Enablence Holdings LLC

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Greenville, SC, US

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Patents Grantslast 30 patents

Information Patent Grant
High density integrated optical chip with low index difference wave...
- Patent number 6,934,427
- Issue date Aug 23, 2005
- Enablence Holdings LLC
- Kevin K. Lee
- G02 - OPTICS
Information Patent Grant
Method and apparatus for on-wafer testing of an individual optical...
- Patent number 6,925,238
- Issue date Aug 2, 2005
- Enablence Holdings LLC
- Kevin Kidoo Lee
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for on-wafer testing of an individual optical...
- Patent number 6,909,830
- Issue date Jun 21, 2005
- Enablence Holdings LLC
- Kevin Kidoo Lee
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Trademarklast 30 trademarks