLUTI...

SYSTEMS AND METHODS FOR IN SITU HIGH TEMPERATURE X-RAY SPECTROSCOPY...

SYSTEMS AND METHODS FOR HIGH ENERGY X-RAY DETECTION IN ELECTRON MIC...

DEVICES AND SYSTEMS FOR SPATIAL AGGREGATION OF SPECTRAL ANALYSIS FR...

SYSTEMS AND METHODS FOR ADAPTIVE SCANNING

DEVICES AND SYSTEMS FOR SPATIAL AVERAGING OF ELECTRON BACKSCATTER D...

Systems and Methods for Investigating a Characteristic of a Materia...

Optical Positioner Design in X-Ray Analyzer for Coaxial Micro-Viewi...

Trademarklast 30 trademarks

87709078 - EDAX

76111709 - VEDAX

76064695 - VEDAX