FemtoMetrix, Inc.

Organization

Santa Ana, CA, US

Business Address
1850 EAST SAINT ANDREW PLACE SANTA ANA CA 92705 805-637-9278
Mailing Address
1850 EAST SAINT ANDREW PLACE SANTA ANA CA 92705
State Location
CA
State of Incorporation
DE

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for determining characteristics of semiconducto...
- Patent number 12,158,492
- Issue date Dec 3, 2024
- FemtoMetrix, Inc.
- Ming Lei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems for parsing material properties from within SHG signals
- Patent number 11,988,611
- Issue date May 21, 2024
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Grant
Second Harmonic Generation (SHG) optical inspection system designs
- Patent number 11,946,863
- Issue date Apr 2, 2024
- FemtoMetrix, Inc.
- Ming Lei
- G01 - MEASURING TESTING
Information Patent Grant
Pump and probe type second harmonic generation metrology
- Patent number 11,821,911
- Issue date Nov 21, 2023
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Surface sensing systems and methods for imaging a scanned surface o...
- Patent number 11,808,563
- Issue date Nov 7, 2023
- The Boeing Company
- Jeffrey H. Hunt
- G01 - MEASURING TESTING
Information Patent Grant
Surface sensing systems and methods for imaging a scanned surface o...
- Patent number 11,473,903
- Issue date Oct 18, 2022
- The Boeing Company
- Jeffrey H. Hunt
- G01 - MEASURING TESTING
Information Patent Grant
Field-biased second harmonic generation metrology
- Patent number 11,415,617
- Issue date Aug 16, 2022
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer metrology technologies
- Patent number 11,293,965
- Issue date Apr 5, 2022
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems for parsing material properties from within SHG signals
- Patent number 11,199,507
- Issue date Dec 14, 2021
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Grant
Pump and probe type second harmonic generation metrology
- Patent number 11,150,287
- Issue date Oct 19, 2021
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Grant
Field-biased second harmonic generation metrology
- Patent number 11,092,637
- Issue date Aug 17, 2021
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Surface sensing systems and methods for imaging a scanned surface o...
- Patent number 10,928,188
- Issue date Feb 23, 2021
- The Boeing Company
- Jeffrey H. Hunt
- G01 - MEASURING TESTING
Information Patent Grant
Field-biased second harmonic generation metrology
- Patent number 10,663,504
- Issue date May 26, 2020
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pump and probe type second harmonic generation metrology
- Patent number 10,613,131
- Issue date Apr 7, 2020
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Grant
Wafer metrology technologies
- Patent number 10,591,525
- Issue date Mar 17, 2020
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Grant
Systems for parsing material properties from within SHG signals
- Patent number 10,551,325
- Issue date Feb 4, 2020
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING

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Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD OF INCREASING PRECISION CONTROL OF CHARGE DEPO...
- Publication number 20240094278
- Publication date Mar 21, 2024
- FemtoMetrix, Inc.
- Anatoly A. Shtykov
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR SEPARATION OF THE SECOND HARMONIC GENERATI...
- Publication number 20240085345
- Publication date Mar 14, 2024
- FemtoMetrix, Inc.
- Timothy M. Wong
- G02 - OPTICS
Information Patent Application
METHOD AND APPARATUS FOR NON-INVASIVE, NON-INTRUSIVE, AND UN-GROUND...
- Publication number 20240085470
- Publication date Mar 14, 2024
- FemtoMetrix, Inc.
- Timothy M. Wong
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MAIN DETECTOR SYNCHRONIZATION OF OPTICALLY...
- Publication number 20240085324
- Publication date Mar 14, 2024
- FemtoMetrix, Inc.
- Anatoly A. Shtykov
- G01 - MEASURING TESTING
Information Patent Application
DIMENSIONAL METROLOGY USING NON-LINEAR OPTICS
- Publication number 20240077302
- Publication date Mar 7, 2024
- FemtoMetrix, Inc.
- David L. Adler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR NON-INVASIVE SEMICONDUCTOR TECHNIQUE FOR M...
- Publication number 20240071710
- Publication date Feb 29, 2024
- FemtoMetrix, Inc.
- Timothy M. Wong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Surface Sensing Systems and Methods for Imaging a Scanned Surface o...
- Publication number 20240019243
- Publication date Jan 18, 2024
- The Boeing Company
- Jeffrey H. Hunt
- G01 - MEASURING TESTING
Information Patent Application
Surface Sensing Systems and Methods for Imaging a Scanned Surface o...
- Publication number 20230003515
- Publication date Jan 5, 2023
- The Boeing Company
- Jeffrey H. Hunt
- G01 - MEASURING TESTING
Information Patent Application
WAFER METROLOGY TECHNOLOGIES
- Publication number 20220413029
- Publication date Dec 29, 2022
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SECOND-HARMONIC GENERATION FOR CRITICAL DIMENSIONAL METROLOGY
- Publication number 20220364850
- Publication date Nov 17, 2022
- FemtoMetrix, Inc.
- David L. Adler
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS FOR PARSING MATERIAL PROPERTIES FROM WITHIN SHG SIGNALS
- Publication number 20220317060
- Publication date Oct 6, 2022
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PUMP AND PROBE TYPE SECOND HARMONIC GENERATION METROLOGY
- Publication number 20220260626
- Publication date Aug 18, 2022
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Application
SURFACE SENSING SYSTEMS AND METHODS FOR IMAGING A SCANNED SURFACE O...
- Publication number 20210131797
- Publication date May 6, 2021
- The Boeing Company
- Jeffrey H. Hunt
- G01 - MEASURING TESTING
Information Patent Application
PUMP AND PROBE TYPE SECOND HARMONIC GENERATION METROLOGY
- Publication number 20210055338
- Publication date Feb 25, 2021
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS FOR PARSING MATERIAL PROPERTIES FROM WITHIN SHG SIGNALS
- Publication number 20200408699
- Publication date Dec 31, 2020
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Application
WAFER METROLOGY TECHNOLOGIES
- Publication number 20200400732
- Publication date Dec 24, 2020
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Application
FIELD-BIASED SECOND HARMONIC GENERATION METROLOGY
- Publication number 20200348348
- Publication date Nov 5, 2020
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Application
SECOND HARMONIC GENERATION (SHG) OPTICAL INSPECTION SYSTEM DESIGNS
- Publication number 20200110029
- Publication date Apr 9, 2020
- FemtoMetrix, Inc.
- Ming Lei
- G02 - OPTICS
Information Patent Application
SYSTEMS AND METHODS FOR DETERMINING CHARACTERISTICS OF SEMICONDUCTO...
- Publication number 20200088784
- Publication date Mar 19, 2020
- FemtoMetrix, Inc.
- Ming Lei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIELD-BIASED NONLINEAR OPTICAL METROLOGY USING CORONA DISCHARGE SOURCE
- Publication number 20200057104
- Publication date Feb 20, 2020
- SK HYNIX INC.
- Seongmin Ma
- G01 - MEASURING TESTING
Information Patent Application
SURFACE SENSING SYSTEMS AND METHODS FOR IMAGING A SCANNED SURFACE O...
- Publication number 20190212132
- Publication date Jul 11, 2019
- The Boeing Company
- Jeffrey H. Hunt
- G01 - MEASURING TESTING
Information Patent Application
PUMP AND PROBE TYPE SECOND HARMONIC GENERATION METROLOGY
- Publication number 20180299497
- Publication date Oct 18, 2018
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGE DECAY MEASUREMENT SYSTEMS AND METHODS
- Publication number 20180292441
- Publication date Oct 11, 2018
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER METROLOGY TECHNOLOGIES
- Publication number 20180217193
- Publication date Aug 2, 2018
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIELD-BIASED SECOND HARMONIC GENERATION METROLOGY
- Publication number 20180217192
- Publication date Aug 2, 2018
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SURFACE SENSING SYSTEMS AND METHODS FOR IMAGING A SCANNED SURFACE O...
- Publication number 20180180404
- Publication date Jun 28, 2018
- The Boeing Company
- Jeffrey H. Hunt
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS FOR PARSING MATERIAL PROPERTIES FROM WITHIN SHG SIGNALS
- Publication number 20160131594
- Publication date May 12, 2016
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Application
CHARGE DECAY MEASUREMENT SYSTEMS AND METHODS
- Publication number 20150331029
- Publication date Nov 19, 2015
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Application
PUMP AND PROBE TYPE SECOND HARMONIC GENERATION METROLOGY
- Publication number 20150330908
- Publication date Nov 19, 2015
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Application
WAFER METROLOGY TECHONOLOGIES
- Publication number 20150330909
- Publication date Nov 19, 2015
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING

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Trademarklast 30 trademarks

Information Trademark
97298145 - NL-OCD
- Serial number 97298145
- Filing date Mar 7, 2022
- FEMTOMETRIX, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
97295162 - HARMONIC F3X
- Serial number 97295162
- Filing date Mar 4, 2022
- FEMTOMETRIX, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
86080649 - HARMONIC F1X
- Serial number 86080649
- Registration number 4600116
- Filing date Oct 2, 2013
- Femtometrix
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
85946532 - FEMTOMETRIX
- Serial number 85946532
- Registration number 4589848
- Filing date May 30, 2013
- Femtometrix, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

FemtoMetrix, Inc.

Organization

Business Address

Mailing Address

State Location

State of Incorporation

Patents Grantslast 30 patents

Systems and methods for determining characteristics of semiconducto...

Systems for parsing material properties from within SHG signals

Second Harmonic Generation (SHG) optical inspection system designs

Pump and probe type second harmonic generation metrology

Surface sensing systems and methods for imaging a scanned surface o...

Surface sensing systems and methods for imaging a scanned surface o...

Field-biased second harmonic generation metrology

Wafer metrology technologies

Systems for parsing material properties from within SHG signals

Pump and probe type second harmonic generation metrology

Field-biased second harmonic generation metrology

Surface sensing systems and methods for imaging a scanned surface o...

Field-biased second harmonic generation metrology

Pump and probe type second harmonic generation metrology

Wafer metrology technologies

Systems for parsing material properties from within SHG signals

Patents Applicationslast 30 patents

APPARATUS AND METHOD OF INCREASING PRECISION CONTROL OF CHARGE DEPO...

METHOD AND APPARATUS FOR SEPARATION OF THE SECOND HARMONIC GENERATI...

METHOD AND APPARATUS FOR NON-INVASIVE, NON-INTRUSIVE, AND UN-GROUND...

METHOD AND APPARATUS FOR MAIN DETECTOR SYNCHRONIZATION OF OPTICALLY...

DIMENSIONAL METROLOGY USING NON-LINEAR OPTICS

METHOD AND APPARATUS FOR NON-INVASIVE SEMICONDUCTOR TECHNIQUE FOR M...

Surface Sensing Systems and Methods for Imaging a Scanned Surface o...

Surface Sensing Systems and Methods for Imaging a Scanned Surface o...

WAFER METROLOGY TECHNOLOGIES

SECOND-HARMONIC GENERATION FOR CRITICAL DIMENSIONAL METROLOGY

SYSTEMS FOR PARSING MATERIAL PROPERTIES FROM WITHIN SHG SIGNALS

PUMP AND PROBE TYPE SECOND HARMONIC GENERATION METROLOGY

SURFACE SENSING SYSTEMS AND METHODS FOR IMAGING A SCANNED SURFACE O...

PUMP AND PROBE TYPE SECOND HARMONIC GENERATION METROLOGY

SYSTEMS FOR PARSING MATERIAL PROPERTIES FROM WITHIN SHG SIGNALS

WAFER METROLOGY TECHNOLOGIES

FIELD-BIASED SECOND HARMONIC GENERATION METROLOGY

SECOND HARMONIC GENERATION (SHG) OPTICAL INSPECTION SYSTEM DESIGNS

SYSTEMS AND METHODS FOR DETERMINING CHARACTERISTICS OF SEMICONDUCTO...

FIELD-BIASED NONLINEAR OPTICAL METROLOGY USING CORONA DISCHARGE SOURCE

SURFACE SENSING SYSTEMS AND METHODS FOR IMAGING A SCANNED SURFACE O...

PUMP AND PROBE TYPE SECOND HARMONIC GENERATION METROLOGY

CHARGE DECAY MEASUREMENT SYSTEMS AND METHODS

WAFER METROLOGY TECHNOLOGIES

FIELD-BIASED SECOND HARMONIC GENERATION METROLOGY

SURFACE SENSING SYSTEMS AND METHODS FOR IMAGING A SCANNED SURFACE O...

SYSTEMS FOR PARSING MATERIAL PROPERTIES FROM WITHIN SHG SIGNALS

CHARGE DECAY MEASUREMENT SYSTEMS AND METHODS

PUMP AND PROBE TYPE SECOND HARMONIC GENERATION METROLOGY

WAFER METROLOGY TECHONOLOGIES

Trademarklast 30 trademarks

97298145 - NL-OCD

97295162 - HARMONIC F3X

86080649 - HARMONIC F1X

85946532 - FEMTOMETRIX