EL-MUL TECHNOLOGIES LTD.

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Yavne, IL

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Patents Grantslast 30 patents

Information Patent Grant
High dynamic range detector with controllable photon flux functiona...
- Patent number 11,656,371
- Issue date May 23, 2023
- EL-MUL TECHNOLOGIES LTD.
- Jonathan Garel
- G01 - MEASURING TESTING
Information Patent Grant
Ion detection systems
- Patent number 11,587,776
- Issue date Feb 21, 2023
- EL-MUL TECHNOLOGIES LTD.
- Semyon Shofman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Light sensor assembly in a vacuum environment
- Patent number 11,536,604
- Issue date Dec 27, 2022
- EL-MUL TECHNOLOGIES LTD.
- Jonathan Garel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetic photomultiplier tube system
- Patent number 11,493,383
- Issue date Nov 8, 2022
- EL-MUL TECHNOLOGIES LTD.
- Semyon Shofman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle detection system
- Patent number 11,322,333
- Issue date May 3, 2022
- EL-MUL TECHNOLOGIES LTD.
- Dmitry Shur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle detection system
- Patent number 11,031,210
- Issue date Jun 8, 2021
- EL-MUL TECHNOLOGIES LTD.
- Dmitry Shur
- G02 - OPTICS
Information Patent Grant
Particle detection assembly, system and method
- Patent number 10,910,193
- Issue date Feb 2, 2021
- EL-MUL TECHNOLOGIES LTD.
- Eli Cheifetz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detection assembly, system and method
- Patent number 10,236,155
- Issue date Mar 19, 2019
- EL-MUL TECHNOLOGIES LTD.
- Eli Cheifetz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron detection system
- Patent number 9,673,019
- Issue date Jun 6, 2017
- EL-MUL TECHNOLOGIES LTD.
- Eli Cheifetz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Position sensitive STEM detector
- Patent number 9,076,632
- Issue date Jul 7, 2015
- EL-MUL TECHNOLOGIES LTD.
- Silviu Reinhorn
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle detection system and method
- Patent number 8,222,600
- Issue date Jul 17, 2012
- El-Mul Technologies Ltd.
- Oren Zarchin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-speed, true random-number generator
- Patent number 7,930,333
- Issue date Apr 19, 2011
- Soreq Nuclear Research Center
- David Vartsky
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Three modes particle detector
- Patent number 7,847,268
- Issue date Dec 7, 2010
- El-Mul Technologies, Ltd.
- Semyon Shofman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle detector for secondary ions and direct and or indirect sec...
- Patent number 7,417,235
- Issue date Aug 26, 2008
- El-Mul Technologies, Ltd.
- Armin Schon
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for the examination of samples in a non vacuum en...
- Patent number 7,253,418
- Issue date Aug 7, 2007
- Yeda Research and Development Co. Ltd.
- Elisha Moses
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
E×B ion detector for high efficiency time-of-flight mass spectrometers
- Patent number 7,180,060
- Issue date Feb 20, 2007
- El-Mul Technologies, Ltd.
- Eli Chefetz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method for the examination of samples in a non-vacuum en...
- Patent number 6,992,300
- Issue date Jan 31, 2006
- Yeda Research and Development Co., Ltd.
- Elisha Moses
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method for the examination of samples in a non vacuum en...
- Patent number 6,989,542
- Issue date Jan 24, 2006
- Yeda Research and Development Co., Ltd.
- Elisha Moses
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nanotube-based electron emission device and systems using the same
- Patent number 6,512,235
- Issue date Jan 28, 2003
- El-Mul Technologies Ltd.
- Guy Eitan
- G01 - MEASURING TESTING
Information Patent Grant
Particle detection and particle detector devices
- Patent number 5,990,483
- Issue date Nov 23, 1999
- El-Mul Technologies Ltd.
- Isaac Shariv
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE DETECTION SYSTEM
- Publication number 20200312609
- Publication date Oct 1, 2020
- EL-MUL TECHNOLOGIES LTD.
- Dmitry SHUR
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETIC PHOTOMULTIPLIER TUBE
- Publication number 20200264042
- Publication date Aug 20, 2020
- EL-MUL TECHNOLOGIES LTD.
- Semyon SHOFMAN
- G01 - MEASURING TESTING
Information Patent Application
PARTICLE DETECTION ASSEMBLY, SYSTEM AND METHOD
- Publication number 20190259571
- Publication date Aug 22, 2019
- EL-MUL TECHNOLOGIES LTD.
- ELI CHEIFETZ
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETECTION ASSEMBLY, SYSTEM AND METHOD
- Publication number 20170069459
- Publication date Mar 9, 2017
- EL-MUL TECHNOLOGIES LTD.
- ELI CHEIFETZ
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON DETECTION SYSTEM
- Publication number 20160086765
- Publication date Mar 24, 2016
- EL-MUL TECHNOLOGIES LTD.
- ELI CHEIFETZ
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
POSITION SENSITIVE STEM DETECTOR
- Publication number 20150034822
- Publication date Feb 5, 2015
- EL-MUL TECHNOLOGIES LTD.
- Silviu Reinhorn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion detection method and apparatus with scanning electron beam
- Publication number 20090309021
- Publication date Dec 17, 2009
- EL-MUL TECHNOLOGIES LTD.
- Armin Schon
- G01 - MEASURING TESTING
Information Patent Application
Three modes particle detector
- Publication number 20090294687
- Publication date Dec 3, 2009
- EL-MUL TECHNOLOGIES LTD.
- Semyon Shofman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Particle detector for secondary ions and direct and or indirect sec...
- Publication number 20060289748
- Publication date Dec 28, 2006
- El-Mul Technologies, Ltd.
- Armin Schon
- G01 - MEASURING TESTING
Information Patent Application
Device and method for the examination of samples in a non vacuum en...
- Publication number 20060033038
- Publication date Feb 16, 2006
- Yeda Research and Development Co. Ltd.
- Elisha Moses
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
E x B ion detector for high efficiency time-of-flight mass spectrom...
- Publication number 20050056779
- Publication date Mar 17, 2005
- El-Mul Technologies, Ltd.
- Eli Chefetz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Device and method for the examination of samples in a non vacuum en...
- Publication number 20040217297
- Publication date Nov 4, 2004
- Yeda Research and Development Co. Ltd.
- Elisha Moses
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Device and method for the examination of samples in a non-vacuum en...
- Publication number 20040046120
- Publication date Mar 11, 2004
- YEDA RESEARCH AND DEVELOPMENT CO., LTD.
- Elisha Moses
- H01 - BASIC ELECTRIC ELEMENTS

EL-MUL TECHNOLOGIES LTD.

Organization

Patents Grantslast 30 patents

High dynamic range detector with controllable photon flux functiona...

Ion detection systems

Light sensor assembly in a vacuum environment

Magnetic photomultiplier tube system

Charged particle detection system

Charged particle detection system

Particle detection assembly, system and method

Detection assembly, system and method

Electron detection system

Position sensitive STEM detector

Charged particle detection system and method

High-speed, true random-number generator

Three modes particle detector

Particle detector for secondary ions and direct and or indirect sec...

Device and method for the examination of samples in a non vacuum en...

E×B ion detector for high efficiency time-of-flight mass spectrometers

Device and method for the examination of samples in a non-vacuum en...

Device and method for the examination of samples in a non vacuum en...

Nanotube-based electron emission device and systems using the same

Particle detection and particle detector devices

Patents Applicationslast 30 patents

CHARGED PARTICLE DETECTION SYSTEM

MAGNETIC PHOTOMULTIPLIER TUBE

PARTICLE DETECTION ASSEMBLY, SYSTEM AND METHOD

DETECTION ASSEMBLY, SYSTEM AND METHOD

ELECTRON DETECTION SYSTEM

POSITION SENSITIVE STEM DETECTOR

Ion detection method and apparatus with scanning electron beam

Three modes particle detector

Particle detector for secondary ions and direct and or indirect sec...

Device and method for the examination of samples in a non vacuum en...

E x B ion detector for high efficiency time-of-flight mass spectrom...

Device and method for the examination of samples in a non vacuum en...

Device and method for the examination of samples in a non-vacuum en...

Trademarklast 30 trademarks