ELITE SEMICONDUCTOR, INC

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for quickly diagnosing, classifying, and sampling...
- Patent number 10,719,655
- Issue date Jul 21, 2020
- Elite Semiconductor, Inc.
- Iyun Leu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Intelligent CAA failure pre-diagnosis method and system for design...
- Patent number 10,409,924
- Issue date Sep 10, 2019
- Elite Semiconductor, Inc.
- Iyun Leu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for intelligent weak pattern diagnosis, and non-t...
- Patent number 10,312,164
- Issue date Jun 4, 2019
- Elite Semiconductor, Inc.
- Iyun Leu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for intelligent defect classification and samplin...
- Patent number 10,228,421
- Issue date Mar 12, 2019
- Elite Semiconductor, Inc.
- Iyun Leu
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR QUICKLY DIAGNOSING, CLASSIFYING, AND SAMPLING...
- Publication number 20190026419
- Publication date Jan 24, 2019
- ELITE SEMICONDUCTOR, INC.
- IYUN LEU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTELLIGENT CAA FAILURE PRE-DIAGNOSIS METHOD AND SYSTEM FOR DESIGN...
- Publication number 20180293334
- Publication date Oct 11, 2018
- ELITE SEMICONDUCTOR, INC.
- IYUN LEU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR INTELLIGENT DEFECT CLASSIFICATION AND SAMPLIN...
- Publication number 20170212168
- Publication date Jul 27, 2017
- ELITE SEMICONDUCTOR, INC.
- IYUN LEU
- G01 - MEASURING TESTING

Trademarklast 30 trademarks