Exnodes Inc.

Organization

Palo Alto, CA, US

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Computational wafer image processing
- Patent number 10,184,901
- Issue date Jan 22, 2019
- Exnodes Inc.
- Sri Rama Prasanna Pavani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Distributed wafer information processing
- Patent number 10,082,533
- Issue date Sep 25, 2018
- Exnodes Inc.
- Sri Rama Prasanna Pavani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multiple camera computational wafer inspection
- Patent number 10,027,928
- Issue date Jul 17, 2018
- Exnodes Inc.
- Sri Rama Prasanna Pavani
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Computational wafer inspection filter design
- Patent number 9,696,265
- Issue date Jul 4, 2017
- Exnodes Inc.
- Sri Rama Prasanna Pavani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Distributed wafer inspection
- Patent number 9,612,273
- Issue date Apr 4, 2017
- Exnodes Inc.
- Sri Rama Prasanna Pavani
- G01 - MEASURING TESTING
Information Patent Grant
Lenticular wafer inspection
- Patent number 9,523,645
- Issue date Dec 20, 2016
- Exnodes Inc.
- Sri Rama Prasanna Pavani
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Multiple angle computational wafer inspection
- Patent number 9,395,309
- Issue date Jul 19, 2016
- Exnodes Inc.
- Sri Rama Prasanna Pavani
- G01 - MEASURING TESTING
Information Patent Grant
Certified wafer inspection
- Patent number 9,324,541
- Issue date Apr 26, 2016
- Exnodes Inc.
- Sri Rama Prasanna Pavani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wide field illumination for wafer inspection
- Patent number 9,250,194
- Issue date Feb 2, 2016
- Exnodes Inc.
- Sri Rama Prasanna Pavani
- G01 - MEASURING TESTING
Information Patent Grant
Labeled wafer inspection
- Patent number 9,250,187
- Issue date Feb 2, 2016
- Exnodes Inc.
- Sri Rama Prasanna Pavani
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
COMPUTATIONAL WAFER IMAGE PROCESSING
- Publication number 20170140517
- Publication date May 18, 2017
- Exnodes Inc.
- Sri Rama Prasanna Pavani
- G01 - MEASURING TESTING
Information Patent Application
DISTRIBUTED WAFER INFORMATION PROCESSING
- Publication number 20170046798
- Publication date Feb 16, 2017
- Exnodes Inc.
- Sri Rama Prasanna Pavani
- G01 - MEASURING TESTING

Trademarklast 30 trademarks

Information Trademark
86892333 - EXNODES
- Serial number 86892333
- Registration number 5097152
- Filing date Jan 31, 2016
- Exnodes Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
86892343 - COMPUTATIONAL PARALLEL INSPECTION
- Serial number 86892343
- Registration number 5097153
- Filing date Jan 31, 2016
- Exnodes Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
86892338 - XPRO
- Serial number 86892338
- Registration number 5210327
- Filing date Jan 31, 2016
- Exnodes Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

Exnodes Inc.

Organization

Patents Grantslast 30 patents

Computational wafer image processing

Distributed wafer information processing

Multiple camera computational wafer inspection

Computational wafer inspection filter design

Distributed wafer inspection

Lenticular wafer inspection

Multiple angle computational wafer inspection

Certified wafer inspection

Wide field illumination for wafer inspection

Labeled wafer inspection

Patents Applicationslast 30 patents

COMPUTATIONAL WAFER IMAGE PROCESSING

DISTRIBUTED WAFER INFORMATION PROCESSING

Trademarklast 30 trademarks

86892333 - EXNODES

86892343 - COMPUTATIONAL PARALLEL INSPECTION

86892338 - XPRO