FEMTO Deployments Inc.

Organization

Okayama-shi, Okayama, JP

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Photoresist characteristics analysis method and characteristics ana...
- Patent number 12,174,113
- Issue date Dec 24, 2024
- FEMTO DEPLOYMENTS INC.
- Akira Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measuring jig, and calibration method and terahertz wave measuring...
- Patent number 12,072,285
- Issue date Aug 27, 2024
- FEMTO DEPLOYMENTS INC.
- Akira Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Electromagnetic signal analysis apparatus and electromagnetic signa...
- Patent number 11,680,896
- Issue date Jun 20, 2023
- FEMTO DEPLOYMENTS INC.
- Akira Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz wave signal analysis device, terahertz wave signal analys...
- Patent number 11,181,474
- Issue date Nov 23, 2021
- FEMTO DEPLOYMENTS INC.
- Akira Watanabe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Liquid membrane forming device and liquid membrane cartridge used t...
- Patent number 10,724,941
- Issue date Jul 28, 2020
- FEMTO Deployments, Inc.
- Akira Watanabe
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Terahertz time domain spectroscopic apparatus
- Patent number 10,352,849
- Issue date Jul 16, 2019
- FEMTO DEPLOYMENTS INC.
- Akira Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz time domain spectroscopy device
- Patent number 10,295,461
- Issue date May 21, 2019
- FEMTO DEPLOYMENTS INC.
- Akira Watanabe
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PHOTORESIST CHARACTERISTICS ANALYSIS METHOD AND CHARACTERISTICS ANA...
- Publication number 20240102927
- Publication date Mar 28, 2024
- FEMTO Deployments Inc.
- Akira WATANABE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASURING JIG, AND CALIBRATION METHOD AND TERAHERTZ WAVE MEASURING...
- Publication number 20220390364
- Publication date Dec 8, 2022
- FEMTO Deployments Inc.
- Akira WATANABE
- G01 - MEASURING TESTING
Information Patent Application
ELECTROMAGNETIC SIGNAL ANALYSIS APPARATUS AND ELECTROMAGNETIC SIGNA...
- Publication number 20220128463
- Publication date Apr 28, 2022
- FEMTO Deployments Inc.
- Akira WATANABE
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYSIS APPARATUS AND SAMPLE ANALYSIS PROGRAM
- Publication number 20210201140
- Publication date Jul 1, 2021
- FEMTO Deployments Inc.
- Akira WATANABE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LIQUID FILM GENERATION DEVICE AND LIQUID FILM CARTRIDGE USING THE SAME
- Publication number 20200406288
- Publication date Dec 31, 2020
- FEMTO Deployments Inc.
- Akira WATANABE
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
LIQUID FILM GENERATING TOOL
- Publication number 20200096424
- Publication date Mar 26, 2020
- FEMTO Deployments Inc.
- Akira WATANABE
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ WAVE SIGNAL ANALYSIS DEVICE, TERAHERTZ WAVE SIGNAL ANALYS...
- Publication number 20190369016
- Publication date Dec 5, 2019
- FEMTO Deployments Inc.
- Akira WATANABE
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ TIME DOMAIN SPECTROSCOPIC APPARATUS
- Publication number 20190120757
- Publication date Apr 25, 2019
- FEMTO Deployments Inc.
- Akira WATANABE
- G01 - MEASURING TESTING
Information Patent Application
LIQUID MEMBRANE FORMING DEVICE AND LIQUID MEMBRANE CARTRIDGE USED T...
- Publication number 20190041315
- Publication date Feb 7, 2019
- FEMTO Deployments Inc.
- Akira WATANABE
- G01 - MEASURING TESTING

FEMTO Deployments Inc.

Organization

Patents Grantslast 30 patents

Photoresist characteristics analysis method and characteristics ana...

Measuring jig, and calibration method and terahertz wave measuring...

Electromagnetic signal analysis apparatus and electromagnetic signa...

Terahertz wave signal analysis device, terahertz wave signal analys...

Liquid membrane forming device and liquid membrane cartridge used t...

Terahertz time domain spectroscopic apparatus

Terahertz time domain spectroscopy device

Patents Applicationslast 30 patents

PHOTORESIST CHARACTERISTICS ANALYSIS METHOD AND CHARACTERISTICS ANA...

MEASURING JIG, AND CALIBRATION METHOD AND TERAHERTZ WAVE MEASURING...

ELECTROMAGNETIC SIGNAL ANALYSIS APPARATUS AND ELECTROMAGNETIC SIGNA...

SAMPLE ANALYSIS APPARATUS AND SAMPLE ANALYSIS PROGRAM

LIQUID FILM GENERATION DEVICE AND LIQUID FILM CARTRIDGE USING THE SAME

LIQUID FILM GENERATING TOOL

TERAHERTZ WAVE SIGNAL ANALYSIS DEVICE, TERAHERTZ WAVE SIGNAL ANALYS...

TERAHERTZ TIME DOMAIN SPECTROSCOPIC APPARATUS

LIQUID MEMBRANE FORMING DEVICE AND LIQUID MEMBRANE CARTRIDGE USED T...

Trademarklast 30 trademarks