Fab Solutions, Inc.

Organization

Kanagawa, JP

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Production managing system of semiconductor device
- Patent number 7,321,805
- Issue date Jan 22, 2008
- Fab Solutions, Inc.
- Keizo Yamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contact hole standard test device, method of forming the same, meth...
- Patent number 7,232,994
- Issue date Jun 19, 2007
- Fab Solutions, Inc.
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device test method and semiconductor device tester
- Patent number 7,049,834
- Issue date May 23, 2006
- Fab Solutions, Inc.
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Film thickness measuring apparatus and a method for measuring a thi...
- Patent number 7,002,361
- Issue date Feb 21, 2006
- Fab Solutions, Inc.
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Contact hole standard test device, method of forming the same, meth...
- Patent number 6,982,418
- Issue date Jan 3, 2006
- Fab Solutions, Inc.
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device tester
- Patent number 6,975,125
- Issue date Dec 13, 2005
- Fab Solutions, Inc.
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Contact hole standard test device, method of forming the same, meth...
- Patent number 6,967,327
- Issue date Nov 22, 2005
- Fab Solutions, Inc.
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device tester
- Patent number 6,946,857
- Issue date Sep 20, 2005
- Fab Solutions, Inc.
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Surface contamination analyzer for semiconductor wafers, method use...
- Patent number 6,943,043
- Issue date Sep 13, 2005
- Fab Solutions, Inc.
- Takeo Ushiki
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Contact hole standard test device, method of forming the same, meth...
- Patent number 6,940,296
- Issue date Sep 6, 2005
- Fab Solutions, Inc.
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device test method and semiconductor device tester
- Patent number 6,914,444
- Issue date Jul 5, 2005
- Fab Solutions, Inc.
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device test method and semiconductor device tester
- Patent number 6,900,645
- Issue date May 31, 2005
- Fab Solutions, Inc.
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Contact hole standard test device
- Patent number 6,897,440
- Issue date May 24, 2005
- Fab Solutions, Inc.
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Film thickness measuring apparatus and a method for measuring a thi...
- Patent number 6,850,079
- Issue date Feb 1, 2005
- Fab Solutions, Inc.
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Production managing system of semiconductor device
- Patent number 6,842,663
- Issue date Jan 11, 2005
- Fab Solutions, Inc.
- Keizo Yamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor manufacturing device
- Patent number 6,837,936
- Issue date Jan 4, 2005
- Fab Solutions, Inc.
- Takeo Ushiki
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Semiconductor device test method and semiconductor device tester
- Patent number 6,809,534
- Issue date Oct 26, 2004
- Fab Solutions, Inc.
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device tester which measures information related to a...
- Patent number 6,768,324
- Issue date Jul 27, 2004
- Fab Solutions, Inc.
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Surface contamination analyzer for semiconductor wafers, method use...
- Patent number 6,753,194
- Issue date Jun 22, 2004
- Fab Solutions, Inc.
- Takeo Ushiki
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Production managing system of semiconductor device
- Patent number 6,711,453
- Issue date Mar 23, 2004
- Fab Solutions, Inc.
- Keizo Yamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for measuring thickness of thin film
- Patent number 6,683,308
- Issue date Jan 27, 2004
- Fab Solutions, Inc.
- Yosuke Itagaki
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor manufacturing apparatus
- Patent number 6,614,050
- Issue date Sep 2, 2003
- Fab Solutions, Inc.
- Keizo Yamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device inspecting apparatus
- Patent number 6,614,244
- Issue date Sep 2, 2003
- Fab Solutions, Inc.
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device tester and semiconductor device test method
- Patent number 6,559,662
- Issue date May 6, 2003
- Fab Solutions, Inc.
- Keizo Yamada
- G01 - MEASURING TESTING

Fab Solutions, Inc.

Organization

Patents Grantslast 30 patents

Production managing system of semiconductor device

Contact hole standard test device, method of forming the same, meth...

Semiconductor device test method and semiconductor device tester

Film thickness measuring apparatus and a method for measuring a thi...

Contact hole standard test device, method of forming the same, meth...

Semiconductor device tester

Contact hole standard test device, method of forming the same, meth...

Semiconductor device tester

Surface contamination analyzer for semiconductor wafers, method use...

Contact hole standard test device, method of forming the same, meth...

Semiconductor device test method and semiconductor device tester

Semiconductor device test method and semiconductor device tester

Contact hole standard test device

Film thickness measuring apparatus and a method for measuring a thi...

Production managing system of semiconductor device

Semiconductor manufacturing device

Semiconductor device test method and semiconductor device tester

Semiconductor device tester which measures information related to a...

Surface contamination analyzer for semiconductor wafers, method use...

Production managing system of semiconductor device

Method and apparatus for measuring thickness of thin film

Semiconductor manufacturing apparatus

Semiconductor device inspecting apparatus

Semiconductor device tester and semiconductor device test method