EKO INSTRUMENTS CO., LTD.

Organization

  • Tokyo, JP

Patents Grantslast 30 patents

  • Information Patent Grant

    Meteorological lidar

    • Patent number 12,140,700
    • Issue date Nov 12, 2024
    • EKO Instruments Co., Ltd.
    • Toshikazu Hasegawa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Pyranometer

    • Patent number 11,821,786
    • Issue date Nov 21, 2023
    • EKO Instruments Co., Ltd.
    • Toshikazu Hasegawa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Meteorological lidar

    • Patent number 11,650,323
    • Issue date May 16, 2023
    • EKO Instruments Co., Ltd.
    • Toshikazu Hasegawa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Thermal conductivity measuring device, thermal conductivity measuri...

    • Patent number 11,193,901
    • Issue date Dec 7, 2021
    • EKO Instruments Co., Ltd.
    • Toshikazu Hasegawa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Pyranometer

    • Patent number D855481
    • Issue date Aug 6, 2019
    • Eko Instruments Co., Ltd.
    • Toshikazu Hasegawa
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Pyranometer

    • Patent number 10,048,122
    • Issue date Aug 14, 2018
    • EKO Instruments Co., Ltd.
    • Toshikazu Hasegawa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Pyranometer

    • Patent number 9,909,919
    • Issue date Mar 6, 2018
    • EKO Instruments Co., Ltd.
    • Toshikazu Hasegawa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Meteorological observation LIDAR system

    • Patent number 7,227,625
    • Issue date Jun 5, 2007
    • EKO Instruments Co., Ltd.
    • Takao Kobayashi
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    SUNSHINE RECORDER AND SUNSHINE MEASUREMENT METHOD

    • Publication number 20240319005
    • Publication date Sep 26, 2024
    • EKO INSTRUMENTS CO., LTD.
    • Toshikazu HASEGAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    PYRANOMETER

    • Publication number 20230366731
    • Publication date Nov 16, 2023
    • EKO INSTRUMENTS CO., LTD.
    • Toshikazu HASEGAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    OPTICAL RECEIVER FOR METEOROLOGICAL LIDAR

    • Publication number 20220011233
    • Publication date Jan 13, 2022
    • EKO INSTRUMENTS CO., LTD.
    • Toshikazu HASEGAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    METEOROLOGICAL LIDAR

    • Publication number 20210389471
    • Publication date Dec 16, 2021
    • EKO INSTRUMENTS CO., LTD.
    • Toshikazu HASEGAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    METEOROLOGICAL LIDAR

    • Publication number 20210333363
    • Publication date Oct 28, 2021
    • EKO INSTRUMENTS CO., LTD.
    • Toshikazu HASEGAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    PYRANOMETER AND PHOTOMETRIC DEVICE

    • Publication number 20190186988
    • Publication date Jun 20, 2019
    • EKO INSTRUMENTS CO., LTD.
    • Toshikazu HASEGAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    PYRANOMETER

    • Publication number 20170227396
    • Publication date Aug 10, 2017
    • EKO INSTRUMENTS CO., LTD.
    • Toshikazu HASEGAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    PYRANOMETER

    • Publication number 20170219428
    • Publication date Aug 3, 2017
    • EKO INSTRUMENTS CO., LTD.
    • Toshikazu HASEGAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Photovoltaic Device Characterization Apparatus

    • Publication number 20090000659
    • Publication date Jan 1, 2009
    • EKO INSTRUMENTS CO., LTD.
    • Toshikazu Hasegawa
    • Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
  • Information Patent Application

    Weathering test apparatus with spectroradiometer and portable spect...

    • Publication number 20070177144
    • Publication date Aug 2, 2007
    • EKO INSTRUMENTS CO., LTD.
    • Toshikazu Hasegawa
    • G01 - MEASURING TESTING

Trademarklast 30 trademarks