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Ansan-si Gyoenggi-do, KR

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Patents Grantslast 30 patents

Information Patent Grant
Die division method and inspection apparatus for avoiding defects l...
- Patent number 11,605,560
- Issue date Mar 14, 2023
- ETAMAX CO., LTD
- Jongho Yoon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defect investigation device simultaneously detecting photoluminesce...
- Patent number 11,009,461
- Issue date May 18, 2021
- ETAMAX CO., LTD
- Huyndon Jung
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for measuring internal quantum efficiency of an o...
- Patent number 9,945,898
- Issue date Apr 17, 2018
- ETAMAX.CO., LTD
- Jong-In Shim
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEFECT CLASSIFICATION EQUIPMENT FOR SILICON CARBIDE SUBSTRATE USING...
- Publication number 20230109887
- Publication date Apr 13, 2023
- ETAMAX CO., LTD
- Huyndon JUNG
- G01 - MEASURING TESTING
Information Patent Application
DEFECT CLASSIFICATION EQUIPMENT FOR SILICON CARBIDE SUBSTRATE USING...
- Publication number 20230113093
- Publication date Apr 13, 2023
- ETAMAX CO., LTD
- Huyndon JUNG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DIE DIVISION METHOD AND INSPECTION APPARATUS FOR AVOIDING DEFECTS L...
- Publication number 20220199470
- Publication date Jun 23, 2022
- ETAMAX CO., LTD
- Jongho YOON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEFECT INVESTIGATION DEVICE SIMULTANEOUSLY DETECTING PHOTOLUMINESCE...
- Publication number 20190302025
- Publication date Oct 3, 2019
- ETAMAX CO., LTD
- Huyndon JUNG
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR MEASURING INTERNAL QUANTUM EFFICIENCY OF AN O...
- Publication number 20150323463
- Publication date Nov 12, 2015
- ETAMAX.CO., LTD
- Jong-In SHIM
- G01 - MEASURING TESTING

Trademarklast 30 trademarks