Elitetech Technology Co., Ltd.

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Zhudong Town, TW

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Patents Grantslast 30 patents

Information Patent Grant
Integrated interfacing system and method for intelligent defect yie...
- Patent number 9,129,237
- Issue date Sep 8, 2015
- Elitetech Technology Co., Ltd.
- Iyun Leu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for building rule of thumb of defect classification, and met...
- Patent number 8,908,957
- Issue date Dec 9, 2014
- Elitetech Technology Co.,Ltd.
- Iyun Leu
- G01 - MEASURING TESTING
Information Patent Grant
Intelligent defect diagnosis method
- Patent number 8,607,169
- Issue date Dec 10, 2013
- Elitetech Technology Co., Ltd.
- Iyun Leu
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for smart defect screen and sample
- Patent number 8,312,401
- Issue date Nov 13, 2012
- Elitetech Technology Co., Ltd.
- Iyun Leu
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR INTELLIGENT WEAK PATTERN DIAGNOSIS, AND NON-T...
- Publication number 20140343884
- Publication date Nov 20, 2014
- ELITETECH TECHNOLOGY CO.,LTD.
- IYUN LEU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTELLIGENT DEFECT DIAGNOSIS METHOD
- Publication number 20130174102
- Publication date Jul 4, 2013
- ELITETECH TECHNOLOGY CO.,LTD.
- IYUN LEU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR BUILDING RULE OF THUMB OF DEFECT CLASSIFICATION, AND MET...
- Publication number 20130170733
- Publication date Jul 4, 2013
- ELITETECH TECHNOLOGY CO.,LTD.
- IYUN LEU
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED INTERFACING SYSTEM AND METHOD FOR INTELLIGENT DEFECT YIE...
- Publication number 20130173041
- Publication date Jul 4, 2013
- ELITETECH TECHNOLOGY CO.,LTD.
- IYUN LEU
- G06 - COMPUTING CALCULATING COUNTING

Trademarklast 30 trademarks